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*******************************************************************************  The purpose of this demo application is to present a usage of the  FS26 watchdog timer refresh using the SBC_FS26 CDD  ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * FS26 : CDD 2.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Please Modify attached code, and add this line of code, in this function Sbc_Wdg_Refresh_Notification  :-- Gpt_StopTimer(GptConf_GptChannelConfiguration_GptChannelConfiguration_0);     This change will make the example work for even starting FS26, driver at 6 msec and above.   Watchdog type :-- NXP eval boards has ASIL-D FS26 part with challenger watchdog. The OTP of FS26 on the board uses challenger watchdog. Change watchdog in code :-- FS26 watchdog is started in disabled mode (means infinite period). Later on we change the watchdog time in the code :--     Array Index for watchdog refresh timing  :-- Example will run once you press switch USER_SW0 connected on PTB26 on the Evaluation board :-- Please add this type of check in your code, during development process so that, avoid any error due to FS26 watchdog mis trigger. When you use Debug FLASH then in that case code goes to flash memory & can cause your MCU to frequent RESET, which caused issue for reprogramming the NEW firmware on the board FLASH memory. If we add this type of check then we can avoid the Faulty FS26 Software to stop misbehaving before flashing new firmware on the board.   In CDD-2.0.0, FS26 goes to INIT_FS state here  :--- Sbc_fs26_InitDevice() --> Sbc_fs26_CheckStateAndGotoInitFS()   In CDD-2.0.0, If we start the Watchdog in enabled mode, watchdog notification function to refresh watchdog is called from this function  :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() -->      In CDD 2.0.0, Following function call will exit Debug mode & Release FS0b & FS1B pin :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() :--- --> Sbc_fs26_ExitDebugMode() --> Sbc_fs26_ReleaseSequence()   In CDD 2.0.1, Following function call will exit Debug mode & Release FS0b & FS1B pin :-- Sbc_fs26_InitDevice() --> Sbc_fs26_NormalFSSequence() --> Sbc_fs26_ExitDebugMode() ===================== CDD-2.0.1 example ================= RTD used :-- S32K3XX_AASW_4_7_RTM_FS26_2_0_1_DS_updatesite_2311_signed.zip Watchdog started in the Disabled mode (i.e infinite Period) then watchdog period is changed in the code main() function :--   Driver configuration :--   These function get executed :--       One bug in RTD   ---> S32K3XX_AASW_4_7_RTM_FS26_2_0_1_DS_updatesite_2311_signed.zip :-- RTD driver Bug is corrected like this :--   
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Abstract This example presents an use case for analogue data capturing using eMIOS, BCTU, SAR-ADC and DMA modules on S32K39-37-36 series based on the RTD low level API to support diverse application needs.   Connections: S32K396-BGA-DC1 -> Pin -> Signal -> Label J62-1 -> PTC30 -> siul2_gpio_xx -> GPIO1_GPT (D0) J58-1 -> PTE14 -> emios_0_ch_19_z -> PWM1 J58-2 -> PTG9 -> siul2_gpio_xx -> GPIO2_eMIOS_Trigger J62-2 -> PTC31 -> siul2_gpio_xx -> GPIO3_BTCU_Trigger J62-4 -> PTD6 -> siul2_gpio_xx -> GPIO4_BTCU_Watermark J62-24 -> PTB14 -> adc1_s21 -> ADC1 *To use the potentiometer of S32X-MB connect: J62-24 (in S32K396-BGA-DC1) to P26-1 (in S32X-MB) Note: Following line should be added in project/generate/src/Bctu_Ip_PBcfg.c every time the code is updated in Config Tools: #define DMA_LOGIC_CH_0 ((uint8)0U)   Detailed Description: The Compare Value of GPT eMIOS_0_ch_0 generates a time-out period. Once time-out is reached its Emios Notification toggles GPIO1. This allows us to observe in scope 2 events, which describe the start and the end of the signal sequence. The eMIOS_0_ch_23 channel is configured as global counter bus A. In this setup, it can act as the time base for other eMIOS_0 channels, enabling synchronization between other them—there is just one PWM in this case. This synchronization ensures that channels share the same time base, thereby defining a common period for their operation. The emios_0_ch_19_g channel is configured as OPWMT mode, which offer more flexibility for triggering. An interrupt is requested on every flag event, during which GPIO2 is toggled—happens at half the time high in this case. This flag event, can be configured using Trigger parameter. For more details about eMIOS, please refer to S32M27x/S32K3 – eMIOS Usage, considering differences for porting from S32K3 to S32K39-37-36 in AN14301. The BCTU implements a list for parallel conversions using ADC0 and ADC1. Which is triggered by the eMIOS channel, and the resulting data is stored in FIFO1, as follows: ADC0: VREFH_ChanNum51 -> BANDGAP_ChanNum48 ADC1: VREFL_ChanNum50 -> S21_ChanNum45 For debugging purposed the GPIO3 is toggled every BCTU Trigger Notification. Additionally, the GPIO4 is toggled in BCTU Watermark Notification, which happens every time the number of active entries in FIFO exceeds the watermark level, and therefore the data is available for reading. See full signal sequence in Figure 1: Figure 1. Signals of example project When you suspend debug session, in Expressions tab (Figure 2) you can observe results: g_fifo1Result, which corresponds to the BCTU list measurements, meanwhile g_fifo1Volts corresponds to the conversion in volts. Figure 2. Expressions tab of example project   References S32 Design Studio for S32 Platform Real-Time Drivers (RTD) S32K39, S32K37 and S32K36 Data Sheet [S32K39-S32K37-DS] S32K39, S32K37, and S32K36 Reference Manual [S32K396RM] S32K344 to S32K39/S32K37 Migration Guide [AN14301] S32K39/37/36 Electrification Microcontrollers Evaluation Board [S32K396-BGA-DC1] S32X-MB I/O Extension Evaluation Board for Real-Time Domain Control and Actuation [S32X-MB] S32M27x/S32K3 – eMIOS Usage [S32M Knowledge Base] S32M27x/S32K3 – eMIOS/BTCU/ADC/DMA – [RTD600] [S32M Knowledge Base] S32K39-37-36 – eFlexPWM/TRGMUX/BCTU/SAR-ADC/DMA – [RTD600] [S32M Knowledge Base] Application Software: - S32K396_RTD600_eMIOS_BCTU_SARADC_DMA_Ip_example Example was built and tested using the following IDE and Driver versions: - S32 Design Studio for S32 Platform Version 3.6.3 - S32K3_S32M27x Real-Time Drivers ASR R21-11 Version 6.0.0
