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[S32K3 tool part]:How to use IAR compiler or IAR project to compile MCAL project   1.    Abstract      Through regular observation, it has been found that there are still many customers using platforms such as MCAL+IAR, including those using IAR compilers and those directly using IAR IDEs. In fact, when I was working on industrial MCUs in the past, I also particularly liked IAR IDE for its fast compilation speed, high compilation efficiency, and small code generation. However, when I came to auto MCU, I found that its popularity was not very high, and I also noticed that some customers encountered various problems when importing MCAL into IAR. Therefore, I will directly write a tool article on how to use IAR compiler or IAR IDE project to compile NXP S32K MCAL in combination with EB tresos MCAL. This article uses S32K344 combined with RTD600 to illustrate the compilation of MCAL projects using IAR compiler and the direct import of MCAL into IAR IDE projects 2. IAR Complier with S32K3 RTD MCAL project 2.1 S32K3 HW and SW SW32K3_S32M27x_RTD_R21-11_6.0.0 S32K3X4-EVB Based on Dio_TS_T40D34M60I0R0 IAR:IAR EW for Arm 9.70.1 EB tresos29.0.0 2.2 Compile MCAL project steps using IAR compiler CMD method 2.2.1 Copy one RTD MCAL new project Open path C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins Copy Dio_TS_T40D34M60I0R0 , rename it as Dio_TS_T40D34M60I0R0_IAR kerryzhou_0-1759479138916.png Fig 1 2.2.2 Complie EB tresos project Use EB tresos tool open the following EB tresos project : C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Dio_TS_T40D34M60I0R0_IAR\examples\EBT\S32K3XX\Dio_Example_S32K344\TresosProject Generate code: kerryzhou_1-1759479139017.png Fig 2 2.2.3 Vscode open Dio_TS_T40D34M60I0R0_IAR project Use VS code open the following path folder: C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Dio_TS_T40D34M60I0R0_IAR\examples\EBT\S32K3XX\Dio_Example_S32K344 Of course, you can also directly open this folder path using the command line, as long as you ensure that it is in the same layer path as the. mk and makefile scr kerryzhou_2-1759479139074.png Fig 3 2.2.4   Project_parameters.mk modification Mainly modify the following points: TOOLCHAIN = iar IAR_DIR = C:/IAR/ewarm-9.70.1 TRESOS_DIR = C:/EB/tresos_29_0_0 PLUGINS_DIR = C:/NXP/SW32K3_S32M27x_RTD_R21-11_6.0.0/eclipse/plugins The path of IAR must be consistent with the version of IAR software used to ensure that the corresponding IAR compiler can be found. kerryzhou_3-1759479139116.png Fig 4 2.2.5   Check_build_params.mk modification Add the following content to check_build_params.mk: else ifeq ($(TOOLCHAIN),iar) ifeq ("$(wildcard $(IAR_DIR)/arm/bin/iccarm.exe)","") $(error Invalid path set to the IAR compiler. \ The provided path: from project_parameters.mk IAR_DIR=$(IAR_DIR) is invalid!) Endif kerryzhou_4-1759479139165.png Fig 5 2.2.6        Makefile modification   Makefile need the following 5 points modification: (1)Compilier change ifeq (${TOOLCHAIN},iar) CC := $(IAR_DIR)/arm/bin/iccarm.exe LD := $(IAR_DIR)/arm/bin/ilinkarm.exe AS := $(IAR_DIR)/arm/bin/iasmarm.exe # Intel Hexadecimal Flash image tool GENHEX := $(IAR_DIR)/arm/bin/ielftool.exe HEX_OPTS := --ihex OUT_OPTS := -o endif kerryzhou_5-1759479139311.png Fig 6 (2) SRC_DIRS  add TOOLCHAIN SRC_DIRS += $(foreach mod,$(MCAL_MODULE_LIST),$(PLUGINS_DIR)/$(mod)_$(AR_PKG_NAME)/src) \ $(foreach mod,$(MCAL_MODULE_LIST_ADDON),$(PLUGINS_DIR_ADDON)/$(mod)_$(AR_PKG_NAME_ADDON)/src) \ $(PLUGINS_DIR)/Platform_$(AR_PKG_NAME)/startup/src \ $(PLUGINS_DIR)/Platform_$(AR_PKG_NAME)/startup/src/m7 \ $(PLUGINS_DIR)/Platform_$(AR_PKG_NAME)/startup/src/m7/$(TOOLCHAIN) kerryzhou_6-1759479139439.png Fig 7 (3) Linker file  modification ifeq ($(LOAD_TO),flash) ifeq (${TOOLCHAIN},iar) LINKER_DEF:= $(PLUGINS_DIR)/Platform_$(AR_PKG_NAME)/build_files/${TOOLCHAIN}/linker_flash_$(DERIVATIVE_LOWER).icf else LINKER_DEF:= $(PLUGINS_DIR)/Platform_$(AR_PKG_NAME)/build_files/$(TOOLCHAIN)/linker_flash_$(DERIVATIVE_LOWER).ld endif else ifeq (${TOOLCHAIN},iar) LINKER_DEF:= $(PLUGINS_DIR)/Platform_$(AR_PKG_NAME)/build_files/$(TOOLCHAIN)/linker_ram_$(DERIVATIVE_LOWER).icf else LINKER_DEF:= $(PLUGINS_DIR)/Platform_$(AR_PKG_NAME)/build_files/$(TOOLCHAIN)/linker_ram_$(DERIVATIVE_LOWER).ld endif endif kerryzhou_0-1759486694885.png Fig 8 (4) Complier options change ifeq (${TOOLCHAIN},iar) ################################################################################ # iar Compiler options ################################################################################     clib        := $(IAR_DIR)/arm/lib     CCOPT           +=  --cpu=Cortex-M7 \                         -DAUTOSAR_OS_NOT_USED \                         -DUSE_MCAL_DRIVERS \                         --fpu=FPv5-SP \                         --cpu_mode=thumb \                         --endian=little \                         -e \                         -Ohz \                         --debug \                         --no_clustering \                         --no_mem_idioms \                         --do_explicit_zero_opt_in_named_sections \                         --require_prototypes \                         --no_wrap_diagnostics \                         --diag_suppress=Pa050 \                         $(MISRA) \                         -D$(PLATFORM) \                         -D$(DERIVATIVE) \                         -DIAR \                         -DUSE_SW_VECTOR_MODE  \                         -DENABLE_FPU \                         -DD_CACHE_ENABLE \                         -DI_CACHE_ENABLE                             LDOPT           :=  --entry _start \                         --enable_stack_usage \                         --skip_dynamic_initialization \                         --no_wrap_diagnostics \                         --cpu=Cortex-M7 \                         --fpu=FPv5-SP                             ASOPT           :=  $(ASOPT) \                         --cpu Cortex-M7 \                         --cpu_mode thumb \                         -g \                         -r \                         -DMULTIPLE_CORE   endif   kerryzhou_8-1759479139911.png Fig 9 kerryzhou_9-1759479140195.png Fig  10 So how did these IAR compilation options come about? You can refer to the release note of RTD600, which contains corresponding descriptions kerryzhou_10-1759479140292.png Fig 11 (5) Elf related change ifeq (${TOOLCHAIN},iar) %.elf: %.o $(LINKER_DEF)               @echo "Linking $@"               @$(LD) $(ODIR)/*.o $(LDOPT) --config $(LINKER_DEF) --map $(ODIR)/ -o $(ODIR)/$@@               @$(GENHEX) $(HEX_OPTS) "$(ODIR)/$(ELFNAME).elf" "$(ODIR)/$(ELFNAME).hex" else %.elf: %.o $(LINKER_DEF)               @echo "Linking $@"               @$(LD) -Wl,-Map,"$(MAPFILE)" $(LDOPT) -T $(LINKER_DEF) $(ODIR)/*.o -o $(ODIR)/$@@               @$(GENHEX) $(HEX_OPTS) "$(ODIR)/$(ELFNAME).elf" $(OUT_OPTS) "$(ODIR)/$(ELFNAME).hex" endif   kerryzhou_11-1759479140481.png Fig 12 2.2.7   Build to generate elf Commander: make clean make build to generate the elf files: kerryzhou_12-1759479140695.png Fig 13 After generation, the elf can be burned onto the S32K344 EVB board for testing. The test results show that the onboard red light is flashing, indicating that the IAR compiler can work in command-line mode. 3. Import RTD MCAL to IAR IDE project This chapter explains how to create an IAR IDE project and import MCAL drivers to implement S32K3 MCAL combined with EB tresos for running. 3.1 MCAL IAR IDE project 2 methods Difference between two methods and how to import MCAL drivers: (1) Directly copy the RTD MCAL driver to the IAR IDE project directory (2) Connect the IAR IDE project driver to the original RTD driver path kerryzhou_13-1759479140899.png Fig 14 3.2 MCAL IAR IDE project import steps 3.2.1 create the new RTD MCAL IAR project folder    Create a new folder, named as:S32K344_DIO_MCAL_RTD600_IAR 3.2.2 create the sub folder for IAR project       Generate:EB tresos project code       Include:app related include file       Mcal: mcal driver copy from RTD       src: project main file       Tresos_Project:EB tresos project kerryzhou_14-1759479140922.png Fig 15 3.2.3 create EB tresos project (1) Create the EB tresos project in the followign path:  S32K344_DIO_MCAL_RTD600_IAR\Tresos_Project\Mcal_Dio_S32K344_RTD600_IAR   (2)Add modules: BaseNXP, Dem, Dio, EcuC, Mcu, Platform, Port, Resource   (3)Copy RTD xdm files in the following path: C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Dio_TS_T40D34M60I0R0\examples\EBT\S32K3XX\Dio_Example_S32K344\TresosProject\Dio_Example_S32K344\config to: S32K344_DIO_MCAL_RTD600_IAR\Tresos_Project\Mcal_Dio_S32K344_RTD600_IAR\config   (4)EB tresos Generate project EB tresos code will be generated to folder: S32K344_DIO_MCAL_RTD600_IAR\Generate kerryzhou_15-1759479141010.png Fig 16 3.2.4 Copy RTD related drivers to IAR project folder (1) BaseNXP: header, include, src (2)Det:  include, src (3)Dio:  include, src (4)Mcu:  include, src (5)Platform: build_files, include, src, startup (6)Port: include, src (7)Rte: include, src Copy RTD folder to IAR project is one method, if don’t want to copy the file, also can use the linker to add the RTD install path drivers directly. kerryzhou_16-1759479141081.png Fig 17 3.2.5 IAR IDE create IAR project   (1) Project->Create new project   (2) In the IAR project, add group   The related folder in project can be structured like the fig 18, which contains:   Generate: Include and src->EB tresos project generate code   Mcal:  Base, Det, Dio, Mcu, Platform, Port, Rte->Mcal driver   Src: Main.c->project main code      (3) Add RTD mcal related drivers to IAR project The RTD MCAL related driver files can be directly downloaded from the RTD installation path or copied to a folder in the IAR project, and both methods yield the same result. kerryzhou_17-1759479141217.png Fig 18 (4)IAR project platform folder added result: kerryzhou_18-1759479141232.png Fig 19 (5)main code add Main.c can copy from path: C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Dio_TS_T40D34M60I0R0\examples\EBT\S32K3XX\Dio_Example_S32K344\src to S32K344_DIO_MCAL_RTD600_IAR\src Comment:  //#include "check_example.h"  // Exit_Example(TRUE);   3.2.6 IAR project options configuration (1)General options->Target->Device->NXP S32K344 (2)C/C++ Complier->Preprocessor Addional include directories: Use IAR project folder drivers which copied from RTD install path, the directories are: $PROJ_DIR$\Generate\include $PROJ_DIR$\mcal\BaseNXP_TS_T40D34M60I0R0\header $PROJ_DIR$\mcal\BaseNXP_TS_T40D34M60I0R0\include $PROJ_DIR$\mcal\Mcu_TS_T40D34M60I0R0\include $PROJ_DIR$\mcal\Platform_TS_T40D34M60I0R0\include $PROJ_DIR$\mcal\Rte_TS_T40D34M60I0R0\include $PROJ_DIR$\mcal\Platform_TS_T40D34M60I0R0\startup\include $PROJ_DIR$\mcal\Det_TS_T40D34M60I0R0\include $PROJ_DIR$\mcal\Dio_TS_T40D34M60I0R0\include $PROJ_DIR$\mcal\Port_TS_T40D34M60I0R0\include $PROJ_DIR$\include If use the RTD install path drivers, use the following directories: $PROJ_DIR$\Generate\include C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\BaseNXP_TS_T40D34M60I0R0\header C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\BaseNXP_TS_T40D34M60I0R0\include C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Mcu_TS_T40D34M60I0R0\include C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Platform_TS_T40D34M60I0R0\include C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Rte_TS_T40D34M60I0R0\include C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Platform_TS_T40D34M60I0R0\startup\include C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Dio_TS_T40D34M60I0R0\include C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Port_TS_T40D34M60I0R0\include C:\NXP\SW32K3_S32M27x_RTD_R21-11_6.0.0\eclipse\plugins\Det_TS_T40D34M60I0R0\include $PROJ_DIR$\include   Defined symbols: S32K3XX S32K344 IAR USE_SW_VECTOR_MODE D_CACHE_ENABLE I_CACHE_ENABLE ENABLE_FPU   Extra options: --no_clustering --no_mem_idioms --do_explicit_zero_opt_in_named_sections --require_prototypes --no_wrap_diagnostics   Languate 1:   Check Require prototypes   Diagnostics Suppress these disgnostics: Pa050 kerryzhou_19-1759479141564.png Fig 20 (3)Linker: Two points need to be added: $PROJ_DIR$\mcal\Platform_TS_T40D34M60I0R0\build_files\iar\linker_flash_s32k344.icf Library->Entry symbols: _start kerryzhou_20-1759479141785.png Fig 21 (4)Debugger Setup: PE micro, run to main Extra Options: Use command line options: --drv_vector_table_base=__ENTRY_VTABLE kerryzhou_21-1759479141872.png Fig 22 3.2.7  Build IAR project Project->Rebuild All kerryzhou_22-1759479141894.png Fig 23 3.2.8  Test result Download and debug result: kerryzhou_23-1759479142011.png Fig 24 After downloading and running, the red led is blinking on the board, indicating that the IAR IDE MCAL import method project has been successfully run.  
