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******************************************************************************** Detailed Description: Configures the FlexCAN 0 to transmit and receive a CAN message Baudrate to is set to 500kbps. In this config, RXFIFO is used to receive a messages. 16 filter elements are defined in the RXFIFO table. Both standard and extended IDs are used. DMA is enabled in component inspector to read RXFIFO. MB10 is moreover used to receive a message with given standard ID and MB11 is used to transmit a message upon button press. The callback function is installed as well and is it called each time message is received in MB10, RXFIFO or message is transmitted. Note: EVB must be powered by 12V to have SBC's CAN transceiver active * ------------------------------------------------------------------------------ * Test HW:        S32K144EVB-Q100 * MCU:            FS32K144UAVLL 0N57U * Target:         Debug_FLASH * EVB connection: PCAN-View with PCAN-USB Pro connected to CAN port J13 * Compiler:       S32DS.ARM.2018.R1 * SDK release:    S32SDK_S32K1xx_RTM_3.0.0 * Debugger:       Lauterbach Trace32 ******************************************************************************** Revision History: Ver    Date           Author          Description of Changes 0.1    Apr-04-2019    Petr Stancik    Initial version *******************************************************************************/
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/******************************************************************************** Detailed Description: Example shows possible implementation of multiple ADC conversions using SDK. Here 25 channels are sampled periodically. 2 ADC modules and 2 PDBs are used. ADC0 is configured to sample 16 channels, ADC1 9 channels. PDBs are set to back-to-back mode to perform chain conversion. Within ADC component you need to select ADC input to be measured for each item in configuration list. For ADC0 channels ADC ch12 is selected, as it is connected to trimmer on the EVB. DMA is used to read result into single buffer, and DMA callbacks are issued to indicate end of transfer for each ADC module. Within those callbacks PTE14 and PTE15 is toggled. PDB0 output pulse is generated on the PTE16 to indicate start of ADC measurement. This is done periodically at LPIT ch0 rate, which is set to 30us. The ADC0 ch0 result is used to dim LEDs. * ------------------------------------------------------------------------------ * Test HW:       S32K144EVB-Q100 * MCU:           FS32K144UAVLL 0N57U * Target:        Debug_FLASH * EVB connection: * Compiler:      S32DS.ARM.2018.R1 * SDK release:   S32SDK_S32K1xx_RTM_3.0.0 * Debugger:     Lauterbach Trace32 ******************************************************************************** Revision History: Ver Date          Author          Description of Changes 0.1 May-04-2019   Petr Stancik    Initial version *******************************************************************************/
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Hi,     If you try to compile the sample project within S32K14X_MCAL4_2_RTM_1_0_0, you should take care of the command if you use Linaro.    After you set the environment of compiling and run the command under command window, you should enter     "launch.bat MODE=USER TOOLCHAIN=linaro"    NOT    "launch.bat MODE=USER TOOLCHAIN=LINARO"      The command is case sensitivity.   Hope you can compile the project successfully.  Cheers! Oliver
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Hello,      NXP does a big change on document structure.     Generally, you can find pin assignment table, interrupt mapping and memory map table in RM. But now, these information change to Excel files and attached in RM.   For example on S32K.    You will find the words in RM, like 'For reset values per port, see IO Signal Description Input Multiplexing sheet(s) attached to the Reference Manual.'    Then, please go to attachment tab of your PDF file viewer, like Adobe Acrobat Reader DC.     These steps are also fit for MPC57xx , S32R family. Cheers! Oliver