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Abstract This example presents an use case for complementary PWM outputs with dead-time insertion and hardware ADC triggering using eFlexPWM, TRGMUX, BCTU, SAR-ADC and DMA modules on S32K39-37-36 series based on the RTD low level API to support diverse application needs. Connections: S32K396-BGA-DC1 -> Pin -> Signal -> Label J62-1 -> PTC30 -> siul2_gpio_94 -> GPIO1_GPT J62-5 -> PTD2 -> pwm_0_a, 2 -> PWM1 J62-6 -> PTD3 -> pwm_0_b, 2 -> PWM2 J62-30 -> PTD24 -> pwm_0_a, 0 -> PWMT J62-2 -> PTC31 -> siul2_gpio_95 -> GPIO3_BTCU_Trigger J62-4 -> PTD6 -> siul2_gpio_102 -> GPIO4_BTCU_Watermark J62-24 -> PTB14 -> adc1_s21 -> ADC1 *To use the potentiometer of S32X-MB connect: J62-24 (in S32K396-BGA-DC1) to P26-1 (in S32X-MB)   Note: Following line should be added in project/generate/src/Bctu_Ip_PBcfg.c every time the code is updated in Config Tools: #define DMA_LOGIC_CH_0 ((uint8)0U)   Detailed Description: The Compare Value of GPT eMIOS 0 channel 0 generates a time-out period. Once time-out is reached its eMIOS notification toggles GPIO1. This allows us to observe in scope 2 events, which describe the start and the end of the signal sequence. The eFlexPWM0 module is used for generating PWMs and hardware ADC triggering. The eFlexPWM0 Submodule 2 is employed to generate center-aligned complementary PWM outputs (PWM1 and PWM2) with dead-time insertion. The eFlexPWM0 Submodule 0 generates another independent PWM output (PWMT) and is utilized to generate the trigger signal for analog data capturing within the same PWM period —happens at half the time high in this case—using VAL0 register. The BCTU implements a list for parallel conversions using ADC0 and ADC1. Which is triggered by the eMIOS channel, and the resulting data is stored in FIFO1, as follows: • ADC0: VREFH_ChanNum51 -> BANDGAP_ChanNum48 • ADC1: VREFL_ChanNum50 -> S21_ChanNum45 For debugging purposed the GPIO3 is toggled every BCTU Trigger Notification. Additionally, the GPIO4 is toggled in BCTU Watermark Notification, which happens every time the number of active entries in FIFO exceeds the watermark level, and therefore the data is available for reading. See full signal sequence in Figure 1: Figure 1. Signals of example project When you suspend debug session, in Expressions tab (Figure 2) you can observe results: g_fifo1Result, which corresponds to the BCTU list measurements, meanwhile g_fifo1Volts corresponds to the conversion in volts. Figure 2. Expressions tab of example project   References S32 Design Studio for S32 Platform Real-Time Drivers (RTD) S32K39, S32K37 and S32K36 Data Sheet [S32K39-S32K37-DS] S32K39, S32K37, and S32K36 Reference Manual [S32K396RM] S32K344 to S32K39/S32K37 Migration Guide [AN14301] S32K39/37/36 Electrification Microcontrollers Evaluation Board [S32K396-BGA-DC1] S32X-MB I/O Extension Evaluation Board for Real-Time Domain Control and Actuation [S32X-MB] S32K39-37-36 – eMIOS/BTCU/SAR-ADC/DMA – [RTD600] [S32K Knowledge Base]   Application Software: - S32K396_RTD600_eFlexPWM_TRGMUX_BCTU_SARADC_DMA Example was built and tested using the following IDE and Driver versions: - S32 Design Studio for S32 Platform Version 3.6.3 - S32K3_S32M27x Real-Time Drivers ASR R21-11 Version 6.0.0
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 ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE Micro * Target: internal_FLASH ******************************************************************************** For S32K312, please use this correct clock HSE to AIPS clock should be ½. Please make these changes in the below all example code clock setting. HSE clock to 60 MHZ.   S32K312 PIT BTCU ADC-1 BCTU_ADC_DATA_REG DMA :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-PIT-BTCU-ADC-1-BCTU-ADC-DATA-REG-DMA-DS3-5/ta-p/1787778 S32K312 UART Transmit & Receive Using DMA :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-UART-Transmit-amp-Receive-Using-DMA-DS3-5-RTD300/ta-p/1787799 S32K312 EIRQ Interrupt :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-EIRQ-Interrupt-DS3-5-RTD300/ta-p/1787860 S32K312 SPI Transmit & Receive Using DMA :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-SPI-Transmit-amp-Receive-Using-DMA-DS3-5-RTD300/ta-p/1787856 Example S32K31 SPI multiple packet Transmit & Receive : solution for DMA Cache issue :- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K31-SPI-multiple-packet-Transmit-amp-Receive-solution/ta-p/2130091 Example S32K312 SPI Transmit & Receive Using Polling DS3.5 RTD300 :-- Example S32K312 SPI Transmit & Receive Using Polling DS3.5 RTD300 - NXP Community Example S32K312 SPI Transmit & Receive Using Interrupt DS3.5 RTD300 :-- Example S32K312 SPI Transmit & Receive Using Interrupt DS3.5 RTD300 - NXP Community S32K312 CAN Transmit & Receive Using Polling mode :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-CAN-Transmit-amp-Receive-Using-Polling-mode-DS3/ta-p/1789191 S32K312 CAN Transmit & Receive Using MB & FIFO DMA :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-CAN-Transmit-amp-Receive-Using-MB-amp-FIFO-DMA/ta-p/1789196 S32K312 ADC :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-ADC-DS3-5-RTD300/ta-p/1789282 S32K312 Switch Debouncing :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-Switch-Debouncing-DS3-5-RTD300/ta-p/1789290 S32K312 UART Freemaster :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-UART-Freemaster-DS3-5-RTD300/ta-p/1789306 S32K312 PIT BTCU parallel ADC FIFO DMA  :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-PIT-BTCU-parallel-ADC-FIFO-DMA-DS3-5-RTD300/ta-p/1789908 S32K312 placing variables in DCTM & code in ICTM  :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-placing-variables-in-DCTM-amp-code-in-ICTM-DS3-5/ta-p/1790101 Example S32K312 Standby mode & Standby RAM and PAD keeping DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-Standby-mode-amp-Standby-RAM-and-PAD-keeping-DS3/ta-p/1797713 Example S32K312 SWT DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-SWT-DS3-5-RTD300/ta-p/1800559 Example S32K312 Printf Semihosting DS3.5 RTD300 :--- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-Printf-Semihosting-DS3-5-RTD300/ta-p/1801354 Example S32K312 I2C Transmit & Receive Using DMA DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-I2C-Transmit-amp-Receive-Using-DMA-DS3-5-RTD300/ta-p/1801357 Example S32K312 HARDFAULT Handling Interrupt DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-HARDFAULT-Handling-Interrupt-DS3-5-RTD300/ta-p/1806259 Example S32K312 Bootloader to Application Jump DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-Bootloader-to-Application-Jump-DS3-5-RTD300/ta-p/1809810 Example S32K312 PIT timer Toggle LED DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-PIT-timer-Toggle-LED-DS3-5-RTD300/ta-p/1809932 Example S32K312 HARDFAULT Interrupt Handling using a script DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-HARDFAULT-Interrupt-Handling-using-a-script-DS3/ta-p/1818507 Example S32K312 UART Transmit & Receive Using Interrupt DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-UART-Transmit-amp-Receive-Using-Interrupt-DS3-5/ta-p/1818775 Example S32K312 CAN Transmit & Receive Using MB Interrupt DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-CAN-Transmit-amp-Receive-Using-MB-Interrupt-DS3/ta-p/1818790 Example S32K312 STANDBY wake up using CAN-0-RX and GPIO Switch DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-STANDBY-wake-up-using-CAN-0-RX-and-GPIO-Switch/ta-p/1891411 Example S32K312 STANDBY wake up using RTC DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-STANDBY-wake-up-using-RTC-DS3-5-RTD300/ta-p/1930115 S32K312 : ADC Clock selection :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K312-ADC-Clock-selection/ta-p/1997759 Example IP S32K312 PWM ICU using EMIOS Custom IRQ DS3.5 RTD300 :-- Example IP S32K312 PWM ICU using EMIOS DS3.5 RTD300 - NXP Community Example IP S32K312 EMIO PWM Generation & Duty capture using Interrupt DS3.5 RTD300 :-- Example IP S32K312 EMIO PWM Generation & Duty capture using Interrupt DS3.5 RTD300 - NXP Community Example IP S32K312 EMIO PWM Generation & Duty capture using Polling DS3.5 RTD300 :-- Example IP S32K312 EMIO PWM Generation & Duty capture using Polling DS3.5 RTD300 - NXP Community Example S32K312 Continuous SPI Transmit & Receive Using DMA DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K312-Continuous-SPI-Transmit-amp-Receive-Using-DMA/ta-p/2024597 S32K312 : HSE Demo project :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K312-HSE-Demo-project/ta-p/2112562 S32K312 : FS26 Watchdog trigger using the SBC_FS26 CDD :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K312-FS26-Watchdog-trigger-using-the-SBC-FS26-CDD/ta-p/2161357
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The S32K3 family of 32-bit AEC-Q100 qualified MCUs combines a scalable family of Arm® Cortex-M7-based microcontrollers built on long-lasting features with a comprehensive suite of production-grade tools. S32K3 MCUs are included in NXP’s Product Longevity Program, guaranteeing a minimum of 15 years of assured supply. The S32K3 offers dedicated peripherals set for rapid motor control loop implementation: enhanced Modular IO Subsystem(eMIOS), Logic Control Unit (LCU), TRGMUX, BodyCross-triggering Unit (BCTU), Analog to Digital Converter(ADC), and Analog Comparator (CMP). The comprehensive motor control ecosystem based on Automotive Math and Motor Control Library(AMMCLib) set, FreeMASTER with Motor Control ApplicationTuning (MCAT) tool and Model-Based Design Toolbox (MBDT) helps to enable S32K3 MCU in wide range of motor control use cases. The table below points to the articles with more detailed description each of S32K3 motor control use cases, hardware description, links to appropriate application notes and their addendums, and software repositories.  Device HW Article S32K344       MCSPTE1AK344 12 V development kit engineered for 3-phase PMSM and BLDC motor control applications     FOC with dual shunt current measurement Article focuses on solution based Field Oriented Control (FOC) technique (typically used for 3-phase PMSM motors) with dual shunt current measurement and without any position sensor (sensorless). The Encoder sensor is supported by SW option, but missing on HW kit. The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with high-level Autosar compliant API or low-level non-Autosar API.    