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This post entry aims at explaining the debugging process oriented to EMVCo Contactless certification of a device integrating NXP's PN5180. The structure is the following: PN5180 Antenna design considerations Before going into the debugging process for the EMVCo Contactless Analog tests we will see some important considerations for an antenna design and impedance tuning oriented for an EMVCo compliant device. Antenna tuning recommendations The first recommendation is that with the Dynamic Power Control feature the PN5180 allows us to perform symmetrical antenna tuning instead of the typical asymmetrical tuning. This symmetrical tuning provides us with a better transfer function, being able to drive more power to the antenna. The following figure shows the Smith Chart with the S11 parameter plot of a device using a symmetrical antenna tuning:   The only disadvantage of the symmetrical tuning is that we need a current limiter to avoid destroying the chip because of exceeding the chip’s limits. In the case we are documenting today, the PN5180 DPC feature is used to limit the supply voltage and therefore the transmitter current depending on the load detected by the chip. Regarding the EMC filter, the inductor should fit with the following condition to guarantee a good relation between the AGC and the ITVDD: Another consideration is about the resistor used in the reception branch. This resistor controls the receiver sensibility and as a starting point is recommended to use a value to obtain an AGC in free air of: Reader Mode only design: AGC value in free air around 600dec Full NFC design: AGC value in free air around 300dec Finally, EMV contactless transactions are performed at 106kbps which would allow us to work with a high Q factor of the overall system. This means that the power gain can be higher, but at the same time it might also lead to some issues because of the lower bandwidth. In light of this, we have to bear in mind, that if the Q factor is too high it may lead to problems in the waveform tests. PN5180 DPC calibration The Dynamic Power Control is a feature that uses the AGC value to establish different power configurations depending on the load applied to the antenna. As I mentioned before, the main goal is to protect the chip from a transmitter current level that might destroy it. The first step before calibrating the DPC is to check the correlation between the AGC value and the transmitter current or ITVDD when different loads are applied to the antenna. Basically, we will play with the distance between the load and the device to get several points with different AGC values. Based on those measurements, we can plot a graph like the following: Normally we would use a reference PICC and a metal plane or phone to check that the behavior is linear and with no big difference between those loads. Once we have checked the correlation we can proceed with the calibration process, which can be done very easily with the NFC Cockpit software. Here the important thing is to control the ITVDD and keep it always below the chip’s limit. As you can see in the figure below, without the DPC, this symmetrical tuning would lead to a voltage above the limit for positions close to the reader antenna. However, with DPC we can control that voltage at any moment. Another consideration is that we have to make sure that the DPC is calibrated to have maximum power when the reference PICC is far from the reader to avoid a lack of power in the tests at those positions. EMV L1 Analog Tests Debugging process We are going to divide this debugging process into 3 main phases which are the power tests in the first instance, followed by the waveform tests and the reception tests. The reason why we set this order is to first debug the tests that may require HW modifications which have a strong impact on the other tests. This way, for example, if you have passed all power and waveform tests, debugging the reception tests may not have an impact on the results obtained previously. Power tests Tests setup In order to debug the power tests, we will need just an oscilloscope and an EMVCo reference PICC. We will need to connect the outputs J9 and J1 of the EMVCo reference PICC to the oscilloscope and set the jumper J8 of the reference PICC in non-linear load mode. The J9 of the EMVCo reference PICC is the DC_OUT output that we will use to measure the power received by the antenna. The J1 is the LETI_COIL_OUT output and we will use it to capture the command in the oscilloscope. The overall setup is depicted in the figure below. Performing tests We have to use the trigger to capture the REQA command sent from the DTE when the reference PICC is in the position we want to test. This capture can be seen in the two figures below. The yellow channel is the LETI_COIL_OUT of the EMVCo reference PICC and the blue channel represents the DC_OUT obtained from the J1 connector. As said previously, we will use the DC_OUT to measure the voltage in the period of the signal where there is no modulation, like this part highlighted with the red squared. We have zoomed into the period to get the average value using the oscilloscope measurement features. We will use this same procedure to evaluate the power tests in all positions. Depending on the position tested, the specifications define and certain range where the voltage measured should be fitted. In this sense, the maximum voltage level is common for all planes, but the minimum voltage allowed will decrease for positions further from the terminal.  