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* ================================================================================================== * Detailed Description: * * This example shows how to implement ADC continuous scan with DMA read. * ADC1 is set to perform continuous scan of 4 channels (S10/S11/S12,S13) with DMA request enabled * for last channel S13. DMA reads respective sequential ADC data registers in one major loop. * * ADC1 channel S10 is connected to board's potentiometer, converted value is used to dim board's LED. * * ================================================================================================== * Test HW: S32K312EVB-Q172 * MCU: S32K312_172LQFP * Compiler: S32DS 3.6.3 * RTD release: S32K3_S32M27x Real-Time Drivers ASR R21-11 Version 6.0.0 * Debugger: On-Board Debugger (J40), Lauterbach * Target: Internal_FLASH * ==================================================================================================   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.  
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*******************************************************************************  The purpose of this demo application is to present a usage of the  LPSPI IP Driver for the S32K3xx MCU.  The example uses LPSPI2 for transmit & receive Twelve bytes using the DMA. MOSI MISO connected on Hardware in loopback.  ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** DATA and Instruction CACHE is enabled by default --> in startup code :-- Dinesh_Guleria_5-1751970200614.png   Dinesh_Guleria_4-1751970159453.png Dinesh_Guleria_6-1751970233008.png   ========= This selection enable the use of CACHE driver API ========= Dinesh_Guleria_8-1751970355740.png   Dinesh_Guleria_7-1751970322758.png   ============= Use this MACRO ==================== #define USE_NON_CHACHABLE_REGION 1 This MACRO comment & uncomment will allocate the buffer in cachable & non cacable region of memory. You can allocate the SPI buffer in in cachable & non cacable region of memory. Enabling & disabling of this MACRO will adjust the example code. Dinesh_Guleria_9-1751971251496.png     ============ How this example works : Cacheable region used ============ I have connected MOSI and MISO pins of spi at hardware level. Whenever I am  sending and receiving total 10 numbers of 12 byte packet On each transmission of 12 byte packet I am incrementing the first bite of transmit buffer just to distinguish between packets at the receive side Cache_Ip_InvalidateByAddr() --> I have to call this API every time I receive 12 byte of data on receive buffer Cache_Ip_CleanByAddr() --> every time after incrementing the transmit buffer first byte ...I have to call this API then only the correct data is transmitted otherwise it will transmit the same data which was available at first time transfer ================ Cache API operation ============== Cache_Ip_InvalidateByAddr() is for the  invalidate operation. Cache_Ip_CleanByAddr() is for the clean operation or clean&invalidate operation that can be chosen by param of this api: @Param[in]  enInvalidate      Specifies to execute operation Clean&Invalidate. Clean: This operation ensures that all dirty lines—data in the cache that has been modified but not yet written back to the main memory—are written back to the main memory ->(push data from cache memory to main memory)  Invalidate: This operation marks the cache lines as invalid, ensuring that any subsequent access to these lines results in a fetch from the main memory, thus ensuring data consistency ->(push data from main memory to cache memory) Clean&invalidate : A cache clean and invalidate operation behaves as the execution of a clean operation followed immediately by an invalidate operation. Both operations are performed to the same location. ================ Pins used ====================== Dinesh_Guleria_0-1751969916564.png    
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*******************************************************************************  The purpose of this demo application is to present a usage of the  FS26 watchdog timer refresh using the SBC_FS26 CDD  ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * FS26 : CDD 2.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Please Modify attached code, and add this line of code, in this function Sbc_Wdg_Refresh_Notification  :-- Gpt_StopTimer(GptConf_GptChannelConfiguration_GptChannelConfiguration_0);   Dinesh_Guleria_0-1758195360264.png   This change will make the example work for even starting FS26, driver at 6 msec and above. Dinesh_Guleria_0-1758195859088.png   Watchdog type :-- NXP eval boards has ASIL-D FS26 part with challenger watchdog. The OTP of FS26 on the board uses challenger watchdog. Dinesh_Guleria_0-1756718067313.png Change watchdog in code :-- FS26 watchdog is started in disabled mode (means infinite period). Later on we change the watchdog time in the code :-- Dinesh_Guleria_1-1756718132100.png   Dinesh_Guleria_2-1756718767003.png   Array Index for watchdog refresh timing  :-- Dinesh_Guleria_3-1756718995126.png Example will run once you press switch USER_SW0 connected on PTB26 on the Evaluation board :-- Please add this type of check in your code, during development process so that, avoid any error due to FS26 watchdog mis trigger. When you use Debug FLASH then in that case code goes to flash memory & can cause your MCU to frequent RESET, which caused issue for reprogramming the NEW firmware on the board FLASH memory. If we add this type of check then we can avoid the Faulty FS26 Software to stop misbehaving before flashing new firmware on the board.   Dinesh_Guleria_0-1756719751273.png In CDD-2.0.0, FS26 goes to INIT_FS state here  :--- Sbc_fs26_InitDevice() --> Sbc_fs26_CheckStateAndGotoInitFS() Dinesh_Guleria_0-1756801397854.png   In CDD-2.0.0, If we start the Watchdog in enabled mode, watchdog notification function to refresh watchdog is called from this function  :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() -->  Dinesh_Guleria_1-1756801468887.png   Dinesh_Guleria_2-1756801505399.png   Dinesh_Guleria_4-1756801794626.png In CDD 2.0.0, Following function call will exit Debug mode & Release FS0b & FS1B pin :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() :--- --> Sbc_fs26_ExitDebugMode() --> Sbc_fs26_ReleaseSequence() Dinesh_Guleria_5-1756801976481.png   In CDD 2.0.1, Following function call will exit Debug mode & Release FS0b & FS1B pin :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() --> Sbc_fs26_ExitDebugMode() Dinesh_Guleria_6-1756802067148.png ===================== CDD-2.0.1 example ================= RTD used :-- S32K3XX_AASW_4_7_RTM_FS26_2_0_1_DS_updatesite_2311_signed.zip Watchdog started in the Disabled mode (i.e infinite Period) then watchdog period is changed in the code main() function :-- Dinesh_Guleria_0-1757654029498.png Dinesh_Guleria_2-1757654310161.png   Driver configuration :-- Dinesh_Guleria_1-1757654073235.png   These function get executed :--   Dinesh_Guleria_4-1757654554696.png   Dinesh_Guleria_5-1757654594171.png   Dinesh_Guleria_6-1757654613589.png One bug in RTD   ---> S32K3XX_AASW_4_7_RTM_FS26_2_0_1_DS_updatesite_2311_signed.zip :-- Dinesh_Guleria_7-1757655145135.png RTD driver Bug is corrected like this :--  Dinesh_Guleria_8-1757655226962.png  