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********************************************************************************  Detailed Description:  Example shows how to use FlexCAN 0 Pretended networking mode to allow FlexCAN  module to wake up MCU from STOP mode using SDK.  Wake up by Timeout and wake up by Match events are enabled.  Also pin interrupt can be used to exit STOP mode.  So MCU enters STOP mode by pressing SW3 button.  MCU exits STOP mode when one of following happens:  - no CAN message comes in 8sec (CAN PN timeout event)  - message with standard ID 0x554 or 0x555 comes (CAN PN match event)  - SW2 button is pressed (PTC12 interrupt)  In run mode blue LED is dimming and the rate is different for each wakeup event  ------------------------------------------------------------------------------  Test HW: S32K116EVB-Q48  MCU: PS32K116LAM 0N96V  Compiler: S32DS.ARM.2.2  SDK release: S32SDK_S32K1xx_RTM_3.0.0  Debugger: Lauterbach, OpenSDA  Target: internal_FLASH ********************************************************************************
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*******************************************************************************************************  Detailed Description:  Configures the MCU to run system clock from XOSC.  LPUART1 is set to respond to LIN header sent from master.  Based on ID received the LPUART1 either receive frame's data and compare checksum  or publish requested data with calculated checksum. Enhanced checksum is used.  Interrupt is used for RX and TX operation and 2 versions of interrupt routine are available.  VER 1 ... during response transmission receiver disabled and transmit interrupt enabled  VER 2 ... during response transmission receiver is kept enabled  ------------------------------------------------------------------------------  Test HW: S32K116 EVB-Q048  MCU: PS32K116LAM 0N96V  Fsys: 40MHz  Debugger: Lauterbach  Target: internal_FLASH ******************************************************************************************************
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Hi,        ARM Cortex-M have a DWT (Data Watchpoint and Trace) unit implemented, and it has a nice feature in that unit which counts the execution cycles. The DWT is usually implemented on most Cortex-M3, M4 and M7 devices, including e.g. the NXP S32K14x.      Attachment is the sample project on S32K142 to measure the running time of a function.     Password of extraction is nxp.     Enjoy the measuring!   Cheers! Oliver BTW, Measure the running time of one function on PowerPC could also be gotten through the link.
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******************************************************************************************** * Detailed Description: * LPIT_ch0 triggers DMA_ch0 periodically (1ms). * Every trigger starts a minor DMA loop (8 bytes) transfer to the LPSPI1 TX FIFO. * There are 8 minor loops per one major loop (64 bytes in 8ms). * LPSPI1 sends two 32bit frames every 1ms. * LPSPI1 RX data are masked, they are not stored in the RX FIFO. * ------------------------------------------------------------------------------ * Test HW: S32K144EVB-Q100 * MCU: S32K144 0N57U * Debugger: S32DS 2.2, OpenSDA * Target: internal_FLASH ********************************************************************************************
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********************************************************************************  Detailed Description:  Example shows how to use FlexCAN 0 Pretended networking mode to allow FlexCAN  module to wake up MCU from STOP mode.  Wake up by Timeout and wake up by Match events are enabled.  Also pin interrupt can be used to exit STOP mode.  So MCU enters STOP mode by pressing SW3 button.  MCU exits STOP mode when one of following happens:  - no CAN message comes in 8sec (CAN PN timeout event)  - message with standard ID 0x554 or 0x555 comes (CAN PN match event)  - SW2 button is pressed (PTC12 interrupt)  In run mode blue LED is dimming and the rate is different for each wakeup event  ------------------------------------------------------------------------------  Test HW: S32K144 EVB-Q100  MCU: FS32K144UAVLL 0N57U  Fsys: 160MHz  Debugger: Lauterbach, OpenSDA  Target: internal_FLASH ********************************************************************************
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I write a doc and a demo about LPUART hardware flow control, runs on s32k144 evb board with RTM 3.0.0, the flow control function work normally. If you have any question please contact me. 
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Using S32k144 ISELD SDK driver and adding Touch Sensor software, a demo is created to show different light combinations when electrodes of S32K144 EVB are touched. ADK ISELED board is attached to S32K144 EVB.