In order to identify the critical positions for the power tests, we have to identify two different scenarios, the first one with the positions that might not reach the minimum voltage established, and the positions that might exceed the maximum value. For the first scenario the critical positions are the outer positions of the plane z = 4cm and the plane z=3cm as the external positions for plane z= 3cm have a bigger radius. The other scenario is that where you can be exceeding the maximum level. This situation can happen in the central positions of the lower planes, like plane z=1 or z=0. Debugging hints In order to overcome possible issues, we will give some tips that can be used for your design. Regarding a case of lack of power, first, we have to make sure that the DPC is correctly calibrated, meaning that you are operating in gear 0 for the external positions of planes 3 and 4 and that gear 0 is operating with full power. If we have verified those two things and we still have issues, we would need to change the tuning of the antenna and reduce the target impedance. This is graphically represented in the following Smith Chart: By reducing the impedance we increase the current that the PN5180 is driving to the antenna so the voltage would increase. Is important to always verify that we are working within the recommended operating range of the chip and that we are not exceeding the transmitter current limit. In a worst-case scenario, if we cannot achieve the voltage with these HW changes we would need to evaluate changes in the hardware design, like adding a ferrite sheet or changing the antenna dimensions or position. On the other hand, if the problem comes because we are exceeding the maximum voltage allowed by the specifications we can easily solve it by reducing the power configuration of the gear used in that specific position. Waveform tests Test setup For the waveform group of tests, we will use a setup consisting of the EMVCo reference PICC along with an oscilloscope and a PC software to evaluate the signal obtained from the oscilloscope. In our case, we will use the Wave Checker software from CETECOM. We need to connect the output J9 of the EMVCo reference PICC to the oscilloscope and set the jumper J8 of the EMVCo reference PICC in the fixed load position. The oscilloscope needs to be connected to the PC or laptop, so the software is able to get the waveform and analyze the parameters needed. Type A tests The waveform group of tests for Type A consists of the following test cases: TA121: t1 TA122: Monotonic Decrease TA123: Ringing TA124: t2 TA125: t3 and t4 TA127: Monotonic Increase TA128: Overshoot Some of these test cases are directly related to the parameters defined for the specific modulation phase for Type A at 106 kbps. This modulation phase along with the respective parameters is depicted in the figure below. When the Wave Checker gets the oscilloscope capture, it automatically analyzes the signal, performing all the measurements and comparing them with the specifications limits. Debugging hints for Type A The PN5180 has a few registers and parameters to control the wave shape generated by the NFC chip and transmitted by the antenna. These are the most relevant ones: TX_CLK_MODE_RM (RF_CONTROL_TX_CLK register) Rise and Fall times (RF_CONTROL_TX register) TX_OVERSHOOT_CONFIG register From all the different test cases we will show how to debug the t3 and t4 test case as it is usually the most problematic. For this purpose, we will start from a certain configuration where the waveform tests show the following results, with a fail in the t3 and t4 test case. In order to tackle this problem, we will rely on the TAU_MOD_RISING parameter from the RF_CONTROL_TX register of the PN5180. In this case, as the timings are slightly above the maximum allowed in the specifications we will decrease the TAU_MOD_RISING 3 points and execute again the tests. The results after the modification show that all test are passing with a certain margin:   Another parameter that the PN5180 has and can be used for the waveform tests is the TX_CLK_MODE_RM parameter from the RF_CONTROL_TX_CLK register. Below you can see two graphs that clearly illustrate the effect of this parameter over the waveform.  As you can see from the two figures, by changing the default high impedance configuration of 001, to a low side pull configuration the waveform results in a smoother decay of the envelope. Type B tests For Type B waveform, the specifications define the following test cases:  TB121: Modulation Index TB122: Fall time TB123: Rise time TB124: Monotonic Increase TB125: Monotonic Decrease TB126: Overshoots TB127: Undershoots Again, these tests are based on the different parameters that can be identified for the modulation phase of the Type B commands: Debugging hints for Type B The register and parameters that the PN5180 includes to control the waveform for type B are: TX_RESIDUAL_CARRIER (RF_CONTROL_TX register) TX_CLK_MODE_RM (RF_CONTROL_TX_CLK register) TX_UNDERSHOOT_CONFIG register TX_OVERSHOOT_CONFIG register For Type B, we will study the modulation index test case, as it is the one that needs to be adjusted more often. In this case, we start from a situation where the device presents problems in the modulation index at 1 cm, with a value below the limit. In order to make corrections of the modulation index we will use the TX_RESIDUAL_CARRIER parameter from the RF_CONTROL_TX register. This parameter controls the amplitude of the residual carrier during the modulated phase. For the present problem, we will increase it by 4 points and rerun the test. As you can see in the picture below, the modulation index is within the specifications limits with margin.  Adaptative Waveform Control The PN5180 has another interesting feature called Adaptative Waveform Control that is used to set a different transmitter configuration depending on the gear and protocol used at any moment. This way we can easily debug by positions and use specific configurations for a certain group of positions without the need of rerunning all the tests for the rest of the positions. With the AWC feature we can control the: TAU_MOD_FALLING TAU_MOD_RISING TX_RESIDUAL CARRIER We can see in the table an example of an AWC configuration for Type B. Where we have changed the Residual Carrier from gear 2 onwards. As you can see, It is also configured with a change in the falling and rising times from Gear 1. As you can see this Adaptative Waveform Control feature along with the DPC represent a powerful tool to easily debug waveform tests without a change in the HW. Reception tests The reception tests purpose is to evaluate the ability of the device to identify and correctly demodulate the responses from the PICC when this response comes in the limits of the specifications for amplitude and polarity of the modulation.  