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Abstract This example presents an use case for analogue data capturing using eMIOS, BCTU, SAR-ADC and DMA modules on S32K39-37-36 series based on the RTD low level API to support diverse application needs.   Connections: S32K396-BGA-DC1 -> Pin -> Signal -> Label J62-1 -> PTC30 -> siul2_gpio_xx -> GPIO1_GPT (D0) J58-1 -> PTE14 -> emios_0_ch_19_z -> PWM1 J58-2 -> PTG9 -> siul2_gpio_xx -> GPIO2_eMIOS_Trigger J62-2 -> PTC31 -> siul2_gpio_xx -> GPIO3_BTCU_Trigger J62-4 -> PTD6 -> siul2_gpio_xx -> GPIO4_BTCU_Watermark J62-24 -> PTB14 -> adc1_s21 -> ADC1 *To use the potentiometer of S32X-MB connect: J62-24 (in S32K396-BGA-DC1) to P26-1 (in S32X-MB) Note: Following line should be added in project/generate/src/Bctu_Ip_PBcfg.c every time the code is updated in Config Tools: #define DMA_LOGIC_CH_0 ((uint8)0U)   Detailed Description: The Compare Value of GPT eMIOS_0_ch_0 generates a time-out period. Once time-out is reached its Emios Notification toggles GPIO1. This allows us to observe in scope 2 events, which describe the start and the end of the signal sequence. The eMIOS_0_ch_23 channel is configured as global counter bus A. In this setup, it can act as the time base for other eMIOS_0 channels, enabling synchronization between other them—there is just one PWM in this case. This synchronization ensures that channels share the same time base, thereby defining a common period for their operation. The emios_0_ch_19_g channel is configured as OPWMT mode, which offer more flexibility for triggering. An interrupt is requested on every flag event, during which GPIO2 is toggled—happens at half the time high in this case. This flag event, can be configured using Trigger parameter. For more details about eMIOS, please refer to S32M27x/S32K3 – eMIOS Usage, considering differences for porting from S32K3 to S32K39-37-36 in AN14301. The BCTU implements a list for parallel conversions using ADC0 and ADC1. Which is triggered by the eMIOS channel, and the resulting data is stored in FIFO1, as follows: ADC0: VREFH_ChanNum51 -> BANDGAP_ChanNum48 ADC1: VREFL_ChanNum50 -> S21_ChanNum45 For debugging purposed the GPIO3 is toggled every BCTU Trigger Notification. Additionally, the GPIO4 is toggled in BCTU Watermark Notification, which happens every time the number of active entries in FIFO exceeds the watermark level, and therefore the data is available for reading. See full signal sequence in Figure 1: _Leo__0-1757444081948.png Figure 1. Signals of example project When you suspend debug session, in Expressions tab (Figure 2) you can observe results: g_fifo1Result, which corresponds to the BCTU list measurements, meanwhile g_fifo1Volts corresponds to the conversion in volts. _Leo__1-1757444095709.png Figure 2. Expressions tab of example project   References S32 Design Studio for S32 Platform Real-Time Drivers (RTD) S32K39, S32K37 and S32K36 Data Sheet [S32K39-S32K37-DS] S32K39, S32K37, and S32K36 Reference Manual [S32K396RM] S32K344 to S32K39/S32K37 Migration Guide [AN14301] S32K39/37/36 Electrification Microcontrollers Evaluation Board [S32K396-BGA-DC1] S32X-MB I/O Extension Evaluation Board for Real-Time Domain Control and Actuation [S32X-MB] S32M27x/S32K3 – eMIOS Usage [S32M Knowledge Base] S32M27x/S32K3 – eMIOS/BTCU/ADC/DMA – [RTD600] [S32M Knowledge Base] S32K39-37-36 – eFlexPWM/TRGMUX/BCTU/SAR-ADC/DMA – [RTD600] [S32M Knowledge Base] Application Software: - S32K396_RTD600_eMIOS_BCTU_SARADC_DMA_Ip_example Example was built and tested using the following IDE and Driver versions: - S32 Design Studio for S32 Platform Version 3.6.3 - S32K3_S32M27x Real-Time Drivers ASR R21-11 Version 6.0.0
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Abstract This example presents an use case for complementary PWM outputs with dead-time insertion and hardware ADC triggering using eFlexPWM, TRGMUX, BCTU, SAR-ADC and DMA modules on S32K39-37-36 series based on the RTD low level API to support diverse application needs. Connections: S32K396-BGA-DC1 -> Pin -> Signal -> Label J62-1 -> PTC30 -> siul2_gpio_94 -> GPIO1_GPT J62-5 -> PTD2 -> pwm_0_a, 2 -> PWM1 J62-6 -> PTD3 -> pwm_0_b, 2 -> PWM2 J62-30 -> PTD24 -> pwm_0_a, 0 -> PWMT J62-2 -> PTC31 -> siul2_gpio_95 -> GPIO3_BTCU_Trigger J62-4 -> PTD6 -> siul2_gpio_102 -> GPIO4_BTCU_Watermark J62-24 -> PTB14 -> adc1_s21 -> ADC1 *To use the potentiometer of S32X-MB connect: J62-24 (in S32K396-BGA-DC1) to P26-1 (in S32X-MB)   Note: Following line should be added in project/generate/src/Bctu_Ip_PBcfg.c every time the code is updated in Config Tools: #define DMA_LOGIC_CH_0 ((uint8)0U)   Detailed Description: The Compare Value of GPT eMIOS 0 channel 0 generates a time-out period. Once time-out is reached its eMIOS notification toggles GPIO1. This allows us to observe in scope 2 events, which describe the start and the end of the signal sequence. The eFlexPWM0 module is used for generating PWMs and hardware ADC triggering. The eFlexPWM0 Submodule 2 is employed to generate center-aligned complementary PWM outputs (PWM1 and PWM2) with dead-time insertion. The eFlexPWM0 Submodule 0 generates another independent PWM output (PWMT) and is utilized to generate the trigger signal for analog data capturing within the same PWM period —happens at half the time high in this case—using VAL0 register. The BCTU implements a list for parallel conversions using ADC0 and ADC1. Which is triggered by the eMIOS channel, and the resulting data is stored in FIFO1, as follows: • ADC0: VREFH_ChanNum51 -> BANDGAP_ChanNum48 • ADC1: VREFL_ChanNum50 -> S21_ChanNum45 For debugging purposed the GPIO3 is toggled every BCTU Trigger Notification. Additionally, the GPIO4 is toggled in BCTU Watermark Notification, which happens every time the number of active entries in FIFO exceeds the watermark level, and therefore the data is available for reading. See full signal sequence in Figure 1: _Leo__0-1757704142905.png Figure 1. Signals of example project When you suspend debug session, in Expressions tab (Figure 2) you can observe results: g_fifo1Result, which corresponds to the BCTU list measurements, meanwhile g_fifo1Volts corresponds to the conversion in volts. _Leo__1-1757633126890.png Figure 2. Expressions tab of example project   References S32 Design Studio for S32 Platform Real-Time Drivers (RTD) S32K39, S32K37 and S32K36 Data Sheet [S32K39-S32K37-DS] S32K39, S32K37, and S32K36 Reference Manual [S32K396RM] S32K344 to S32K39/S32K37 Migration Guide [AN14301] S32K39/37/36 Electrification Microcontrollers Evaluation Board [S32K396-BGA-DC1] S32X-MB I/O Extension Evaluation Board for Real-Time Domain Control and Actuation [S32X-MB] S32K39-37-36 – eMIOS/BTCU/SAR-ADC/DMA – [RTD600] [S32K Knowledge Base]   Application Software: - S32K396_RTD600_eFlexPWM_TRGMUX_BCTU_SARADC_DMA Example was built and tested using the following IDE and Driver versions: - S32 Design Studio for S32 Platform Version 3.6.3 - S32K3_S32M27x Real-Time Drivers ASR R21-11 Version 6.0.0
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The S32K3 family of 32-bit AEC-Q100 qualified MCUs combines a scalable family of Arm® Cortex-M7-based microcontrollers built on long-lasting features with a comprehensive suite of production-grade tools. S32K3 MCUs are included in NXP’s Product Longevity Program, guaranteeing a minimum of 15 years of assured supply. The S32K3 offers dedicated peripherals set for rapid motor control loop implementation: enhanced Modular IO Subsystem(eMIOS), Logic Control Unit (LCU), TRGMUX, BodyCross-triggering Unit (BCTU), Analog to Digital Converter(ADC), and Analog Comparator (CMP). The comprehensive motor control ecosystem based on Automotive Math and Motor Control Library(AMMCLib) set, FreeMASTER with Motor Control ApplicationTuning (MCAT) tool and Model-Based Design Toolbox (MBDT) helps to enable S32K3 MCU in wide range of motor control use cases. The table below points to the articles with more detailed description each of S32K3 motor control use cases, hardware description, links to appropriate application notes and their addendums, and software repositories.  