FOC with single shunt current measurement Article focuses on solution based Field Oriented Control (FOC) technique (typically used for 3-phase PMSM motors) with single shunt current measurement and without any position sensor (sensorless). The Encoder sensor is supported by SW option, but missing on HW kit. The single shunt current measurement is advanced technique that allows decrese the cost of Bill of Material (BOM). The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with high-level Autosar compliant API or low-level non-Autosar API.    FOC integrated with FreeRTOS Article focuses on integration of motor control software (based on FOC with dual shunt current measurement) and Real Time Operating System (FreeRTOS). The available example code is based ANSI-C  code and uses RTD drivers with low-level non-Autosar API.    Six-step commutation control. Article focuses on solution based Six-step commutation (6-step) technique (typically used for 3-phase BLDC motors) with Hall position sensor and without any position sensor (sensorless). The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with low-level non-Autosar API.    Note: the list of use cases cannot cover all combinations of MCU, current measurement scenario, control technique and sensor inputs, but should work as a base reference for most common configurations. This list is not final, please follow this acticle to be notified about updates with new use cases.   
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This post presents two complementary FlexCAN communication examples for the S32K3X4EVB-T172 evaluation board, showcasing both low-level IP layer and AUTOSAR MCAL layer implementations. These examples are basic routines for configuring the component in normal/user mode, as the RTD examples are configured for loopback mode. To test CAN communication, another board or a CAN analyzer must be used. ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K344 * Compiler: S32DS 3.6.2 * SDK release: RTD 6.0.0 * Debugger: PE Micro * Target: internal_FLASH ------------------------------------------------------------------------------  Example 1: FlexCAN IP Layer This project demonstrates a basic FlexCAN setup using the IP-level driver. It configures a standard CAN message; with transmission through polling and reception using interrupts. The TJA1153 transceiver is initialized through a custom configuration sequence. An ACK message is sent upon each reception. The GREEN LED toggles every 10 received messages. Message buffer is configured to accept STD ID 0x123 with  FlexCAN_Ip_SetRxIndividualMask()  &  FlexCAN_Ip_ConfigRxMb() .  Example 2: FlexCAN MCAL Layer This project uses the AUTOSAR MCAL stack, leveraging  Can_43_FLEXCAN  and  CanIf  modules for CAN communication. Transmission is done via polling, while reception is configured via interrupts. STD ID is set to 0x123, and acceptance mask is set to 0x0 (accept all IDs). The same TJA1153 transceiver is used. CAN messages are sent and received using  CanIf  callbacks. The GREEN LED toggles every 10 received messages. TJA1153 is used in both examples with macros TJA1153 & TJA1153_EVB_TRCV respectively. If not defined, standard transceiver initialization is done (CAN0_STB & CAN0_EN pins set to HIGH).  These examples are provided as is with no guarantees and no support. These are basic routines meant to be used as reference only.
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This post is an additional project to the S32K3 Low Power Management AN and demos.  A simple FlexCAN routine is configured for RX/TX and wakeup through the CAN0_RX pin (PTA6/WKPU19). The example is based on the S32K3X4EVB-T172, meaning that transceiver TJA1443 is used. TJA1443 only needs CAN0_EN & CAN0_STB pins in HIGH for normal configuration. In the example, the GREEN led is used to indicate that the MCU is in RUN mode. Once SW5 is pressed, MCU enters low power (STANDBY), and led is turned off. BLUE led toggles each time a CAN frame is received. MCU can be woken up with SW6 (WKPU42) or through a CAN RX. Note that CAN is not enabled in low-power, rather PTA6 (WKPU19) is configured for wake up, and once a rising edge signal is detected on the pin, MCU wakes up and reconfigures CAN module.  ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K344 * Compiler: S32DS3.6.2 * SDK release: RTD 6.0.0 * Debugger: PE Micro * Target: internal_FLASH  ------------------------------------------------------------------------------ This example is provided as is with no guarantees and no support.
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******************************************************************************** The purpose of this demo application is to show you how to use the Temperature Sensor module in S32DS. It includes two methods to obtain temperature. -The first one starts a normal software conversion with one-shot mode on temp sense channel and calculates the temperature on chip from the data conversion. -The second one calculates the temperature based on given data (if read directly using ADC). Note: Please adjust the ADC reference voltage according to the board you are using * ------------------------------------------------------------------------------ * Test HW: S32K344EVB-T172 * MCU: S32K344 1P55A * Compiler: S32DS.ARM.3.5/6 * SDK release: S32K3_RTD_6.0.0/5.0.0/4.0.0_P24 * Debugger: OpenSDA/PE&Micro * Target: internal_FLASH *Jumper:J18-1:2,5V used. ********************************************************************************* Note that if you use "sprintf", you need to check the following option.  