Tests setup The tools and setup needed to debug the reception tests for EMVCo are depicted in the following figure: Oscilloscope to capture the signal received by the reference PICC. Arbitrary Waveform Generator to generate the response of the PICC. PC Software to control the AWG and load the EMVCo responses to the EMVCo reference PICC. For our case, we will use the Wave Player software from CETECOM. EMVCo reference PICC. This time, we will use the output J9 of the reference PICC to the oscilloscope to capture the command from the reader and trigger the injection of the response from the waveform generator to reference PICC, connected to J2. We should connect the waveform generator to the computer that has the Wave Player software installed to load the EMVCo responses. Performing tests As said previously, the reception tests aim at testing the ability of the device to correctly interpret the response when it is generated at the limit of the amplitude and polarity of the modulation. Considering the positive and negative polarity and the maximum and minimum amplitude of the modulation we have the following four test cases that are performed both for Type A and Type B: Tx131: Minimum positive modulation Tx133 - Maximum positive modulation Tx135 - Minimum negative modulation Tx137 - Maximum negative modulation To debug these tests with the PN5180 we will use: RX_GAIN (RF_CONTROL_RX register) RX_HPCF (RF_CONTROL_RX register) MIN_LEVEL (SIGPRO_RM_CONFIG register) MIN_LEVELP (SIGPRO_RM_CONFIG register) The procedure is basically to use the Waveplayer to set the amplitude and polarity of the response and check in the device is the response was correctly received and demodulated. Debugging hints To debug the reception we will test different configuration for the RX_GAIN and RX_HPCF parameters that control the reception filters, amplifier and ADC blocks from the receiver branch. These receiver blocks are pictured in the diagram below. Depending on the values used for the RX_GAIN and RX_HPCF parameters, the filter will be defined accordingly. The following table shows the filter characteristics in relation to those values: If we don’t find a correct value to pass the test at a certain position, we should modify the Rx resistor in order to increase or decrease the receiver sensibility. Adaptative Receiver Control In the same line as the Adaptative Waveform Control, the PN5180 includes the Adaptative Receiver Control that can be used to define different reception configurations depending on the gear and protocol used. With the ARC we can control all the registers involved in the reception and apply a correction to the preconfigured value depending on the gear used.  We can see an example of the Adaptative Receiver Control configuration in the following table, where we have defined a correction of -1 to the MIN_LEVEL and the HPCF parameters from gear 1. We can also see that the RX_GAIN parameter has a correction of +2 from gear 0. The ARC is very useful when we can't find a proper configuration for all positions and we need a different set of values depending on the positions tested. Rx Matrix tool Another interesting tool for debugging the reception tests is the Rx Matrix tool. This tool is used to launch and tests different receiver configuration in an automated way. The Rx Matrix tool is integrated into NXP's NFC Cockpit and you can control the Arbitrary Waveform Generator to set the amplitude of the modulation used for the tests. We can select which parameters we want to change and in which range we want them to be tested and the Rx Matrix will automatically run all the possible combinations in a sweep.   With the Rx Matrix tool, we can select the expected response and the number of iterations we want to try for every possible configuration. That way we can obtain a success ratio for the communication and easily identify the best configuration for the position tested. An example of the Rx Matrix is given in the figure below. We have fixed the RX_GAIN and RX_HPCF parameters and performed a sweep for the MinLevel, testing it from a value of 0 to 8. We have set the Rx Matrix to execute 50 iterations for every configuration, obtaining the success ratio results plotted below. As you can see the Rx Matrix along with a Waveform Generator is a powerful tool to find the optimum receiver configuration in a short time and in an effortless way. PN5180 Ecosystem The PN5180 comes with a complete and useful product support package including: The demokit, that can be used to get introduced to the product and check its features. The NFC Cockpit, that we have talked about during this article, and that represents a powerful tool to control the PN5180 with a very intuitive and useful interface. We srongly recommend that you integrate this tool in your final device as it may save you a lot of time during the debugging phase. A complete documentation including the updated product datasheet, or a set of application notes to guide you through all the designing process, from the antenna design guide to the DPC configuration or use of the Rx Matrix tool. Last but not least, the NFC Reader library which is the recommended software stack for NXP's NFC frontends and NFC controllers with customizable firmware. NFC Reader Library The NFC Reader Library comes with built-in MCU support, but it can also run on different MCU platforms, as well as non-NXP. The library has been built in such a way that you can adapt it and implement the required driver for your host platform. Other characteristics are: It is free of charge and you can download the latest release from NXP’s website. It is a complete API for developing NFC and MIFARE-based applications. Includes an HTML-based API documentation for all the components, which is generated from source-code annotations.  Finally, the release includes several examples and applications. Among the examples and applications included in the NFC Reader Library we can highlight two applications that are very useful for the preparation of the Device Test Environment required for the EMVCo certification:  The SimplifiedAPI_EMVCo for the digital testing The SimplifiedAPI_EMVCo_Analog for the Analog testing. You can control all the parameters involved in both applications using the phNxpNfcRdLib_Config.h configuration file. The identification and modification of these parameters should be very easy as the code is well documented, like you can see in the code chunk in the image: Further information You can find more information about NFC in: Our NFC everywhere portal: https://www.nxp.com/nfc You can ask your question in our technical community: https://community.nxp.com/community/identification-security/nfc You can look for design partners: https://nxp.surl.ms/NFC_AEC And you can check our recorded training: http://www.nxp.com/support/online-academy/nfc-webinars:NFC-WEBINARS Video recorded session