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An example implementation of SENT protocol receiver with S32K118 evaluation board. The input is expected in J106, TICK duration is 2,75us. CRC is calculated and check, the decoded output is printed into terminal via UART (ASCII)
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Often we need to implement a SENT receiver in order to read the information sent by some sensors. It is useful to have the possibility of transmitting different message patterns in order to test your implementation. With this project you can transmit via a computer terminal a group of messages (up to 64). The project runs on a S32K144 EVB board, the output signal goes through J206 pin.
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Example of usage of AIPS-lite, Protects the access to GPIO port. This example can be used with UART terminal, 115200 bps. The interface menu shows like this: AIPS example has started Please press 0 + enter to set red LED in GPIO port Please press 1 + enter to set red LED in GPIO port Please press 2: GPIO peripheral will only accept accesses from trusted master, M0 (Core) is set as untrusted when a write access, AIPS cannot longer be modified from core and a reset will occur in the next GPIO access Please press 3: GPIO access is write protected, any write access to GPIO will produce a hard fault
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You can find here a reference code for a march c software test in order to test RAM memories
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******************************************************************************** * Detailed Description: * RAM self-test is performed after reset in startup_S32K144.s file. * The RAM self-test should be executed right after reset, so it does not destroy * data loaded to RAM by init functions. The code is inserted after * initialization of core registers. RAM initialization is commented out because * the same operation is done by the self-test. * The test flow is: * 1. Write pattern 0x55AA55AA to first word in RAM * 2. Read the data back * 3. Compare the data and increment error counter if not equal * 4. Write inverse pattern 0xAA55AA55 to first word in RAM * 5. Read the data back * 6. Compare the data and increment error counter if not equal * 7. Clear the first word in RAM to leave whole RAM erased to ‘0’ at the end of test * This procedure is repeated for whole RAM. * If the error counter is different from zero at the end, the program stays in * endless loop until watchdog reset. * * ------------------------------------------------------------------------------ * Test HW:         S32K144EVB-Q100 * MCU:             FS32K144UAVLL 0N57U * Fsys:            Default * Debugger:        Lauterbach Trace32 * Target:          internal_FLASH * ********************************************************************************
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******************************************************************************************************** Detailed Description: On WDOG timeout, the WDOG module requests reset in the Reset Control Module (RCM). The reset request to RCM can be delayed by 128 bus clock cycles if the WDOG interrupt is enabled (WDOG_CS[INT] = 1). If enabled, the WDOG interrupt vector is fetched or it becomes pending in NVIC. After the delay, the reset is requested in RCM. Independently of the WDOG interrupt, the RCM can again delay the reset by up to 514 LPO additional clock cycles if the corresponding RCM_WDOG interrupt is enabled (RCM_SRIE[GIE, WDOG] = 1). If so, instead of forcing reset immediately, the module requests the RCM interrupt in NVIC and forces the reset after the additional delay (RCM_SRIE[DELAY]). Either way, the reset is forced, it can’t be stopped only delayed. This example enables the WDOG interrupt in the WDOG_CS register but leaves this interrupt disabled in NVIC. That means that this interrupt becomes pending in NVIC on the WDOG timeout, it sets the WDOG_CS_FLG, but the vector doesn’t get fetched. The RCM interrupt is enabled and it gets asserted in NVIC after the WDOG interrupt delay (2.67us (48MHz BUS CLK)). The WDOG flag (WDOG_CS_FLG) is read in the RCM ISR instead. The execution stays in an infinite loop for 514 LPO (128kHz) cycles (~ 4ms) until the reset is forced. ------------------------------------------------------------------------------------------------------------------------- Test HW: S32K144EVB-Q100 MCU: S32K144 0N57U Debugger: S32DSR1 OpenSDA Target: internal_FLASH ********************************************************************************************************
