******************************************************************************************** * Test HW: S32K311 EVB-Q100 * MCU: S32K311 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE Micro * Target: internal_FLASH ******************************************************************************************** The purpose of this demo application is to enter the standby mode and waking up from sleep using the user button. =============== How this DEMO works ========== 1) once the image is flashed, the application starts running and BLUE LED blinks for every one second during RUN mode 2) Once SW5 in EVB is pressed, MCU enters the SLEEP mode and it turns off BLUE LED & PIT 3) To Wakeup: Press SW4 in EVB 4) Once it returns to normal mode, BLUE LED and PIT starts running. Used pins: ========= PTC11 -> SW5 -> EnterStandby PTA8 -> SW4 -> WakeupFromSleep PTB8 -> D12   -> Blue led  

* ================================================================================================== Detailed Description: * This example shows how to implement the UART RX/TX using interrupt/callback under FreeRTOS. * LPUART6 is set for 115200, 8N1 using interrupt processing. Callback is called for single byte received. * Reception is advanced until buffer is full or "\n" is received. * 2 tasks (receive/send) and 1 Queue are created. * ReceiveTask starts new UART reception, waits for completion and puts received message into Queue. * SendTask gets the message from Queue, echoes it back and toggle pin (LED_PIN <-> PTA29). * ================================================================================================== * Test HW: S32K3x4EVB-T172 Rev B * MCU: S32K344_172HDQFP * Compiler: S32DS 3.6.2 * RTD release: S32K3_S32M27x Real-Time Drivers ASR R21-11 Version 6.0.0 * Debugger: On-Board Debugger (J41) * Target: Internal_FLASH * Serial: 115200, 8N1 * ==================================================================================================   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.

******************************************************************************* The purpose of this demo application is to present a usage of the EMIOS IP Driver in Polling mode for the S32K3xx MCU. The example use to :-- EMIOS-1 - ch-0  --> PTC24 --> Generate the PWM EMIOS-1 - ch-1  --> PTC25 --> is the ICU channel to measure the duty Pins used :--     This example is tested for IPWM mode .  :--       IPWM mode ,  ICU Driver User Manual :--   Result :-- Sometimes Compiling error comes, in Autogenerated RTD file.    Change the Header file name :--      ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************

This simple example demonstrates how to configure and handle UART interrupts using the LPUART module on the S32K312-EVB. It sets up a UART callback function and initiates reception in single-byte mode. After each byte is received, the buffer is updated using  Lpuart_Uart_Ip_SetRxBuffer() , unless a newline character ( '\n' ) is detected, in which case a reception flag is set to signal the main loop. When the  LPUART_UART_IP_EVENT_END_TRANSFER  event occurs, reception is re-enabled using  Lpuart_Uart_Ip_AsyncReceive() . Only basic event handling is implemented; other UART events are acknowledged but not processed. The example uses LPUART instance 6, enabling serial communication via the USB port (J40) on the S32K312-EVB. If using TeraTerm, ensure the transmit setting is configured to LF (Line Feed) to properly send newline characters when pressing Enter.  ------------------------------------------------------------------------------ * Test HW: S32K312EVB-Q172 * MCU: S32K312 * IDE: S32DS3.6.2 * RTD release: 6.0.0 * Debugger: PE Micro * Target: internal_FLASH  ------------------------------------------------------------------------------ Test result:

This post presents two complementary FlexCAN communication examples for the S32K3X4EVB-T172 evaluation board, showcasing both low-level IP layer and AUTOSAR MCAL layer implementations. These examples are basic routines for configuring the component in normal/user mode, as the RTD examples are configured for loopback mode. To test CAN communication, another board or a CAN analyzer must be used. ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K344 * Compiler: S32DS 3.6.2 * SDK release: RTD 6.0.0 * Debugger: PE Micro * Target: internal_FLASH ------------------------------------------------------------------------------  Example 1: FlexCAN IP Layer This project demonstrates a basic FlexCAN setup using the IP-level driver. It configures a standard CAN message; with transmission through polling and reception using interrupts. The TJA1153 transceiver is initialized through a custom configuration sequence. An ACK message is sent upon each reception. The GREEN LED toggles every 10 received messages. Message buffer is configured to accept STD ID 0x123 with  FlexCAN_Ip_SetRxIndividualMask()  &  FlexCAN_Ip_ConfigRxMb() .  Example 2: FlexCAN MCAL Layer This project uses the AUTOSAR MCAL stack, leveraging  Can_43_FLEXCAN  and  CanIf  modules for CAN communication. Transmission is done via polling, while reception is configured via interrupts. STD ID is set to 0x123, and acceptance mask is set to 0x0 (accept all IDs). The same TJA1153 transceiver is used. CAN messages are sent and received using  CanIf  callbacks. The GREEN LED toggles every 10 received messages. TJA1153 is used in both examples with macros TJA1153 & TJA1153_EVB_TRCV respectively. If not defined, standard transceiver initialization is done (CAN0_STB & CAN0_EN pins set to HIGH).  These examples are provided as is with no guarantees and no support. These are basic routines meant to be used as reference only.