Device HW Article S32K344       MCSPTE1AK344 12 V development kit engineered for 3-phase PMSM and BLDC motor control applications     FOC with dual shunt current measurement Article focuses on solution based Field Oriented Control (FOC) technique (typically used for 3-phase PMSM motors) with dual shunt current measurement and without any position sensor (sensorless). The Encoder sensor is supported by SW option, but missing on HW kit. The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with high-level Autosar compliant API or low-level non-Autosar API.    FOC with single shunt current measurement Article focuses on solution based Field Oriented Control (FOC) technique (typically used for 3-phase PMSM motors) with single shunt current measurement and without any position sensor (sensorless). The Encoder sensor is supported by SW option, but missing on HW kit. The single shunt current measurement is advanced technique that allows decrese the cost of Bill of Material (BOM). The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with high-level Autosar compliant API or low-level non-Autosar API.    FOC integrated with FreeRTOS Article focuses on integration of motor control software (based on FOC with dual shunt current measurement) and Real Time Operating System (FreeRTOS). The available example code is based ANSI-C  code and uses RTD drivers with low-level non-Autosar API.    Six-step commutation control. Article focuses on solution based Six-step commutation (6-step) technique (typically used for 3-phase BLDC motors) with Hall position sensor and without any position sensor (sensorless). The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with low-level non-Autosar API.    Note: the list of use cases cannot cover all combinations of MCU, current measurement scenario, control technique and sensor inputs, but should work as a base reference for most common configurations. This list is not final, please follow this acticle to be notified about updates with new use cases.   
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******************************************************************************** The purpose of this demo application is to show you how to use the Temperature Sensor module in S32DS. It includes two methods to obtain temperature. -The first one starts a normal software conversion with one-shot mode on temp sense channel and calculates the temperature on chip from the data conversion. -The second one calculates the temperature based on given data (if read directly using ADC). Note: Please adjust the ADC reference voltage according to the board you are using * ------------------------------------------------------------------------------ * Test HW: S32K344EVB-T172 * MCU: S32K344 1P55A * Compiler: S32DS.ARM.3.5/6 * SDK release: S32K3_RTD_6.0.0/5.0.0/4.0.0_P24 * Debugger: OpenSDA/PE&Micro * Target: internal_FLASH *Jumper:J18-1:2,5V used. ********************************************************************************* Note that if you use "sprintf", you need to check the following option. Senlent_0-1753435505415.png  
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******************************************************************************* The purpose of this demo application is to use pad keeping for  PINS and enter the standby mode & before entering the standby mode update variables in Standby RAM memory with pin state. Once wake up from the standby mode update the pins values from the STANDBY RAM variables.  S32K3xx MCU.  ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE Micro * Target: internal_FLASH ******************************************************************************** =============== How this DEMO works ========== Before entring standby :-- Before entering standby mode, i make BLUE LED high SW6 on board pressed to enter the standby mode. Wakeup from Standby :-- SW5 on board pressed to wakeup from standby After wakeup from Stand by:-- I glow Green LED Unglow the BLUE LED Wait for SW6 on board to be pressed to enter the standby mode. ===============  Stand by RAM location =============== As noted, the Standby SRAM is allocated at the first 32 KB of the SRAM Memory. https://www.mouser.com/pdfDocs/S32K3MemoriesGuide.pdf =============== Pins used for PAD keeping =============== PTA30, PTA31, PTD14 Dinesh_Guleria_1-1706609081807.png   Dinesh_Guleria_2-1706609164083.png   =============== Switches used =============== Dinesh_Guleria_0-1706609013348.png   Enter Standby mode, by pressing SW6 on Board EXIT Standby mode, by pressing SW5 on Board =============== Wakeup source, SW5 PTB26 =============== Dinesh_Guleria_3-1706609222511.png =============== WKPU[41]  ---> WKPU_CH_45=============== Because First 4 WKPU are timers, so 41 + 4 = 45 Dinesh_Guleria_0-1706610068634.png   =============== Linker file changed =============== Added Standby RAM memory & sections for standby RAM memory. Changes can be seen by comparing the original linker file  Dinesh_Guleria_4-1706609365318.png   Dinesh_Guleria_5-1706609374981.png Dinesh_Guleria_6-1706609386872.png   Dinesh_Guleria_7-1706609395948.png =============== Startup file changed , startup_cm7.s =============== Added call to Initialise the Standby RAM Changes can be seen by comparing the original startup_cm7.s file Dinesh_Guleria_8-1706609506315.png     ======================= How to verify if Standby RAM is working =============== 1> Declare two variables in file Wkup.c :-- __attribute__ ((section (".standby_ram_data"))) volatile int test_0_value ; __attribute__ ((section (".standby_ram_data"))) volatile int test_1_value ; Dinesh_Guleria_0-1706795824611.png   2> function set_pin_value() will be called before entering the standby mode. Initialise the values to these two variables inside function set_pin_value() in file Wkup.c. Dinesh_Guleria_1-1706795851364.png   3> Now burn the code inside the MCU using the PE micro debugger.     Once code is burned do not run the code & disconnect the debugger. 4> Power OFF and power ON the S32K312 board. Now code is waiting to enter standby mode. Press switch SW6 MCU will enter standby mode & Blue LED glowing. Press switch SW5 MCU will wakeup from the standby mode. Code will Now code is waiting to enter standby mode 5> Now open your debugger configuration, and attach to running target. Dinesh_Guleria_2-1706795891040.png   6> Once connected click on the ELF file & press pause button. Dinesh_Guleria_3-1706795905290.png   7> In Debug window you can see the value of variables test_0_value & test_1_value same as initialised before entering the standby mode. Dinesh_Guleria_4-1706795934951.png   Dinesh_Guleria_0-1706799345237.png   Dinesh_Guleria_1-1706799364449.png  
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* ================================================================================================== Detailed Description: * This example shows how to implement the UART RX/TX using interrupt/callback under FreeRTOS. * LPUART6 is set for 115200, 8N1 using interrupt processing. Callback is called for single byte received. * Reception is advanced until buffer is full or "\n" is received. * 2 tasks (receive/send) and 1 Queue are created. * ReceiveTask starts new UART reception, waits for completion and puts received message into Queue. * SendTask gets the message from Queue, echoes it back and toggle pin (LED_PIN <-> PTA29). * ================================================================================================== * Test HW: S32K3x4EVB-T172 Rev B * MCU: S32K344_172HDQFP * Compiler: S32DS 3.6.2 * RTD release: S32K3_S32M27x Real-Time Drivers ASR R21-11 Version 6.0.0 * Debugger: On-Board Debugger (J41) * Target: Internal_FLASH * Serial: 115200, 8N1 * ==================================================================================================   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.