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Demo See how NXP integrates automotive and microcontroller technology to develop next-generation drones including high reliability, industrial quality, and additional security with drone-code compliant flight management unit running PX4. Video Features Electronic speed controllers with Field Oriented Control of BLDC (Brushless DC motors) TJA110 2-wire  Automotive Ethernet PHY Transceiver|NXP  SCM-i.MX6 Training https://register.gotowebinar.com/rt/9153317036356506113  Find our more at www.nxp.com/uav
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Description Drones, Rovers, and other Unmanned Vehicles (UVs) are being utilized across various industries including first responders, municipalities, and agriculture, as well as continued support and system development for the Department of Defense. As time progresses, more exciting practical uses are being uncovered. Whether the system is expected to deliver special payloads or protect people from malicious activities, UV systems require a high level of security, reliability, and performance. Block Diagram Products Category Name Product URL Microprocessor QorIQ® Layerscape Processors Based on Arm® Technology | NXP  Secure Authenticator A1006 | Secure Authenticator IC: Embedded Security Platform | NXP  A71CH | Plug and Trust for IoT | NXP  Motor Controllers (MCU) Arm® Cortex®-M7|Kinetis® KV5x Real-time Control MCUs | NXP  Arm® Cortex®-M4|Kinetis KV4x Real-time Control MCUs | NXP  i.MX RT1020 MCU/Applications Crossover Processor | Arm® Cortex-M7 | NXP  i.MX RT1050 MCU/Applications Crossover Processor| Arm® Cortex-M7, 512KB SRAM | NXP  i.MX RT1060 MCU/Applications Crossover Processor | Arm® Cortex®-M7, 1MB SRAM | NXP  Motor Controllers (DSC) MC56F84xxx|Digital Signal Controllers | NXP  Performance Level Digital Signal Controllers, USB FS OTG, CAN-FD | NXP  MC56F82xxx | NXP  Radar MCU S32R Radar Microcontroller - S32R27 | NXP  Camera Sensor MCU i.MX RT1050 MCU/Applications Crossover Processor| Arm® Cortex-M7, 512KB SRAM | NXP  BLE MCU Arm® Cortex®-M0+|Kinetis® KW41Z 2.4 GHz Bluetooth Low Energy Thread Zigbee Radio MCUs | NXP  Electronic Speed Controller MCU Arm® Cortex®-M4|Kinetis KV4x Real-time Control MCUs | NXP  Led Driver ASL150ySHN | Single-phase Auto LED Boost Driver | NXP  AVB Switch SJA1105TEL | Five-Ports AVB and TSN Automotive Ethernet Switch | NXP  Battery Monitor MC33772 | 6-Channel Li-ion Battery Cell Controller IC | NXP  Wireless Charger 15 Watt Wireless Charging Transmitter ICs | NXP  Accelerometer Digital Sensor - 3D Accelerometer | NXP  Related Demos from Communities URL Hands-On Workshop: HoverGames Drone - Commercial Open-Source Small Autonomous Vehicle for Robotic Drones and Rovers  An NXP DroneCode Platform for Developing Low-Cost Small Autonomous Vehicles and Leveraging High-Reliability Automotive Components  Related Communities URL HoverGames Drone Challenge 
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  Overview Modern aircraft contain dozens of data distribution and processing systems, which can collectively be referred to as Avionics. NXP’s embedded processors have long been the processors of choice in avionics systems due to their balance of performance per watt, IO integration, temperature range, reliability, and production longevity. Many of these solutions also apply to the rapidly evolving field of mobile robotics. Whether your system operates on the ground, under the sea or in the sky, NXP offers a complete portfolio of sensors, controllers and communications solutions. This solution is based on i.MX Applications Processors. This application processor provides multicore solutions for multimedia and display applications with high-performance and low-power capabilities that are scalable, safe, and secure. 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Product URL 3 i.MX6D: i.MX 6Dual Processors - Dual-Core, 3D Graphics, HD Video, Multimedia, Arm® Cortex®-A9 Core  Product Description 3 The i.MX 6 series of applications processors combines scalable platforms with broad levels of integration and power-efficient processing capabilities particularly suited to multimedia applications.   Category Sensors Product URL 1 PCT2075: I2C-Bus Fm+, 1 Degree C Accuracy, Digital Temperature Sensor And Thermal Watchdog  Product Description 1 The PCT2075 is a temperature-to-digital converter featuring ±1 °C accuracy over ‑25 °C to +100 °C range. Product URL 2 MMA8453Q: ±2g/±4g/±8g, Low g, 10-bit Digital Accelerometer  Product Description 2 The MMA8453Q is a smart low-power, three-axis capacitive micromachined accelerometer with 10 bits of resolution.   Category Power Management Product URL 1 PF4210: 14-channel power management IC optimized for i.MX 8M  Product Description 1 The PF4210 is a high-performance PMIC that is optimized to power low-cost consumer applications with the i.MX 8M family of applications processors. Product URL 2 MMPF0100: 14-Channel Configurable Power Management IC  Product Description 2 The MMPF0100 is suited to all i.MX 6 processors: i.MX 6SoloX, i.MX 6SoloLite, i.MX 6Solo, i.MX 6DualLite, i.MX 6Dual, i.MX 6Quad, i.MX 6DualPlus and i.MX 6QuadPlus. 