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******************************************************************************* The purpose of this demo application is to use pad keeping for  PINS and enter the standby mode & before entering the standby mode update variables in Standby RAM memory with pin state. Once wake up from the standby mode update the pins values from the STANDBY RAM variables.  S32K3xx MCU.  ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE Micro * Target: internal_FLASH ******************************************************************************** =============== How this DEMO works ========== Before entring standby :-- Before entering standby mode, i make BLUE LED high SW6 on board pressed to enter the standby mode. Wakeup from Standby :-- SW5 on board pressed to wakeup from standby After wakeup from Stand by:-- I glow Green LED Unglow the BLUE LED Wait for SW6 on board to be pressed to enter the standby mode. ===============  Stand by RAM location =============== As noted, the Standby SRAM is allocated at the first 32 KB of the SRAM Memory. https://www.mouser.com/pdfDocs/S32K3MemoriesGuide.pdf =============== Pins used for PAD keeping =============== PTA30, PTA31, PTD14     =============== Switches used ===============   Enter Standby mode, by pressing SW6 on Board EXIT Standby mode, by pressing SW5 on Board =============== Wakeup source, SW5 PTB26 =============== =============== WKPU[41]  ---> WKPU_CH_45=============== Because First 4 WKPU are timers, so 41 + 4 = 45   =============== Linker file changed =============== Added Standby RAM memory & sections for standby RAM memory. Changes can be seen by comparing the original linker file      =============== Startup file changed , startup_cm7.s =============== Added call to Initialise the Standby RAM Changes can be seen by comparing the original startup_cm7.s file     ======================= How to verify if Standby RAM is working =============== 1> Declare two variables in file Wkup.c :-- __attribute__ ((section (".standby_ram_data"))) volatile int test_0_value ; __attribute__ ((section (".standby_ram_data"))) volatile int test_1_value ;   2> function set_pin_value() will be called before entering the standby mode. Initialise the values to these two variables inside function set_pin_value() in file Wkup.c.   3> Now burn the code inside the MCU using the PE micro debugger.     Once code is burned do not run the code & disconnect the debugger. 4> Power OFF and power ON the S32K312 board. Now code is waiting to enter standby mode. Press switch SW6 MCU will enter standby mode & Blue LED glowing. Press switch SW5 MCU will wakeup from the standby mode. Code will Now code is waiting to enter standby mode 5> Now open your debugger configuration, and attach to running target.   6> Once connected click on the ELF file & press pause button.   7> In Debug window you can see the value of variables test_0_value & test_1_value same as initialised before entering the standby mode.      
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* ================================================================================================== Detailed Description: * This example shows how to implement the UART RX/TX using interrupt/callback under FreeRTOS. * LPUART6 is set for 115200, 8N1 using interrupt processing. Callback is called for single byte received. * Reception is advanced until buffer is full or "\n" is received. * 2 tasks (receive/send) and 1 Queue are created. * ReceiveTask starts new UART reception, waits for completion and puts received message into Queue. * SendTask gets the message from Queue, echoes it back and toggle pin (LED_PIN <-> PTA29). * ================================================================================================== * Test HW: S32K3x4EVB-T172 Rev B * MCU: S32K344_172HDQFP * Compiler: S32DS 3.6.2 * RTD release: S32K3_S32M27x Real-Time Drivers ASR R21-11 Version 6.0.0 * Debugger: On-Board Debugger (J41) * Target: Internal_FLASH * Serial: 115200, 8N1 * ==================================================================================================   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.
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******************************************************************************** * Detailed Description: * The S32K144 MCU is configured as a LIN Slave node. * When a MasterReq frame (0x3C) is received with Go-to-sleep command, the stack goes to sleep. * The application can read: * l_flg_tst_LI0_MasterReq_flag() * l_ifc_read_status(LI0) * When a falling edge is detected on the LPUART RX pin, * LinWakeUpTimerNotification() is called. * The notification has to be enabled in MEX. * Gpt (LPIT) timer is used to calculated the length of the wake-up signal. * * ------------------------------------------------------------------------------ * Test HW: S32K144EVB-Q100 * MCU: S32K144 * Debugger: S32DS_ARM_3.6, S32K1_RTD_3_0_0_D2503 * Target: internal_FLASH ********************************************************************************   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.
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******************************************************************************** * Detailed Description: * CM7_0 starts CM7_2 using Power_Ip or directly in MC_ME (macro USE_RTD_POWER_IP). * Disconnect the debugger and power-cycle the MCU. * * ------------------------------------------------------------------------------ * Test HW: S32K3x8EVB-Q289 * MCU: S32K358 * Debugger: S32DS_ARM_3.5, S32K3_RTD_4_0_0_P24_D2405 * Target: internal_FLASH ******************************************************************************** Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.