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******************************************************************************** * Detailed Description: * The S32K144 MCU is configured as a LIN Slave node. * When a MasterReq frame (0x3C) is received with Go-to-sleep command, the stack goes to sleep. * The application can read: * l_flg_tst_LI0_MasterReq_flag() * l_ifc_read_status(LI0) * When a falling edge is detected on the LPUART RX pin, * LinWakeUpTimerNotification() is called. * The notification has to be enabled in MEX. * Gpt (LPIT) timer is used to calculated the length of the wake-up signal. * * ------------------------------------------------------------------------------ * Test HW: S32K144EVB-Q100 * MCU: S32K144 * Debugger: S32DS_ARM_3.6, S32K1_RTD_3_0_0_D2503 * Target: internal_FLASH ********************************************************************************   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.
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******************************************************************************** * Detailed Description: * CM7_0 starts CM7_2 using Power_Ip or directly in MC_ME (macro USE_RTD_POWER_IP). * Disconnect the debugger and power-cycle the MCU. * * ------------------------------------------------------------------------------ * Test HW: S32K3x8EVB-Q289 * MCU: S32K358 * Debugger: S32DS_ARM_3.5, S32K3_RTD_4_0_0_P24_D2405 * Target: internal_FLASH ******************************************************************************** Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.
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S32K344 + MC33664 + MC33774 : RTD 3.0.0 : BMS SDK 1.0.2 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K344-MC33664-MC33774-RTD-3-0-0-BMS-SDK-1-0-2/ta-p/2028783 S32K344 + MC33665 + MC33774 : RTD 3.0.0 : BMS SDK 1.0.2 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K344-MC33665-MC33774-RTD-3-0-0-BMS-SDK-1-0-2/ta-p/2127108 S32K344 + MC33664 + MC33775 : RTD 3.0.0 : BMS SDK 1.0.2 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K344-MC33664-MC33775-RTD-3-0-0-BMS-SDK-1-0-2/ta-p/2127049 S32K344 + MC33665 + MC33775 : RTD 3.0.0 : BMS SDK 1.0.2 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K344-MC33665-MC33775-RTD-3-0-0-BMS-SDK-1-0-2/ta-p/2127140 S32K144 : RTD-1.0.1 porting for : BCC_S32K144_FreeMASTER :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K144-RTD-1-0-1-porting-for-BCC-S32K144-FreeMASTER/ta-p/2130167
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MCU : S32K144 AFE : MC33771 RTD : 1.0.1 As we know BCC sample software for MC33771C which is delivered is based on SDK for S32K144 , and uses S32DS-2.2 :-- BCC_S32K144_FreeMASTER I am having a setup , for this combination, using SPI :-- FRDM33771CSPEVB evaluation board  + S32K144 + 14 cell Battery EMULATOR :    S32K144 pins used :-- MOSI :  LPSPI0  : PTB-4 MISO :  LPSPI0  : PTB-3 SCK :    LPSPI0  : PTB-2 CSB :    LPSPI0  : PTB-5 RESET line of MC33771C : PTD-4 FRDM33771CSPEVB pins used :-- https://www.nxp.com/docs/en/user-guide/UM11402.pdf SI of MC33771C : Connects to MOSI of S32K144 : K2-7 SO of MC33771C : Connects to MISO of S32K144 : K2-9 SCK of MC33771C : Connects to PTD-4 of S32K144 : K2-11 CSB :    K2 -5 RESET line of MC33771C : K4 -1 Freemaster uses UART-1 on S32K144 EVB ():-- TX : PTC7 RX : PTC6 I have ported the BCC_S32K144_FreeMASTER  sample code to S32K144 using RTD-1.0.1 & is working fine. This attached code work fine for SPI.  Two sample project i have attached, both are tested and working fine :--- 1> Chip select is controlled by LPSPI. 2> Chip select is controlled manually in user software. Fremaster project is also inside the folder, name of freemaster project is :-- 1> FreeMASTER_project.pmp TPL related part i have not ported & tested because at present i am not having MC33664ATL on S32K144 EVB board & do not have FRDM33771BTPLEVB (MC33771C board with TPL on it). Regards, Dinesh
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The S32K14x MCU ARM Cortex M4F core processor handles fault exceptions using four handlers.   Handlers UsageFault_Handler() Usage faults are caused by an application that incorrectly uses Cortex M4 processor trying to execute an undefined instruction execute an instruction that makes illegal use of the Execution Program Status Register (EPSR), typically, this processor support only Thumb instruction set and it requires that all branch targets should be indicated as odd numbers, having bit[0] set. perform an illegal load of EXC_RETURN to the PC access a coprocessor if the access is denied or privileged only (configurable in CPACR) make an unaligned memory access execute an SDIV or UDIV instruction with a divisor of 0   The detection of the division by zero fault is disabled by default which means that such an operation returns zero and the fault is not detected. Similarly, the Cortex-M4 processor supports unaligned access for certain instructions. The detection on both the division by zero and the unaligned access (for every instruction) faults can be enabled in Configuration and Control Register (CCR).   BusFault_Handler() Bus faults occur when a bus slave returns an error response while stacking for an exception entry unstacking for an exception return prefetching an instruction during floating-point lazy state preservation Beside these faults listed above, there are also bus faults labeled as Precise and Imprecise. Imprecise bus fault occurs when an application writes to buffered memory region and continues executing subsequent instructions before the actual bus fault is detected. Therefore, at the time the exception rises the program counter doesn’t point to the instruction that has caused the bus fault. For debugging purposes, it is necessary to have “precise” program counter value to know which instruction has caused the fault exception. Imprecise bus fault can be forced to be precise by disabling the write buffer in (ACTLR_DISDEFWBUF = 1). This however might decrease the performance.   Note: The S32K144 MCU has its own system Memory Protection Unit which is implemented on the bus. Therefore, any system MPU violation triggers bus faults.   MemManage_Handler() Typically, these exceptions rise on an attempt to access regions that are protected by the core ARM Cortex M4 Memory Protection Unit. attempt to load or store at a protected location instruction fetch from a protected location stacking/unstacking fault caused by violation of the memory protection protection violation during floating-point lazy state preservation   S32K1xx series implements its own system Memory Protection Unit on the bus and therefore an attempt to access a protected region results in a bus fault exception instead. Nevertheless, the system MPU does not protect access to peripheral registers, and as the attached example code shows, an attempt to fetch instruction from a peripheral memory region causes a MemManage fault exception.   HardFault_Handler() This handler is the only one that has a fixed priority (-1) and is always enabled. If other handlers are disabled (in the SHCSR register), all faults are escalated to this handler. The escalation take place also when a fault occurs during another fault handling execution or while the vector table is read.   Priority of exception fault handlers   The fault exception handlers’ priorities, besides the HardFault handler (fixed priority -1), are configurable in fields PRI_4, PRI_5 and PRI_6 of SHPR1 register. These fields are byte-accessible and Cortex M4 support 255 priority levels, however, S32K14x MCUs support 16 priority levels only. Therefore, priorities are configurable in the four most significant bits of PRI_4, PRI_5 and PRI_6 only, which is similar to other NVIC IPR registers as shown below.   The lower priority number is set, the higher priority. By default, all handlers have priority set to zero.   Status and address registers for fault exceptions Configurable Fault Status Register (CSFR) consists from three status bit fields for Usage Fault (UFSR), Bus Fault (BFSR), and Memory Management Fault (MMFSR) where each bit represents a fault exception.     There are also two auxiliary address registers. If BFARVALID is set in the BFSR register, Bus Fault Address Register (BFAR) holds the memory access location of a precise bus fault. Similarly, if MMARVALID bit is set in MMFSR register, Memory Manage Address Register (MMAR) holds the address of a MemManage fault.   Example code To demonstrate the debugging process, the following exceptions can be forced: attempt to access an unimplemented memory area attempt to write to a non-gated peripheral register write to read only register fetching an instruction from a protected peripheral memory region division be zero unaligned memory access execution of a non-thumb instruction execution of an undefined instruction   When the program enters an exception handler, the stack frame is pushed onto the stack including the program counter value of the fault instruction. In this example, the exception handlers are declared with __attribute__((nake_)) (fault_exceptions.h), no prologue is generated and the program counter is always offset by 6 words (0x14) from the stack pointer that can be read in the handlers using either the debugger (memory view) or a SW pointer. If an application uses Process Stack Pointer (PSP) as well, it is necessary to find out whether the stack pointer comes from Main Stack Pointer (MSP) or PSP, this information is available in the EXC_RETURN value in the link register. Having a precise program counter address, we can find the fault instruction in Disassembly. This applies to all exception except for imprecise bus faults as explained above, imprecise bus faults can be forced to be precise by disabling the Write buffer.   The CSFR register is read to determine which exception has occurred and, if available, the memory access location that has caused the exception.    References Cortex-M4 Devices Generic User Guide Cortex-M4 Technical Reference Manual   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.