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This demo shows the interaction among MCUs, motor drivers, and sensors using simple mbed code and various communication protocols, namely Ethernet, I2C, and PWM to simulate real-world applications on a smaller scale       Features Motor driver with Brushed DC motor driver with current feedback and thermal regulation 6-Axis sensor FXOS8700 (Accelerometer + Magnetometer) and 3-Axis Gyroscope FXAS21002 Kinetis K64 MCU 120 MHz ARM® Cortex®-M4 core with Ethernet and USB Complete system consisting of an MCU, a sensor, and a motor driver _______________________________________________________________________________________________________   Featured NXP Products Product Link Sensor Toolbox Development Boards for a 9-Axis Solution using FXAS21002C and FXOS8700CQ https://www.nxp.com/design/development-boards/freedom-development-boards/sensors/sensor-toolbox-development-boards-for-a-9-axis-solution-using-fxas21002c-and-fxos8700cq:FRDM-STBC-AGM01?&lang_cd=en Freedom Expansion board for MC34931- Brushed DC Motor Driver, H-Bridge, 20kHz https://www.nxp.com/design/development-boards/analog-toolbox/freedom-expansion-board-for-mc34931-brushed-dc-motor-driver-h-bridge-20khz:FRDM-34931S-EVB?&lang_cd=en Freedom Development Platform for Kinetis® K64, K63, and K24 MCUs https://www.nxp.com/design/development-boards/freedom-development-boards/mcu-boards/freedom-development-platform-for-kinetis-k64-k63-and-k24-mcus:FRDM-K64F?&lang_cd=en _______________________________________________________________________________________________________   Software Links Accelerometer code Motor driver code   For more detailed information about this demo, please download attached PDF
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Demo Owner: Thomas Zemites   Demonstration of cost effective Solar Panel Tracker Control using MC34932 dual H-Bridge motor driver. These thermally efficient 28V / 5A H-Bridge DC Brushed motor drivers feature real-time load current monitoring and automatic thermal back-off to ensure high availability operation in demanding high-current, high-temperature automotive and industrial applications.  The demonstration uses the FRDM-KL25Z board in conjunction with Solar Tracker Demo board and graphical user interface.       Features Thermal protection Package, PWM Mode, Thermal Fold-back, Current Mirror, Complete Internal protection Featured NXP Products Product Link MC34932/S H-Bridge, Brushed DC Motor Driver, 5-36V, 5A, 11kHz/20kHz MC34932 | H-Bridge, Brushed DC Motor Driver | NXP  KL2x-72/96MHz, USB Ultra-Low-Power Microcontrollers (MCUs) based on Arm® Cortex®-M0+ Core Arm® Cortex®-M0+|Ultra-Low Power Kinetis® KL2x USB MCU | NXP  Freedom Development Platform for Kinetis® KL14, KL15, KL24, KL25 MCUs https://www.nxp.com/design/development-boards/freedom-development-boards/mcu-boards/freedom-development-platform-for-kin… 
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  Overview Industrial control is a key element in any factory automation process. It may vary from a simple panel-mounted controller to large interconnected and interactive distributed control systems. PLCs are integral to industrial control; their primary function is to control individual machines or stations in real time making low deterministic latency a key factor. The functionality of the PLC include sequential relay control, motion control, process control, distributed control systems, and networking. Multiple interfaces and purpose PLC control card for the system interfaces between host system and daughter modules. Features They can be designed for many arrangements of digital and analog I/O, extended temperature ranges, immunity to electrical noise, and resistance to vibration and impact. Capable for memory extension for various system requirement Use Cases A programmable logic controller (PLC) is an industrial digital computer which has been ruggedized and adapted for the control of manufacturing processes, such as assembly lines, or robotic devices, or any activity that requires high reliability, ease of programming and process fault diagnosis. Block Diagram Products Category MCU Product URL 1 i.MX RT1060 Crossover MCU with Arm® Cortex®-M7 core  Product Description 1 The i.MX RT1060 is the latest addition to the industry's first crossover MCU series and expands the i.MX RT series to three scalable families. Product URL 2 S32K144EVB: S32K144 Evaluation Board  Product Description 2 The S32K144EVB is a low-cost evaluation and development board for general purpose automotive applications.   Category Transceiver Product URL TJA1042: High-speed CAN transceiver with standby mode  Product Description The TJA1042 high-speed CAN transceiver provides an interface between a Controller Area Network (CAN) protocol controller and the physical two-wire CAN bus.
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       YAFFS是第一个在GPL协议下发布的、基于日志的、专门为NAND Flash存储器设计的、适用于大容量的存储设备的嵌入式文件系统。一般MCU系统使用YAFFS系统要求的性能及资源比较多,高性能的i.MXRT系列正好能够满足此要求。     本文基于野火i.MXRT 1052核心板及其上的NandFlash探讨Nand文件系统的原理及实现方式,并探讨了在此基础上如何建立Yaffs文件系统。 Products Product Category NXP Part Number URL MCU MIMXRT1050 https://www.nxp.com/products/processors-and-microcontrollers/arm-microcontrollers/i-mx-rt-crossover-mcus/i-mx-rt1050-crossover-mcu-with-arm-cortex-m7-core:i.MX-RT1050   Tools NXP Development Board URL 野火i.MXRT核心板/开发板 https://ebf-products.readthedocs.io/zh_CN/latest/i.mx-rt/ebf_i.mx-rt1052.html   SDK SDK Version URL Yaffs file system https://yaffs.net/ MCUXpresso SDK mcuxpresso.nxp.com  
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Demonstrating the Low voltage level driver motor product line.       Features Features FRDM-KL25Z MCU and FRDM-17510-EVB motor driver Battery-ready KL25Z ARM® Cortex™-M0+ processor MPC17510 motor driver 2.0 V to 15 V / 3.8 A peak operation   Featured NXP Products KL2x |Kinetis KL2x USB MCUs|NXP Engine and DC Motor Control|NXP     Tools   Product Link Freedom Development Platform for Kinetis® KL14, KL15, KL24, KL25 MCUs FRDM-KL25Z|Freedom Development Platform|Kinetis® MCU | NXP  MPC17510: H-Bridge, Brushed DC Motor Driver, 2-15V, 3.8A, 200kHz H-Bridge DC Motor Driver 2-15V 3.8A 200kHz | NXP  Freedom Expansion Board - MPC17510, H-Bridge, Brushed DC Motor Driver, 2.0V-15.0V, 1.2A https://www.element14.com/community/docs/DOC-75609/l/freedom-expansion-board--mpc17510-h-bridge-brushed-dc-motor-driver-…  NXP Stepper Motor/Dual DC Motor Shield NXP Stepper Motor/Dual DC Motor Shield | Mbed  KL25Z-MPC17510_candy_dispenser KL25Z-MPC17510_candy_dispenser - This is code used for the stand-alone FSL candy... | Mbed  FRDM-KL25Z FRDM-KL25Z | Mbed  Training Hands-On: Drive a Stepper Motor Using NXP's Motor Drivers and Kinetis Development Tools https://community.freescale.com/servlet/JiveServlet/previewBody/106138-102-1-27793/ftf-ind-f1303.pdf   Related Stepper Motor/Dual DC Motor Shield  | mbed