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S32K344 + MC33664 + MC33774 : RTD 3.0.0 : BMS SDK 1.0.2 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K344-MC33664-MC33774-RTD-3-0-0-BMS-SDK-1-0-2/ta-p/2028783 S32K344 + MC33665 + MC33774 : RTD 3.0.0 : BMS SDK 1.0.2 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K344-MC33665-MC33774-RTD-3-0-0-BMS-SDK-1-0-2/ta-p/2127108 S32K344 + MC33664 + MC33775 : RTD 3.0.0 : BMS SDK 1.0.2 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K344-MC33664-MC33775-RTD-3-0-0-BMS-SDK-1-0-2/ta-p/2127049 S32K344 + MC33665 + MC33775 : RTD 3.0.0 : BMS SDK 1.0.2 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K344-MC33665-MC33775-RTD-3-0-0-BMS-SDK-1-0-2/ta-p/2127140 S32K144 : RTD-1.0.1 porting for : BCC_S32K144_FreeMASTER :-- https://community.nxp.com/t5/S32K-Knowledge-Base/S32K144-RTD-1-0-1-porting-for-BCC-S32K144-FreeMASTER/ta-p/2130167
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MCU : S32K144 AFE : MC33771 RTD : 1.0.1 As we know BCC sample software for MC33771C which is delivered is based on SDK for S32K144 , and uses S32DS-2.2 :-- BCC_S32K144_FreeMASTER I am having a setup , for this combination, using SPI :-- FRDM33771CSPEVB evaluation board  + S32K144 + 14 cell Battery EMULATOR :    S32K144 pins used :-- MOSI :  LPSPI0  : PTB-4 MISO :  LPSPI0  : PTB-3 SCK :    LPSPI0  : PTB-2 CSB :    LPSPI0  : PTB-5 RESET line of MC33771C : PTD-4 FRDM33771CSPEVB pins used :-- https://www.nxp.com/docs/en/user-guide/UM11402.pdf SI of MC33771C : Connects to MOSI of S32K144 : K2-7 SO of MC33771C : Connects to MISO of S32K144 : K2-9 SCK of MC33771C : Connects to PTD-4 of S32K144 : K2-11 CSB :    K2 -5 RESET line of MC33771C : K4 -1 Freemaster uses UART-1 on S32K144 EVB ():-- TX : PTC7 RX : PTC6 I have ported the BCC_S32K144_FreeMASTER  sample code to S32K144 using RTD-1.0.1 & is working fine. This attached code work fine for SPI.  Two sample project i have attached, both are tested and working fine :--- 1> Chip select is controlled by LPSPI. 2> Chip select is controlled manually in user software. Fremaster project is also inside the folder, name of freemaster project is :-- 1> FreeMASTER_project.pmp TPL related part i have not ported & tested because at present i am not having MC33664ATL on S32K144 EVB board & do not have FRDM33771BTPLEVB (MC33771C board with TPL on it). Regards, Dinesh
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The S32K14x MCU ARM Cortex M4F core processor handles fault exceptions using four handlers.   Handlers UsageFault_Handler() Usage faults are caused by an application that incorrectly uses Cortex M4 processor trying to execute an undefined instruction execute an instruction that makes illegal use of the Execution Program Status Register (EPSR), typically, this processor support only Thumb instruction set and it requires that all branch targets should be indicated as odd numbers, having bit[0] set. perform an illegal load of EXC_RETURN to the PC access a coprocessor if the access is denied or privileged only (configurable in CPACR) make an unaligned memory access execute an SDIV or UDIV instruction with a divisor of 0   The detection of the division by zero fault is disabled by default which means that such an operation returns zero and the fault is not detected. Similarly, the Cortex-M4 processor supports unaligned access for certain instructions. The detection on both the division by zero and the unaligned access (for every instruction) faults can be enabled in Configuration and Control Register (CCR).   BusFault_Handler() Bus faults occur when a bus slave returns an error response while stacking for an exception entry unstacking for an exception return prefetching an instruction during floating-point lazy state preservation Beside these faults listed above, there are also bus faults labeled as Precise and Imprecise. Imprecise bus fault occurs when an application writes to buffered memory region and continues executing subsequent instructions before the actual bus fault is detected. Therefore, at the time the exception rises the program counter doesn’t point to the instruction that has caused the bus fault. For debugging purposes, it is necessary to have “precise” program counter value to know which instruction has caused the fault exception. Imprecise bus fault can be forced to be precise by disabling the write buffer in (ACTLR_DISDEFWBUF = 1). This however might decrease the performance.   Note: The S32K144 MCU has its own system Memory Protection Unit which is implemented on the bus. Therefore, any system MPU violation triggers bus faults.   MemManage_Handler() Typically, these exceptions rise on an attempt to access regions that are protected by the core ARM Cortex M4 Memory Protection Unit. attempt to load or store at a protected location instruction fetch from a protected location stacking/unstacking fault caused by violation of the memory protection protection violation during floating-point lazy state preservation   S32K1xx series implements its own system Memory Protection Unit on the bus and therefore an attempt to access a protected region results in a bus fault exception instead. Nevertheless, the system MPU does not protect access to peripheral registers, and as the attached example code shows, an attempt to fetch instruction from a peripheral memory region causes a MemManage fault exception.   HardFault_Handler() This handler is the only one that has a fixed priority (-1) and is always enabled. If other handlers are disabled (in the SHCSR register), all faults are escalated to this handler. The escalation take place also when a fault occurs during another fault handling execution or while the vector table is read.   Priority of exception fault handlers   The fault exception handlers’ priorities, besides the HardFault handler (fixed priority -1), are configurable in fields PRI_4, PRI_5 and PRI_6 of SHPR1 register. These fields are byte-accessible and Cortex M4 support 255 priority levels, however, S32K14x MCUs support 16 priority levels only. Therefore, priorities are configurable in the four most significant bits of PRI_4, PRI_5 and PRI_6 only, which is similar to other NVIC IPR registers as shown below.   The lower priority number is set, the higher priority. By default, all handlers have priority set to zero.   Status and address registers for fault exceptions Configurable Fault Status Register (CSFR) consists from three status bit fields for Usage Fault (UFSR), Bus Fault (BFSR), and Memory Management Fault (MMFSR) where each bit represents a fault exception.     There are also two auxiliary address registers. If BFARVALID is set in the BFSR register, Bus Fault Address Register (BFAR) holds the memory access location of a precise bus fault. Similarly, if MMARVALID bit is set in MMFSR register, Memory Manage Address Register (MMAR) holds the address of a MemManage fault.   Example code To demonstrate the debugging process, the following exceptions can be forced: attempt to access an unimplemented memory area attempt to write to a non-gated peripheral register write to read only register fetching an instruction from a protected peripheral memory region division be zero unaligned memory access execution of a non-thumb instruction execution of an undefined instruction   When the program enters an exception handler, the stack frame is pushed onto the stack including the program counter value of the fault instruction. In this example, the exception handlers are declared with __attribute__((nake_)) (fault_exceptions.h), no prologue is generated and the program counter is always offset by 6 words (0x14) from the stack pointer that can be read in the handlers using either the debugger (memory view) or a SW pointer. If an application uses Process Stack Pointer (PSP) as well, it is necessary to find out whether the stack pointer comes from Main Stack Pointer (MSP) or PSP, this information is available in the EXC_RETURN value in the link register. Having a precise program counter address, we can find the fault instruction in Disassembly. This applies to all exception except for imprecise bus faults as explained above, imprecise bus faults can be forced to be precise by disabling the Write buffer.   The CSFR register is read to determine which exception has occurred and, if available, the memory access location that has caused the exception.    References Cortex-M4 Devices Generic User Guide Cortex-M4 Technical Reference Manual   Any support, information, and technology (“Materials”) provided by NXP are provided AS IS, without any warranty express or implied, and NXP disclaims all direct and indirect liability and damages in connection with the Material to the maximum extent permitted by the applicable law. NXP accepts no liability for any assistance with applications or product design. Materials may only be used in connection with NXP products. Any feedback provided to NXP regarding the Materials may be used by NXP without restriction.