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This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 2 AFE MC33775 board connected in TPL 3> Change following macro in mc33775_cfg.h file  to change the numbers of AFE connected in TPL. Dinesh_Guleria_0-1751448691254.png     RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33775 AFE connected in TPL mode. Dinesh_Guleria_1-1751448736809.png   =============== MCU Pins used =========== Dinesh_Guleria_2-1751448793258.png   FRDM665SPIEVB Jumper setting  :--- Dinesh_Guleria_3-1751448793501.png     Dinesh_Guleria_4-1751448793032.png   Dinesh_Guleria_5-1751448793336.png   Dinesh_Guleria_6-1751448792697.png   Dinesh_Guleria_7-1751448793330.png       Dinesh_Guleria_8-1751448793495.png   K1, K2 & K4 connector of S32J344 EVB :-- Dinesh_Guleria_9-1751448793319.png     Dinesh_Guleria_10-1751448793236.png   Dinesh_Guleria_11-1751448793280.png       K1 on MC33665 & S32K334 evb :--  Dinesh_Guleria_12-1751448793239.png   Dinesh_Guleria_13-1751448793356.png   K2 on MC33665 & S32K334 evb :--  Dinesh_Guleria_14-1751448793283.png   K4 on MC33665 & S32K334 evb :--  Dinesh_Guleria_15-1751448793320.png     Dinesh_Guleria_16-1751448793321.png   ================= EVB Link ==================   https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/FRDM665SPIEVB https://www.nxp.com/design/design-center/development-boards-and-designs/RD33775ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172 ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Dinesh_Guleria_17-1751448981100.png   Disable Communication timeout in code :-- Dinesh_Guleria_18-1751448980612.png     ================= Results for TWO AFE =========================== Dinesh_Guleria_19-1751449011195.png   Dinesh_Guleria_20-1751449018900.png   Dinesh_Guleria_21-1751449027847.png   Dinesh_Guleria_22-1751449036447.png    
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This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 3 AFE MC33774 board connected in TPL 3> Change following macro in mc33774_cfg.h file  to change the numbers of AFE connected in TPL. Dinesh_Guleria_25-1751448180253.png     RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33774 AFE connected in TPL mode. FRDM665SPIEVB stackable board used for MC33665. Dinesh_Guleria_2-1751446322823.png   Dinesh_Guleria_3-1751446581217.png   Dinesh_Guleria_5-1751446645337.png =============== MCU Pins used =========== Dinesh_Guleria_6-1751446713080.png FRDM665SPIEVB Jumper setting  :--- Dinesh_Guleria_8-1751446761725.png   Dinesh_Guleria_7-1751446740262.png Dinesh_Guleria_9-1751446794794.png Dinesh_Guleria_10-1751446821343.png Dinesh_Guleria_14-1751447262458.png   Dinesh_Guleria_11-1751447163899.png K1, K2 & K4 connector of S32J344 EVB :-- Dinesh_Guleria_12-1751447210478.png   Dinesh_Guleria_13-1751447220438.png Dinesh_Guleria_17-1751447440073.png     K1 on MC33665 & S32K334 evb :--  Dinesh_Guleria_15-1751447331208.png Dinesh_Guleria_16-1751447372666.png K2 on MC33665 & S32K334 evb :--  Dinesh_Guleria_18-1751447532421.png K4 on MC33665 & S32K334 evb :--  Dinesh_Guleria_19-1751447635350.png   Dinesh_Guleria_20-1751447642455.png ================= EVB Link ================== https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/FRDM665SPIEVB https://www.nxp.com/design/design-center/development-boards-and-designs/mc33774ata-evaluation-board-with-isolated-daisy-chain-communication:RD33774ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172   ================== Measurement types used in example ===== Periodic measurement is done by 33774 , this is cyclic Other Two : application , sync  need send command to start Application measurement , need send app_capture command twice , and then read the result. Dinesh_Guleria_5-1737009817595.png Synchronous measurement take out the Primary adc result(VC)and secondary result(VB) .But the VC and VB result comes from different adc. Dinesh_Guleria_7-1737009854223.png Period measurement start when you send  API "MSR_StartMeasurement" and then 774 will do period measurement automatically periodically :-- Dinesh_Guleria_0-1737006679159.png   Why we need to measure Vc & Vb both :-- ASIL-D ,yes we can measurement VC channel by primary ADC and measurement VB by secondary ADC from hardware VC and VB are come from same point of battery cell. Now 2 ADC compare with each other, that lead to high safety (ASIL D). Primary & Secondary Device temperature reading :-- This API is used for it MC33774_CDD_BCC_SWC_Running_Slot4(). ============= Cell Balancing =========== Cell Balancing method used :-- MC33774 balance will switch between odd channel (1,3,5,7,... 17) and even channel (2,4,6,8,..18) by 500ms period , (250ms for odd and then switch to even 250ms and then odd 250ms...)it is because of IC design and cannot change by software.   MC33774 have lots of balance method  this example uses "timer method ". How to check Balancing is enabled :-- Following function MC33774_CDD_BCC_SWC_Running_Slot5() read the : Balance status & fault registers BAL_SWITCH_STAT0, BAL_SWITCH_STAT1 represent the balancing MOSFET current status. Dinesh_Guleria_9-1737010317798.png   Measure the voltage drop across the balancing register is the best approach. You will see the voltage drop appears every 250ms if PWM is 100%.  Please check the schematic of the 33774 EVB, find the balancing resistor on which channel balancing is enabled. Dinesh_Guleria_8-1737009961220.jpeg     ======= How much time to wait to extract the measurements results ======= 240 us is the time of one SCAN Time between each Application measurement sequence. Min App measure time for 16 sample :-- 4.08ms = (16+1) *240 Min 1 SYNC measurement time, for 16 samples = 18 cycle ≈ 18 * (16*240us) ≈ 69 ms ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Dinesh_Guleria_2-1737009365867.png Dinesh_Guleria_3-1737009457282.png Disable Communication timeout in code :-- Dinesh_Guleria_1-1737009207053.png   ================= Results for FIRST AFE =========================== Dinesh_Guleria_21-1751447844674.png   Dinesh_Guleria_22-1751447886464.png     Dinesh_Guleria_23-1751447903059.png   Dinesh_Guleria_24-1751447923327.png   Dinesh_Guleria_26-1751448200293.png  