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Dear all, I'd like to share some useful tips about S32DS for ARM v2018.R1 IDE and S32K1xx development  in Chinese as below: 《S32DS使用Tips--SDK使用常见问题(FAQ)答疑》; 《S32K SDK使用详解之S32 SDK软件编程思想详解》; 《S32K SDK使用详解之S32 SDK软件架构详解》; 《 S32K1xx系列MCU使用Tips--功能介绍及软件开发和硬件设计FAQ》; 《 S32K1xx系列MCU使用Tips--Flash加密后不断复位无法连接调试器的问题解决》; 《S32DS使用Tips--S32DS for Power V1.2 链接文件和启动过程详解》; 《S32K1xx系列MCU使用Tips之SDK软件架构和使用详解》; 《S32DS使用Tips--SDK使用常见问题(FAQ)答疑》; 《S32DS IDE使用Tips--应用工程调试常见问题(FAQ)答疑》; 《 S32DS 使用Tips之S32DS for Power不同版本之间的GNU工具链差异与外设寄存器位域访问问题总结》; 《 S32DS使用Tips之S32DS for Power v1.1应用工程升级到v1.2重新编译运行程序跑飞问题解决》; 《S32DS 使用tips--S32DS for ARM v1.3工程到S32DS for ARM V2.0迁移升级方法和注意事项》; 《  S32DS 使用 tips--工程属性配置(编译选项和C编译器、汇编器及链接器设置)》; 《 S32DS使用Tips--如何编译生成和调用静态库》; 《S32DS使用Tips--如何通过创建新的编译目标(Build Target)在同一个S32DS工程中同时编译静态库和应用程序》; 《 S32DS使用Tips--如何配置和使能Attach功能定位软件程序bug和完成bootloader与应用程序工程的联合调试》; 《 CodeWarrior与S32DS IDE使用 Tips之如何在应用工程中保留定义但未使用的全局常量、变量(用于参数标定)》; 《 S32DS 使用 tips--使用Flash from file下载S19或elf文件》; 《S32DS for ARM v2018.R1安装IAR Eclipse插件调用IAR工具链开发S32K系列MCU应用程序详解》 For more contents, please follow below link: “汽车电子expert成长之路”微信公众号最新最全原创技术分享文章列表 ; Hope this can help you and have a nice day~! Best regard, Enwei Hu(胡恩伟)
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******************************************************************************** Detailed Description: This example shows SRAM ECC injection. By default, a double-bit ECC error is injected on read access of a location in SRAM_U region. This can be changed with the SRAM_U and DOUBLE_BIT macros. The errors can be detected by both the ERM and MCM modules and the corresponding interrupts can be called. Although only ERM is needed, for demonstration purposes, the MCM interrupt is enabled as well with a lower priority than the ERM interrupts. The ERM interrupts that are called first disable the injection mechanism so that subsequent errors can not be detected during a stack read access. The default S32 Design Studio start_up file copies the vector table to the SRAM_L region. To be able to inject ECC errors in this SRAM region and call the interrupts, the copying is disabled by __flash_vector_table__ symbol  declared in the start_up.h file and defined in the S32K144_64_flash linker file. -------------------------------------------------------------------------------------------- Test HW: S32K144EVB-Q100 MCU: S32K144 0N57U Debugger: S32DSR1 Target: internal_FLASH ********************************************************************************
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******************************************************************************** Detailed Description: This example shows the use of SRAM retention after SW reset. The SW reset is triggered by pressing the SW3 button on the S32K144 EVB The reset is delayed in RCM module: 514 LPO cycles. In the RCM interrupt, SRAMU_RETEN and SRAML_RETEN are cleared allowing to retain SRAM data during the reset. After software reset, SRAMU_RETEN and SRAML_RETEN are set to1 to allow accesses to SRAM.  During software initialization in the startup_S32K144.S, ECC RAM initialization is skipped.  After that, we can check the written data before reset are still placed in the SRAM.  ------------------------------------------------------------------------------ Test HW: S32K144EVB-Q100 MCU: S32K 0N57U Debugger: S32DSR1 ********************************************************************************
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