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This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 2 AFE MC33775 board connected in TPL 3> Change following macro in mc33775_cfg.h file  to change the numbers of AFE connected in TPL.     RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33775 AFE connected in TPL mode.   =============== MCU Pins used ===========   FRDM665SPIEVB Jumper setting  :---                   K1, K2 & K4 connector of S32J344 EVB :--             K1 on MC33665 & S32K334 evb :--      K2 on MC33665 & S32K334 evb :--    K4 on MC33665 & S32K334 evb :--        ================= EVB Link ==================   https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/FRDM665SPIEVB https://www.nxp.com/design/design-center/development-boards-and-designs/RD33775ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172 ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255)   Disable Communication timeout in code :--     ================= Results for TWO AFE ===========================          
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This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 3 AFE MC33774 board connected in TPL 3> Change following macro in mc33774_cfg.h file  to change the numbers of AFE connected in TPL.     RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33774 AFE connected in TPL mode. FRDM665SPIEVB stackable board used for MC33665.     =============== MCU Pins used =========== FRDM665SPIEVB Jumper setting  :---     K1, K2 & K4 connector of S32J344 EVB :--       K1 on MC33665 & S32K334 evb :--  K2 on MC33665 & S32K334 evb :--  K4 on MC33665 & S32K334 evb :--    ================= EVB Link ================== https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/FRDM665SPIEVB https://www.nxp.com/design/design-center/development-boards-and-designs/mc33774ata-evaluation-board-with-isolated-daisy-chain-communication:RD33774ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172   ================== Measurement types used in example ===== Periodic measurement is done by 33774 , this is cyclic Other Two : application , sync  need send command to start Application measurement , need send app_capture command twice , and then read the result. Synchronous measurement take out the Primary adc result(VC)and secondary result(VB) .But the VC and VB result comes from different adc. Period measurement start when you send  API "MSR_StartMeasurement" and then 774 will do period measurement automatically periodically :--   Why we need to measure Vc & Vb both :-- ASIL-D ,yes we can measurement VC channel by primary ADC and measurement VB by secondary ADC from hardware VC and VB are come from same point of battery cell. Now 2 ADC compare with each other, that lead to high safety (ASIL D). Primary & Secondary Device temperature reading :-- This API is used for it MC33774_CDD_BCC_SWC_Running_Slot4(). ============= Cell Balancing =========== Cell Balancing method used :-- MC33774 balance will switch between odd channel (1,3,5,7,... 17) and even channel (2,4,6,8,..18) by 500ms period , (250ms for odd and then switch to even 250ms and then odd 250ms...)it is because of IC design and cannot change by software.   MC33774 have lots of balance method  this example uses "timer method ". How to check Balancing is enabled :-- Following function MC33774_CDD_BCC_SWC_Running_Slot5() read the : Balance status & fault registers BAL_SWITCH_STAT0, BAL_SWITCH_STAT1 represent the balancing MOSFET current status.   Measure the voltage drop across the balancing register is the best approach. You will see the voltage drop appears every 250ms if PWM is 100%.  Please check the schematic of the 33774 EVB, find the balancing resistor on which channel balancing is enabled.     ======= How much time to wait to extract the measurements results ======= 240 us is the time of one SCAN Time between each Application measurement sequence. Min App measure time for 16 sample :-- 4.08ms = (16+1) *240 Min 1 SYNC measurement time, for 16 samples = 18 cycle ≈ 18 * (16*240us) ≈ 69 ms ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Disable Communication timeout in code :--   ================= Results for FIRST AFE ===========================            
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This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 2 AFE MC33775 board connected in TPL 3> Change following macro in mc33775_cfg.h file  to change the numbers of AFE connected in TPL.   RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33775 AFE connected in TPL mode.   =============== MCU Pins used =========== TPL1-TX :-- TPL1TXCSB  --> PTC6/LPSPI0_PCS1 TPL1TXSCLK --> TPL12TXCLK --> PTE1/LPSPI0_SCK    TPL1TXDATA --> TPL12TXDATA --> PTE2/LPSPI0_SOUT    TPL1-RX :-- TPL1RXCSB  --> PTB17/LPSPI1_PCS3 TPL1RXCLK  --> PTB14/LPSPI1_SCK TPL1RXDATA --> PTB15/LPSPI1_SIN     ================= EVB Link ================== https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/analog-toolbox/evaluation-board-for-mc33664atl-isolated-network-high-speed-transceiver:FRDMDUALK3664EVB https://www.nxp.com/design/design-center/development-boards-and-designs/RD33775ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172   ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Disable Communication timeout in code :--   ================= Results for FIRST AFE ===========================          