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This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 2 AFE MC33775 board connected in TPL 3> Change following macro in mc33775_cfg.h file  to change the numbers of AFE connected in TPL. Dinesh_Guleria_0-1751444824257.png   RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33775 AFE connected in TPL mode. Dinesh_Guleria_1-1751444903293.png Dinesh_Guleria_4-1751444951351.png   =============== MCU Pins used =========== TPL1-TX :-- TPL1TXCSB  --> PTC6/LPSPI0_PCS1 TPL1TXSCLK --> TPL12TXCLK --> PTE1/LPSPI0_SCK    TPL1TXDATA --> TPL12TXDATA --> PTE2/LPSPI0_SOUT    TPL1-RX :-- TPL1RXCSB  --> PTB17/LPSPI1_PCS3 TPL1RXCLK  --> PTB14/LPSPI1_SCK TPL1RXDATA --> PTB15/LPSPI1_SIN   Dinesh_Guleria_5-1751444995267.png   ================= EVB Link ================== https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/analog-toolbox/evaluation-board-for-mc33664atl-isolated-network-high-speed-transceiver:FRDMDUALK3664EVB https://www.nxp.com/design/design-center/development-boards-and-designs/RD33775ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172   ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Dinesh_Guleria_7-1751445511631.png Disable Communication timeout in code :-- Dinesh_Guleria_8-1751445665946.png   ================= Results for FIRST AFE =========================== Dinesh_Guleria_10-1751445763053.png   Dinesh_Guleria_11-1751445783188.png   Dinesh_Guleria_12-1751445799938.png   Dinesh_Guleria_13-1751445817222.png   Dinesh_Guleria_14-1751445832193.png  
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This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 2 AFE MC33774 board connected in TPL 3> Change following macro in mc33774_cfg.h file  to change the numbers of AFE connected in TPL. Dinesh_Guleria_17-1737011497931.png RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33774 AFE connected in TPL mode. Dinesh_Guleria_13-1737010598219.png   Dinesh_Guleria_14-1737010607362.png   Dinesh_Guleria_15-1737010623130.png   Dinesh_Guleria_16-1737010636852.png   =============== MCU Pins used =========== TPL1-TX :-- TPL1TXCSB  --> PTC6/LPSPI0_PCS1 TPL1TXSCLK --> TPL12TXCLK --> PTE1/LPSPI0_SCK    TPL1TXDATA --> TPL12TXDATA --> PTE2/LPSPI0_SOUT    TPL1-RX :-- TPL1RXCSB  --> PTB17/LPSPI1_PCS3 TPL1RXCLK  --> PTB14/LPSPI1_SCK TPL1RXDATA --> PTB15/LPSPI1_SIN   Dinesh_Guleria_0-1737012601104.png   ================= EVB Link ================== https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/analog-toolbox/evaluation-board-for-mc33664atl-isolated-network-high-speed-transceiver:FRDMDUALK3664EVB https://www.nxp.com/design/design-center/development-boards-and-designs/mc33774ata-evaluation-board-with-isolated-daisy-chain-communication:RD33774ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172   ================== Measurement types used in example ===== Periodic measurement is done by 33774 , this is cyclic Other Two : application , sync  need send command to start Application measurement , need send app_capture command twice , and then read the result. Dinesh_Guleria_5-1737009817595.png Synchronous measurement take out the Primary adc result(VC)and secondary result(VB) .But the VC and VB result comes from different adc. Dinesh_Guleria_7-1737009854223.png Period measurement start when you send  API "MSR_StartMeasurement" and then 774 will do period measurement automatically periodically :-- Dinesh_Guleria_0-1737006679159.png   Why we need to measure Vc & Vb both :-- ASIL-D ,yes we can measurement VC channel by primary ADC and measurement VB by secondary ADC from hardware VC and VB are come from same point of battery cell. Now 2 ADC compare with each other, that lead to high safety (ASIL D). Primary & Secondary Device temperature reading :-- This API is used for it MC33774_CDD_BCC_SWC_Running_Slot4(). ============= Cell Balancing =========== Cell Balancing method used :-- MC33774 balance will switch between odd channel (1,3,5,7,... 17) and even channel (2,4,6,8,..18) by 500ms period , (250ms for odd and then switch to even 250ms and then odd 250ms...)it is because of IC design and cannot change by software.   MC33774 have lots of balance method  this example uses "timer method ". How to check Balancing is enabled :-- Following function MC33774_CDD_BCC_SWC_Running_Slot5() read the : Balance status & fault registers BAL_SWITCH_STAT0, BAL_SWITCH_STAT1 represent the balancing MOSFET current status. Dinesh_Guleria_9-1737010317798.png   Measure the voltage drop across the balancing register is the best approach. You will see the voltage drop appears every 250ms if PWM is 100%.  Please check the schematic of the 33774 EVB, find the balancing resistor on which channel balancing is enabled. Dinesh_Guleria_8-1737009961220.jpeg     ======= How much time to wait to extract the measurements results ======= 240 us is the time of one SCAN Time between each Application measurement sequence. Min App measure time for 16 sample :-- 4.08ms = (16+1) *240 Min 1 SYNC measurement time, for 16 samples = 18 cycle ≈ 18 * (16*240us) ≈ 69 ms ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Dinesh_Guleria_2-1737009365867.png Dinesh_Guleria_3-1737009457282.png Disable Communication timeout in code :-- Dinesh_Guleria_1-1737009207053.png   ================= Results for FIRST AFE =========================== Application Measurement : Cell voltage result :-- Dinesh_Guleria_10-1737010449756.png SYNC measurement : VC, VB same for both primary & Secondary  measure :-- Dinesh_Guleria_11-1737010480668.png   Dinesh_Guleria_12-1737010488510.png    
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*******************************************************************************  The purpose of this demo application is to present a usage of the HSE IP Driver for the S32K3xx MCU. This DEMO make use of SHE based keys & the RAM keys.  Step-1> Uncomment this MACRO to program the MASTER_ECU_KEY & BOOT_MAC_KEY #define FORMAT_HSE_KEY_CATALOG (1U) Step-2> Then comment the above mentioned MACRO to test the demo. Step-3> End of the DEMO in Switch case HSE_ERASE : keys are erased. HSE_EraseKeys(); SHE based secured boot :-- This demo uses the SHE based secured boot. You can test this after performing step-1. Once SHE is enabled code will be stuck at this point, after this issue an RESET. Dinesh_Guleria_0-1749449427708.png    ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************
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