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Demo Kinetis V series enables our customer to get to market quickly using a selection of software and hardware that are targeted at their specific application needs. This electric powered vehicle was developed in a matter of weeks to showcase the model based design tools from Mathworks (MATLAB) and the Motor Control Toolbox from NXP that enables model to code based design rapidly reducing time to market Features: The vehicle has been build using Kinetis V MCUs and FRDM solution hardware to power the vehicle. The software was developed using MATLAB and Motor Control Development Toolbox. The Motor Control Development Toolbox is a MATLAB plugin to enable complete motor control application simulation within the MATLAB environment, enabling Software and Processor-in-the-Loop (SIL and PIL) simulation. Kinetis V enables customers with little motor control experience or a short time to market with Kinetis Motor Suite. For customer with more application knowledge Kinetis V enables you with our reference design software incorporating NXPs Embedded Software Libraries, or for customers looking for a lower cost, rapid development solution we provide Kinetis Motor Suite ___________________________________________________________________________________________________________ Featured NXP Products: Product Link Kinetis® V Series https://www.nxp.com/products/processors-and-microcontrollers/arm-microcontrollers/general-purpose-mcus/kv-series-cortex-m4-m0-plus-m7:KINETIS_V_SERIES?&cof=0&am=0 Freedom Development Platform for Kinetis® KV1x Family 128 KB, 64 KB, 32 KB and 16 KB Flash MCUs FRDM-KV11Z|Freedom Development Platform|Kinetis MCU | NXP  NXP® Freedom Development Platform for Low-Voltage, 3-Phase PMSM Motor Control FRDM-MC-LVPMSM|Freedom Development Platform | NXP  Low-Voltage, 3-Phase Motor Kit for FRDM platform FRDM-MC-LVMTR|Freedom Development Platform | NXP  High-Voltage Development Platform https://www.nxp.com/products/processors-and-microcontrollers/arm-microcontrollers/general-purpose-mcus/kv-series-cortex-m4-m0-plus-m7/high-voltage-development-platform:HVP-MC3PH?&fsrch=1&sr=1&pageNum=1 Low-Voltage, 3-Phase Motor Control Tower® System Module https://www.nxp.com/design/development-boards/tower-development-boards/peripheral-modules/low-voltage-3-phase-motor-control-tower-system-module:TWR-MC-LV3PH?&lang_cd=en ___________________________________________________________________________________________________________ C61
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This in home energy display  and Solar Panel demo illustrates a very low-cost  solution for real-time energy monitoring . A DSC-based dedicated control PV inverter from Future supports the MPPT algorithm for optimal power delivery from the solar panel.   Features This Solar Panel demo illustrates a very low-cost connectivity solution for real-time energy monitoring A DSC-based dedicated control PV inverter from Future supports the MPPT algorithm for optimal power delivery from the solar panel    
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Demo Owner: b14714 The motor control development toolbox is a comprehensive set of tools that plug into the MATLAB™/Simulink™ model-based design environment for rapid application development on MCUs.  The SFIO Toolbox is a new addition that can control Simulink system models by SFIO algorithms running directly on NXP DSC and Kinetis MCU hardware. NXP FreeMASTER debug monitor and data visualization tool interfaces provide an interface to monitor signals in real time for data logging and signal calibration. Features The motor control development toolbox is a comprehensive set of tools that plug into the MATLAB™/Simulink™ model-based design Auto code generation straight to the Micro. NXP developed a library and embedded target to interface with MATLAB and SimuLink Customers can directly go from the model based environment to the MCU without having to write C code by hand Featured NXP Products Motor Control
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  Overview Data logger senses parameters such as temperature and processes this data and sends it using UHF/Bluetooth LE. NFC + UHF/Bluetooth LE temperature logging Configuration and logged data read back via NFC Long distance real time data (temperature, total sampling points, out-of-limit points) read back via UHF Our NTAG SmartSensor portfolio offers single-chip solutions that combine NFC connectivity with autonomous sensing, data processing, and logging. These devices can be easily combined with other companion chips, such as radios or sensor solutions. NTAG SmartSensor devices are ideal for Internet of Things (IoT) products. Block Diagram Products Category Smart Sensor Product URL 1 NHS3100: NTAG® SmartSensor with Temperature Sensor and Digital IOs  Product Description 1 The NXP® NHS3100 is an IC optimized for temperature monitoring and logging. With its embedded NFC interface, internal temperature sensor and direct battery connection, it supports an effective system solution with a minimal number of external components. Product URL 2 NHS3100UCODEADK: NHS3100 - UCODE-I2C  Product Description 2 This solution is composed of two NXP ICs, the NHS3100 NTAG SmartSensor and the SL354011FHK; connected via I2C. The NHS3100 is the master of the solution, running the temperature monitor and forwarding the state of the controlled goods to the Rain RfiD (UHF) interface.   Category BLE Product URL 1 QN908x: Ultra-Low-Power Bluetooth Low Energy System on Chip Solution  Product Description QN908x is an ultra-low-power, high-performance and highly integrated Bluetooth Low Energy solution for Bluetooth® Smart applications such as sports and fitness, human interface devices, and app-enabled smart accessories.  