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This example code brief  :-- 1> Tested without the SL of BMS, so no dependency on the BMS Safety library. 2> Its tested on 2 AFE MC33774 board connected in TPL 3> Change following macro in mc33774_cfg.h file  to change the numbers of AFE connected in TPL. RTD : 3.0.0 P07 BMS SDK : 1.0.2 This example does this task :-- Application Measurement. SYNC measurement Periodic Measurement. Read AFE temperature. Cell balancing timer method. Reading the Cell balancing status register & fault registers. =================== Setup used ============ Attached code is tested with TWO MC33774 AFE connected in TPL mode.         =============== MCU Pins used =========== TPL1-TX :-- TPL1TXCSB  --> PTC6/LPSPI0_PCS1 TPL1TXSCLK --> TPL12TXCLK --> PTE1/LPSPI0_SCK    TPL1TXDATA --> TPL12TXDATA --> PTE2/LPSPI0_SOUT    TPL1-RX :-- TPL1RXCSB  --> PTB17/LPSPI1_PCS3 TPL1RXCLK  --> PTB14/LPSPI1_SCK TPL1RXDATA --> PTB15/LPSPI1_SIN     ================= EVB Link ================== https://www.nxp.com/design/design-center/development-boards-and-designs/18-cell-battery-pack-emulator-to-supply-mc33774-bcc-evbs:BATT-18EMULATOR https://www.nxp.com/design/design-center/development-boards-and-designs/analog-toolbox/evaluation-board-for-mc33664atl-isolated-network-high-speed-transceiver:FRDMDUALK3664EVB https://www.nxp.com/design/design-center/development-boards-and-designs/mc33774ata-evaluation-board-with-isolated-daisy-chain-communication:RD33774ADSTEVB https://www.nxp.com/design/design-center/development-boards-and-designs/automotive-development-platforms/s32k-mcu-platforms/s32k3x4evb-t172-evaluation-board-for-automotive-general-purpose:S32K3X4EVB-T172   ================== Measurement types used in example ===== Periodic measurement is done by 33774 , this is cyclic Other Two : application , sync  need send command to start Application measurement , need send app_capture command twice , and then read the result. Synchronous measurement take out the Primary adc result(VC)and secondary result(VB) .But the VC and VB result comes from different adc. Period measurement start when you send  API "MSR_StartMeasurement" and then 774 will do period measurement automatically periodically :--   Why we need to measure Vc & Vb both :-- ASIL-D ,yes we can measurement VC channel by primary ADC and measurement VB by secondary ADC from hardware VC and VB are come from same point of battery cell. Now 2 ADC compare with each other, that lead to high safety (ASIL D). Primary & Secondary Device temperature reading :-- This API is used for it MC33774_CDD_BCC_SWC_Running_Slot4(). ============= Cell Balancing =========== Cell Balancing method used :-- MC33774 balance will switch between odd channel (1,3,5,7,... 17) and even channel (2,4,6,8,..18) by 500ms period , (250ms for odd and then switch to even 250ms and then odd 250ms...)it is because of IC design and cannot change by software.   MC33774 have lots of balance method  this example uses "timer method ". How to check Balancing is enabled :-- Following function MC33774_CDD_BCC_SWC_Running_Slot5() read the : Balance status & fault registers BAL_SWITCH_STAT0, BAL_SWITCH_STAT1 represent the balancing MOSFET current status.   Measure the voltage drop across the balancing register is the best approach. You will see the voltage drop appears every 250ms if PWM is 100%.  Please check the schematic of the 33774 EVB, find the balancing resistor on which channel balancing is enabled.     ======= How much time to wait to extract the measurements results ======= 240 us is the time of one SCAN Time between each Application measurement sequence. Min App measure time for 16 sample :-- 4.08ms = (16+1) *240 Min 1 SYNC measurement time, for 16 samples = 18 cycle ≈ 18 * (16*240us) ≈ 69 ms ============= Using Debugger ============ Debugger breakpoint will cause the communication timeout at the AFE, which will RESET the AFE. To use the debugger while development you need to disable the communication timeout. In S32DS MEX file you cannot disable the timeout function ( limit the value of 0~255) Disable Communication timeout in code :--   ================= Results for FIRST AFE =========================== Application Measurement : Cell voltage result :-- SYNC measurement : VC, VB same for both primary & Secondary  measure :--      
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*******************************************************************************  The purpose of this demo application is to present a usage of the HSE IP Driver for the S32K3xx MCU. This DEMO make use of SHE based keys & the RAM keys.  Step-1> Uncomment this MACRO to program the MASTER_ECU_KEY & BOOT_MAC_KEY #define FORMAT_HSE_KEY_CATALOG (1U) Step-2> Then comment the above mentioned MACRO to test the demo. Step-3> End of the DEMO in Switch case HSE_ERASE : keys are erased. HSE_EraseKeys(); SHE based secured boot :-- This demo uses the SHE based secured boot. You can test this after performing step-1. Once SHE is enabled code will be stuck at this point, after this issue an RESET.    ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************
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