This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 3 AFE MC33774 board connected in TPL 3> Change following macro in mc33774_cfg.h file  to change the numbers of AFE connected in TPL.     RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33774 AFE connected in TPL mode. FRDM665SPIEVB stackable board used for MC33665.     =============== MCU Pins used =========== FRDM665SPIEVB Jumper setting  :---     K1, K2 & K4 connector of S32J344 EVB :--       K1 on MC33665 & S32K334 evb :--  K2 on MC33665 & S32K334 evb :--  K4 on MC33665 & S32K334 evb :--    ================= EVB Link ================== https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/FRDM665SPIEVB https://www.nxp.com/design/design-center/development-boards-and-designs/mc33774ata-evaluation-board-with-isolated-daisy-chain-communication:RD33774ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172   ================== Measurement types used in example ===== Periodic measurement is done by 33774 , this is cyclic Other Two : application , sync  need send command to start Application measurement , need send app_capture command twice , and then read the result. Synchronous measurement take out the Primary adc result（VC）and secondary result（VB) .But the VC and VB result comes from different adc. Period measurement start when you send  API "MSR_StartMeasurement" and then 774 will do period measurement automatically periodically :--   Why we need to measure Vc & Vb both :-- ASIL-D ，yes we can measurement VC channel by primary ADC and measurement VB by secondary ADC from hardware VC and VB are come from same point of battery cell. Now 2 ADC compare with each other, that lead to high safety (ASIL D）. Primary & Secondary Device temperature reading :-- This API is used for it MC33774_CDD_BCC_SWC_Running_Slot4(). ============= Cell Balancing =========== Cell Balancing method used :-- MC33774 balance will switch between odd channel (1,3,5,7,... 17) and even channel (2,4,6,8,..18) by 500ms period , (250ms for odd and then switch to even 250ms and then odd 250ms...)it is because of IC design and cannot change by software.   MC33774 have lots of balance method  this example uses "timer method ". How to check Balancing is enabled :-- Following function MC33774_CDD_BCC_SWC_Running_Slot5() read the : Balance status & fault registers BAL_SWITCH_STAT0, BAL_SWITCH_STAT1 represent the balancing MOSFET current status.   Measure the voltage drop across the balancing register is the best approach. You will see the voltage drop appears every 250ms if PWM is 100%.  Please check the schematic of the 33774 EVB, find the balancing resistor on which channel balancing is enabled.     ======= How much time to wait to extract the measurements results ======= 240 us is the time of one SCAN Time between each Application measurement sequence. Min App measure time for 16 sample :-- 4.08ms = (16+1) *240 Min 1 SYNC measurement time, for 16 samples = 18 cycle ≈ 18 * (16*240us) ≈ 69 ms ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Disable Communication timeout in code :--   ================= Results for FIRST AFE ===========================            

******************************************************************************** * Detailed Description: * The S32K144 MCU is configured as a LIN Slave node. * When a MasterReq frame (0x3C) is received with Go-to-sleep command, the stack goes to sleep. * The application can read: * l_flg_tst_LI0_MasterReq_flag() * l_ifc_read_status(LI0) * When a falling edge is detected on the LPUART RX pin, * LinWakeUpTimerNotification() is called. * The notification has to be enabled in MEX. * Gpt (LPIT) timer is used to calculated the length of the wake-up signal. * * ------------------------------------------------------------------------------ * Test HW: S32K144EVB-Q100 * MCU: S32K144 * Debugger: S32DS_ARM_3.6, S32K1_RTD_3_0_0_D2503 * Target: internal_FLASH ********************************************************************************   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.