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Description The user interface of a product is a key element that design engineers need to address to provide a compelling user experience. Touchpads, slides and rotaries offer a more intuitive and effective way of user interaction than traditional buttons. And, designing a touch-based user interface is simplified with this NXP touch solution. The touch function is more and more popular in the consumer market, especially in the white-good field. The KE15Z series of MCUs offers the Touch Sensing Interface (TSI) which recognizes finger touch by sensing capacitance changes. Features Advanced EMC robustness, pass IEC61000-4-6 standard test Supports both self-cap sensor and mutual-cap sensor, up to 36 touch keys Low BOM cost per touch key, no need for external devices Adjustable touch sensing resolution and sensitivity, high-performance for waterproof applications Low-power support Block Diagram Products Category Name 1: MCU Product URL 1 Arm Cortex-M0+|Kinetis KE1xZ 32-bit 5V MCUs with Touch Interface | NXP  Product Description 1 The KE1xZ includes a robust TSI module which provides a high level of stability and accuracy to any HMI system. These MCUs support up to 256 KB flash, 32 KB RAM, and a complete set of analog/digital features. Category Name 2: Wireless Product URL 1 Arm® Cortex®-M0+|Kinetis® KW41Z 2.4 GHz Bluetooth Low Energy Thread Zigbee Radio MCUs | NXP  Product Description 1 The KW41Z is an ideal solution for true single-chip designs that require concurrent communication on both a Bluetooth Low Energy network and an 802.15.4-based network such as Thread and Zigbee. Documentation KE15Z TSI Development for Low Power Applications:  https://www.nxp.com/docs/en/application-note/AN5420.pdf  Demos Touch Sense Interface for Kinetis KE15Z MCUs  Tools Product Link FRDM-KW41Z: Freedom Development Kit for Kinetis® KW41Z/31Z/21Z MCUs FRDM-KW41Z |Bluetooth Thread Zigbee enabled Freedom Development Kit | NXP  FRDM-TOUCH: Touch Module for Freedom Board FRDM-TOUCH|Touch Module for Freedom Board | NXP 
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本文探讨了如何解决i.MX8MP EMC测试遇到的问题,主要针对辐射超标问题。除了硬件方案,着重探讨了LVDS展频等软件方案。
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  Overview The conventional timing relays offers a simple solution where the control of the systems needs to be simple or the communication isn’t possible. These have some inconvenient since they aren’t precise and are vulnerable to be modified. This application can control one or many relays. Using NFC communications, the time outputs are configured precisely and also can be programmed some functions that conventional timing relays can’t replicate. Also, the device can be password protected to block intruders or any external disturbance. Block Diagram Products Category MCU Product URL LPC8N04: Low-Cost Microcontrollers (MCUs) based on Arm® Cortex®-M0+ Core  Product Description LPC8N04 is a cost-effective MCU which serves as an entry-level connectivity solution for embedded applications with integrated NFC connectivity.   Category Power Management Product URL TEA1721BDB1065: TEA1721 Universal Mains White Goods Flyback SMPS Demo Board  Product Description This reference design demonstrates the TEA1721 as a -12 V and -3.3 V AC/DC SMPS converter that can provide 5 W into a load.   Category RTC Product URL PCF8563: Real-time clock/calendar  Product Description The PCF8563 is a CMOS Real-Time Clock (RTC) and calendar optimized for low power consumption.
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1. 引言 众所周知,我们一般使用调试器下载程序或调试设备。 FRDMK64在板上具有OpenSDA调试接口,因此不需要额外的调试器。但是如果我们要设计一个没有调试器但可以下载程序的电路板,则可以使用引导加载程序(Bootloader)。引导加载程序是一个小程序,目的是通过UART,I2C,SPI等接口更新MCU的应用程序。 本文将描述一个基于FRDMK64F的简单SD卡引导程序,使用SD卡更新MCU的应用程序。用户可以将二进制文件放入卡中。卡插入目标板后,板子将自动更新应用程序。本设计提供了对应的引导加载程序和应用程序代码,以便您可以在自己的板上进行测试。 2. Bootloader的实现 SD卡的示意图如下所示。该板使用SDHC模块与SD卡通信。 图1. SD卡示意图 我们使用FRDM-K64F的2.6.0版本的SDK。您可以在我们的网站上下载该SDK。 链接是“mcuxpresso.nxp.com”。 引导加载程序使用SDHC和fafts文件系统,因此我们应该添加文件来支持它。 图2.支持文件 在主代码中,程序将等待直到插入卡。然后它将在SD卡中找到名为“ a000.bin”的文件以更新应用程序。如果文件不存在,则开发板将直接执行该应用程序。如果没有应用程序,程序将结束。 以下代码显示了程序如何等待插入sd卡,此外它还将检查该地址是否包含应用程序的地址。 图3.代码-等待插入卡 以下代码显示了程序如何打开二进制文件,如果sd卡没有该文件,则程序将跳转到该应用程序开始执行。 图4.打开二进制文件 如果程序正常打开文件,则更新将开始,它将从0xa000擦除200k的空间,您可以根据自己的实际代码工程大小进行调整。 现在我将详细说明更新的方法。我们的数据被写入称为“ rBUff”的缓冲区,缓冲区大小为4K,在向其中写入数据之前,需要先将其擦除。 请注意,在擦除和编程闪存之前应该先禁用所有中断,当操作完成后再重新使能中断。 文件大小将决定将数据写入闪存的方式。 1.如果大小小于4k,我们只需读取文件数据进行缓冲,然后判断文件大小是否与8个字节对齐。如果不是,我们增加“readSize”的大小以读取称为“rBuffer”的数据缓冲区中的更多数据,这些多读出来的数据内容为0。 2.如果大小> 4K,我们使用“ remainSize”来记录剩余的数据量。每次读取4k直到其大小小于4k,然后重复步骤1。一次完成操作后,我们应清除缓冲区并增加扇区编号以准备下一次发送。   图5:写Flash操作代码 清除空间的方法如图所示。它将初始化闪存并从给定地址擦除给定大小。 “ SectorNum”用于显示要擦除的扇区。 图6.擦除操作代码 下图显示了如何将数据写入闪存。 图7.程序操作代码 在转到应用程序之前,我们应该修改在引导加载程序中所做的配置。 关闭Systick时钟并清掉其计数; 将VTOR中断向量寄存器恢复为之前的默认值; 我们的引导程序以PEE模式运行。因此,我们应该将其更改为FEI模式; 禁用所有引脚。 运行这些代码时,应禁用全局中断,并且不要忘记重新使能全局中断。 图8. 反初始化代码 然后我们可以转到应用程序。 图9.转到应用程序 3. 内存重定位 FRDMK64具有1M闪存,从0x00000000到0x00100000。如图10所示,我们使用0xa000作为应用程序的起始地址。 图10:内存映射 现在,我将向您展示如何在不同的IDE中为用户应用程序修改链接文件。 在IAR中: 图11:IAR的ICF 在MDK中: 图12.MDK的SCF 在MCUXpresso中: 图13. MCUXpresso的闪存配置 4. 运行演示 1)首先下载引导程序; 2)准备一个用户应用程序。 我们以“led blinky”为例; 3)修改链接文件; 4)用您的IDE生成二进制文件,请将其命名为“a000.bin”; 5)将其放入SD卡中,如图5所示。 图14:SD卡的内容 6)插入卡,并打开电源。请稍等片刻,该应用程序将自动执行。 5. 参考资料 1) Kinetis MCU的bootloader解决方案 2) KEA128_can_bootloader
