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******************************************************************************** * Detailed Description: * RAM self-test is performed after reset in startup_S32K144.s file. * The RAM self-test should be executed right after reset, so it does not destroy * data loaded to RAM by init functions. The code is inserted after * initialization of core registers. RAM initialization is commented out because * the same operation is done by the self-test. * The test flow is: * 1. Write pattern 0x55AA55AA to first word in RAM * 2. Read the data back * 3. Compare the data and increment error counter if not equal * 4. Write inverse pattern 0xAA55AA55 to first word in RAM * 5. Read the data back * 6. Compare the data and increment error counter if not equal * 7. Clear the first word in RAM to leave whole RAM erased to ‘0’ at the end of test * This procedure is repeated for whole RAM. * If the error counter is different from zero at the end, the program stays in * endless loop until watchdog reset. * * ------------------------------------------------------------------------------ * Test HW:         S32K144EVB-Q100 * MCU:             FS32K144UAVLL 0N57U * Fsys:            Default * Debugger:        Lauterbach Trace32 * Target:          internal_FLASH * ********************************************************************************
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