MCU : S32K144 AFE : MC33771 RTD : 1.0.1 As we know BCC sample software for MC33771C which is delivered is based on SDK for S32K144 , and uses S32DS-2.2 :-- BCC_S32K144_FreeMASTER I am having a setup , for this combination, using SPI :-- FRDM33771CSPEVB evaluation board  + S32K144 + 14 cell Battery EMULATOR :    S32K144 pins used :-- MOSI :  LPSPI0  : PTB-4 MISO :  LPSPI0  : PTB-3 SCK :    LPSPI0  : PTB-2 CSB :    LPSPI0  : PTB-5 RESET line of MC33771C : PTD-4 FRDM33771CSPEVB pins used :-- https://www.nxp.com/docs/en/user-guide/UM11402.pdf SI of MC33771C : Connects to MOSI of S32K144 : K2-7 SO of MC33771C : Connects to MISO of S32K144 : K2-9 SCK of MC33771C : Connects to PTD-4 of S32K144 : K2-11 CSB :    K2 -5 RESET line of MC33771C : K4 -1 Freemaster uses UART-1 on S32K144 EVB ():-- TX : PTC7 RX : PTC6 I have ported the BCC_S32K144_FreeMASTER  sample code to S32K144 using RTD-1.0.1 & is working fine. This attached code work fine for SPI.  Two sample project i have attached, both are tested and working fine :--- 1> Chip select is controlled by LPSPI. 2> Chip select is controlled manually in user software. Fremaster project is also inside the folder, name of freemaster project is :-- 1> FreeMASTER_project.pmp TPL related part i have not ported & tested because at present i am not having MC33664ATL on S32K144 EVB board & do not have FRDM33771BTPLEVB (MC33771C board with TPL on it). Regards, Dinesh

******************************************************************************** The purpose of this demo application is to show you how to use the Temperature Sensor module in S32DS. It includes two methods to obtain temperature. -The first one starts a normal software conversion with one-shot mode on temp sense channel and calculates the temperature on chip from the data conversion. -The second one calculates the temperature based on given data (if read directly using ADC). Note: Please adjust the ADC reference voltage according to the board you are using * ------------------------------------------------------------------------------ * Test HW: S32K344EVB-T172 * MCU: S32K344 1P55A * Compiler: S32DS.ARM.3.5/6 * SDK release: S32K3_RTD_6.0.0/5.0.0/4.0.0_P24 * Debugger: OpenSDA/PE&Micro * Target: internal_FLASH *Jumper:J18-1:2,5V used. ********************************************************************************* Note that if you use "sprintf", you need to check the following option.  

This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 2 AFE MC33775 board connected in TPL 3> Change following macro in mc33775_cfg.h file  to change the numbers of AFE connected in TPL.     RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33775 AFE connected in TPL mode.   =============== MCU Pins used ===========   FRDM665SPIEVB Jumper setting  :---                   K1, K2 & K4 connector of S32J344 EVB :--             K1 on MC33665 & S32K334 evb :--      K2 on MC33665 & S32K334 evb :--    K4 on MC33665 & S32K334 evb :--        ================= EVB Link ==================   https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/FRDM665SPIEVB https://www.nxp.com/design/design-center/development-boards-and-designs/RD33775ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172 ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255)   Disable Communication timeout in code :--     ================= Results for TWO AFE ===========================          

*******************************************************************************  The purpose of this demo application is to present a usage of the  LPSPI IP Driver for the S32K3xx MCU.  The example uses LPSPI2 for transmit & receive Twelve bytes using the DMA. MOSI MISO connected on Hardware in loopback.  ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** DATA and Instruction CACHE is enabled by default --> in startup code :--     ========= This selection enable the use of CACHE driver API =========     ============= Use this MACRO ==================== #define USE_NON_CHACHABLE_REGION 1 This MACRO comment & uncomment will allocate the buffer in cachable & non cacable region of memory. You can allocate the SPI buffer in in cachable & non cacable region of memory. Enabling & disabling of this MACRO will adjust the example code.     ============ How this example works : Cacheable region used ============ I have connected MOSI and MISO pins of spi at hardware level. Whenever I am  sending and receiving total 10 numbers of 12 byte packet On each transmission of 12 byte packet I am incrementing the first bite of transmit buffer just to distinguish between packets at the receive side Cache_Ip_InvalidateByAddr() --> I have to call this API every time I receive 12 byte of data on receive buffer Cache_Ip_CleanByAddr() --> every time after incrementing the transmit buffer first byte ...I have to call this API then only the correct data is transmitted otherwise it will transmit the same data which was available at first time transfer ================ Cache API operation ============== Cache_Ip_InvalidateByAddr() is for the  invalidate operation. Cache_Ip_CleanByAddr() is for the clean operation or clean&invalidate operation that can be chosen by param of this api: @Param[in]  enInvalidate      Specifies to execute operation Clean&Invalidate. Clean: This operation ensures that all dirty lines—data in the cache that has been modified but not yet written back to the main memory—are written back to the main memory ->(push data from cache memory to main memory)  Invalidate: This operation marks the cache lines as invalid, ensuring that any subsequent access to these lines results in a fetch from the main memory, thus ensuring data consistency ->(push data from main memory to cache memory) Clean&invalidate : A cache clean and invalidate operation behaves as the execution of a clean operation followed immediately by an invalidate operation. Both operations are performed to the same location. ================ Pins used ======================    