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Showcase the NFC support capability to provide an additional layer of security to any access area.
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Description NXP's leadership position in the security, contact and contactless identification space makes us the experts in access control solutions that are safe, secure, robust and reliable. NXP has devices for driving user interfaces as well as lock mechanisms. NXP also has different solutions for addressing designs using both contact and contactless identification systems. Putting these NXP devices together makes for compelling access control solutions. Use your phone or smart card for Access control to open doors or give access to machine configurations.  Use cases Corporate/campus access control system Lock manufacturers (mechanical and electronic) Industrial equipment with safety conditions or control restriction Components for multi-user appliances like printers Professional tools Smart lock manufacturer for smart home applications Block Diagram Products Category Name MCU Product URL Arm® Cortex®-M4|Kinetis® K64 120 MHz 32-bit MCUs | NXP  Product Description The Kinetis® K series MCU portfolio offers the broadest selection of pin, peripheral- and software-compatible MCU families based on the Arm® Cortex®-M4 core. Category Name Secure Product URL A71CH | Plug and Trust for IoT | NXP  Product Description  A71CH is a ready-to-use secure element for IoT devices providing a root of trust at the IC level and delivers, chip-to-cloud security right out of the box. Category Name NFC Product URL PN5180 | Full NFC Forum-compliant frontend IC | NXP  Product Description  The PN5180 is a high-performance full NFC Forum-compliant frontend IC for various contactless communication methods and protocols. Tools Product Link Freedom Development Platform for Kinetis® K64, K63, and K24 MCUs FRDM-K64F Platform|Freedom Development Board|Kinetis MCUs | NXP  A71CH Arduino® compatible development kit OM3710/A71CHARD | A71CH Arduino® compatible development kit | NXP  PN5180 NFC Frontend Development Kit for POS Terminal Applications OM25180 |PN5180 NFC Development Kit for POS Readers | NXP 
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Background:  ➢ IP protection is important for most customers, Kinetis, LPC54 series and i.MX RT have necessary security features that help us to win customers and markets. ➢ LPC55 series is a new generation of IoT MCU which is used for consumer and industrial market. LPC55 non-S parts are adopted by most customers due to its low-cost and easy-to-use features, but its secure features are different with S parts and is significantly simplified. ➢ LPC55 is designed for secured IoT application, so it’s supposed to hide the SWD/ISP ports after development work is finished. If the SWD/ISP ports are secured, they couldn’t be used any more. While for LPC54 & Kinetis MCU, mass erase command can be used to recover the MCU after the MCU is secured. ➢ However, Customers need the feature to secure the debugging/ISP ports, but they also need to recover them in some cases: - Reprogramming to update firmware - Investigate and analyze failed parts returned from end market - Rescue the MCU if it’s locked and stuck ➢ According to customers’ requirements, NXP support team raised the proposal to implement a solution which can be used to secure and recover the SWD/ISP ports with an IAP backdoor method. Solution: By Operating PFR region, LPC55 could switch between secure and recovery mode.   lpc5506_debug_isp_test_20220714: demonstrate how to operate this region to lock Debug Port then how to recovery it. The user interaction could be raised by UART or button;         2.hmac_test_20220714: demonstrate one full security flow,      ➢ This is a complete solution to secure & recovery debugging/ISP ports on LPC55, and it uses host machine challenge mechanism to implement security features: ▪ Challenge Host machine against unknown host probe; ▪ Generates dynamic seeds, so that the final encrypt information will be dynamically changed; ▪ The image hash value is device related, that avoids same encrypt info for different image/product; ➢ Customer also could clip the solution to simplify application complexity: ▪ Use UUID for device information only, no seed is needed; ▪ Host machine can use fixed keys instead of image hash values to do info encryption; ▪ Host machine can use UUID lookup table to find out verification key; Every device is programmed with dedicated verification key during production.  Demonstration: The attached demos could run at LPC55S06 EVK, and could easily migrate to other LPC55 series.
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