This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 2 AFE MC33775 board connected in TPL 3> Change following macro in mc33775_cfg.h file  to change the numbers of AFE connected in TPL.   RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33775 AFE connected in TPL mode.   =============== MCU Pins used =========== TPL1-TX :-- TPL1TXCSB  --> PTC6/LPSPI0_PCS1 TPL1TXSCLK --> TPL12TXCLK --> PTE1/LPSPI0_SCK    TPL1TXDATA --> TPL12TXDATA --> PTE2/LPSPI0_SOUT    TPL1-RX :-- TPL1RXCSB  --> PTB17/LPSPI1_PCS3 TPL1RXCLK  --> PTB14/LPSPI1_SCK TPL1RXDATA --> PTB15/LPSPI1_SIN     ================= EVB Link ================== https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/analog-toolbox/evaluation-board-for-mc33664atl-isolated-network-high-speed-transceiver:FRDMDUALK3664EVB https://www.nxp.com/design/design-center/development-boards-and-designs/RD33775ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172   ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Disable Communication timeout in code :--   ================= Results for FIRST AFE ===========================          

This post is an additional project to the S32K3 Low Power Management AN and demos.  A simple FlexCAN routine is configured for RX/TX and wakeup through the CAN0_RX pin (PTA6/WKPU19). The example is based on the S32K3X4EVB-T172, meaning that transceiver TJA1443 is used. TJA1443 only needs CAN0_EN & CAN0_STB pins in HIGH for normal configuration. In the example, the GREEN led is used to indicate that the MCU is in RUN mode. Once SW5 is pressed, MCU enters low power (STANDBY), and led is turned off. BLUE led toggles each time a CAN frame is received. MCU can be woken up with SW6 (WKPU42) or through a CAN RX. Note that CAN is not enabled in low-power, rather PTA6 (WKPU19) is configured for wake up, and once a rising edge signal is detected on the pin, MCU wakes up and reconfigures CAN module.  ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K344 * Compiler: S32DS3.6.2 * SDK release: RTD 6.0.0 * Debugger: PE Micro * Target: internal_FLASH  ------------------------------------------------------------------------------ This example is provided as is with no guarantees and no support.

******************************************************************************************************* * Detailed Description: This demo showcases how to use eMIOS in Input Capture mode with DMA. It demonstrates how timestamp data from captured input signals is stored and how a GPIO toggle provides a simple visual confirmation that the interrupt is being triggered as expected.   * eMIOS Pwm: Configures EMIOS 0 Channel 1 as OPWMB (Output Pulse Width Modulation Buffered). This channel generates a waveform that will be captured by Channel 9 * eMIOS Icu with DMA: Configures EMIOS 0 Channel 9 in ICU_MODE_TIMESTAMP using SAIC (Single Action Input Capture) mode. This channel captures the timestamps of the waveform generated by Channel 1. After a predefined number of captures, a DMA interrupt is triggered. ******************************************************************************************************* * Test HW: S32K3X4EVB-T172 * MCU: S32K344 * Debugger: S32DS 3.6.2, OpenSDA * Target: internal_FLASH *******************************************************************************************************

*******************************************************************************  The purpose of this demo application is to present a usage of the  FS26 watchdog timer refresh using the SBC_FS26 CDD  ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * FS26 : CDD 2.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Watchdog type :-- NXP eval boards has ASIL-D FS26 part with challenger watchdog. The OTP of FS26 on the board uses challenger watchdog. Change watchdog in code :-- FS26 watchdog is started in disabled mode (means infinite period). Later on we change the watchdog time in the code :--     Array Index for watchdog refresh timing  :-- Example will run once you press switch USER_SW0 connected on PTB26 on the Evaluation board :-- Please add this type of check in your code, during development process so that, avoid any error due to FS26 watchdog mis trigger. When you use Debug FLASH then in that case code goes to flash memory & can cause your MCU to frequent RESET, which caused issue for reprogramming the NEW firmware on the board FLASH memory. If we add this type of check then we can avoid the Faulty FS26 Software to stop misbehaving before flashing new firmware on the board.   In CDD-2.0.0, FS26 goes to INIT_FS state here  :--- Sbc_fs26_InitDevice() --> Sbc_fs26_CheckStateAndGotoInitFS()   In CDD-2.0.0, If we start the Watchdog in enabled mode, watchdog notification function to refresh watchdog is called from this function  :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() -->      In CDD 2.0.0, Following function call will exit Debug mode & Release FS0b & FS1B pin :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() :--- --> Sbc_fs26_ExitDebugMode() --> Sbc_fs26_ReleaseSequence()   In CDD 2.0.1, Following function call will exit Debug mode & Release FS0b & FS1B pin :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() --> Sbc_fs26_ExitDebugMode()