S32K知识库

讨论

Welcome to the S32K Microcontrollers forum. Get expert advice from the NXP developer community. Our support team also monitors these forums to provide answers and take your feedback. Anyone can read the discussions, but only registered NXP Community members can post questions and comments. Before you ask a question, please search the community to find if someone has already offered a solution. If you don’t see a solution, then ask the community your question. S32K Web page S32K Reference manual S32K Data sheet S32K Application notes and other documents S32K Evaluation Board S32 Design Studio IDE https://community.nxp.com/docs/DOC-334170

******************************************************************************** * Detailed Description: * * This example shows how to use the back-to-back mode of the PDB to trigger * sequence of ADC channels conversion. 4 PDB channel 0 pre-triggers/triggers are * generated upon single PDB SW trigger. The first trigger is started by the PDB, * no delay is used. Next 3 triggers start after corresponding acknowledgment is * received from ADC0. * * Converted data is used to change color of the EVB led based on Trimmer position. * * ------------------------------------------------------------------------------ * Test HW: FRDM-S32K144 * MCU: PS32K144HFVLL 0N77P * Fsys: default * Debugger: S32DS * Target: internal_FLASH * ********************************************************************************

Hi, ARM Cortex-M have a DWT (Data Watchpoint and Trace) unit implemented, and it has a nice feature in that unit which counts the execution cycles. The DWT is usually implemented on most Cortex-M3, M4 and M7 devices, including e.g. the NXP S32K14x. Attachment is the sample project on S32K142 to measure the running time of a function. Password of extraction is nxp. Enjoy the measuring! Cheers! Oliver BTW, Measure the running time of one function on PowerPC could also be gotten through the link.

************************************************************************************************ Detailed Description: WDOG tested in SystemInit() function (system_S32K116.c) after POR. For debugging purposes: - WDOG counter reference clock is pre-scaled to slow the test (CS_PRES = 1). - During CNT_LOW test, BLUE LED (PTE8) ON. - During CNT_HIGH test, RED LED (PTD16) ON. - Once both tests have passed, GREEN LED (PTD15) ON. If either of the test fails, WDOG will stay in its default configuration and rest the MCU. ---------------------------------------------------------------------------------------------------------------- Test HW: S32K116EVB-Q048 REV.B MCU: S32K116 0N96V Debugger: S32DSR1, OpenSDA Target: internal_FLASH ************************************************************************************************

******************************************************************************** Detailed Description: The S32K144 MCU is secure if SEC bits are set to non 0b10 value in Flash Secure Register (FSEC). And can be unsecure using either Mass Erase or Verify Backdoor Access Key command provided they are enabled, again indicated by bits KEYEN and MEEM in the FSEC register. The FSEC register is a read-only register and is loaded with the content of the flash security byte in the Flash Configuration Field located in program flash memory during the reset sequence. The configuration field holds the Backdoor comparison key as well and is configurable in startup_S32K144.S file. The attached example code shows use of Verify Backdoor Access Key flash command. The MCU is secured in the Flash configuration field and therefore once the application has been loaded the debugger does not have access to the MCU which must be run stand-alone. The state of the SEC bits is indicated by LEDs. The RED LED indicates the MCU is secure (SEC != 0b10) after reset. After a delay loop, the Verify Backdoor key command is executed which will unsecure the device and the LED will turn BLUE (SEC = 0b10). NOTE: The Verify Backdoor key command is executed from RAM to avoid simultaneous access to the PFlash block. -------------------------------------------------------------------------------------------- Test HW: S32144EVB-Q100 MCU: S32K144 0N47T Debugger: S32DS1.3, OpenSDA Target: internal_FLASH ******************************************************************************** 2.0 Sep-30-2017 Daniel ********************************************************************************

/******************************************************************************** Detailed Description: Example shows possible implementation of multiple ADC conversions using SDK. Here 25 channels are sampled periodically. 2 ADC modules and 2 PDBs are used. ADC0 is configured to sample 16 channels, ADC1 9 channels. PDBs are set to back-to-back mode to perform chain conversion. Within ADC component you need to select ADC input to be measured for each item in configuration list. For ADC0 channels ADC ch12 is selected, as it is connected to trimmer on the EVB. DMA is used to read result into single buffer, and DMA callbacks are issued to indicate end of transfer for each ADC module. Within those callbacks PTE14 and PTE15 is toggled. PDB0 output pulse is generated on the PTE16 to indicate start of ADC measurement. This is done periodically at LPIT ch0 rate, which is set to 30us. The ADC0 ch0 result is used to dim LEDs. * ------------------------------------------------------------------------------ * Test HW: S32K144EVB-Q100 * MCU: FS32K144UAVLL 0N57U * Target: Debug_FLASH * EVB connection: * Compiler: S32DS.ARM.2018.R1 * SDK release: S32SDK_S32K1xx_RTM_3.0.0 * Debugger: Lauterbach Trace32 ******************************************************************************** Revision History: Ver Date Author Description of Changes 0.1 May-04-2019 Petr Stancik Initial version *******************************************************************************/

S32K1xx S32K144 Example S32K144 CMP Round-robin S32DS2.0 Example S32K144 Verify Backdoor Access Key S32DS1.3 Example S32K144 FlexCAN0 RXFIFO DMA nonSDK S32DS13 Example S32K144 PDB ADC trigger DMA ISR S32DS Example S32K144 Flash RW simple S32DS Example S32K144 DMA memory copy test S32DS Example S32K144 EEEPROM usage Example S32K144 EEEPROM usage - No SDK Example S32K144 RTC VLPS Example S32K144 WDOG RCM interrupt Example S32K144 SRAM ECC Injection Example S32K144 RAM Retention S32DS.R1 Example S32K144 I2C Master MPL3115A2 S32DSR1_v3 Example S32K144 FlexCAN RXFIFO DMA S32DS.ARM.2018.R1 Example S32K144_printf_implementation - S32DS_1.0 Example S32k144 UART printf/scanf under FreeRTOS - S32DS Example S32K144 SDK Function call on configurable period using LPIT timer. Example S32K144 .noinit section usage Example S32K144 PDB ADC DMA S32DS.ARM.2018.R1 Example S32K144 RAM selftest simple S32DS 2018.R1 Example S32K144 Position Independent Code Example S32K144 FlexCAN Pretended Networking STOP mode test S32DS.ARM.2.2 Example S32K144 LPIT DMA LPSPI Example S32K144 FlexCAN TX/RX/Error ISR test S32DS2.2 Example S32K144 FlexIO Idle Detection S32DS2.2 S32K146 Example S32K146 Set_whole_FlexRAM-as_RAM S32DS.ARM.2.2 S32K148 Example S32K148 PDB0-PDB1 ring S32DS3.4 RTM4.0.3 Example S32K148 PDB0-PDB1 ring DMA S32DS3.4 RTM4.0.3 Example S32K148 GPIO Interrupt S32K116 Example S32K116 WDOG Fast Test Example S32K116 LPUART LIN Slave TXRX ISR S32DS.ARM.2.2 Example S32K116 FlexCAN PN STOP S32DS.ARM.2.2 Example S32K116 FlexCAN VLPR test S32DS.ARM.2.2 S32K118 Example S32K118-SRAM-keep_data_over_SW_reset v0_1 S32DS.ARM.2.2 S32K3xx S32K344 Example S32K344 PIT BTCU ADC DMA DS3.4 RTD100 Example S32K344 FlexCAN_Ip TX/RX/EnhanceRXFIFO test S32DS3.4 RTD200 Example Siul2_Port_Ip_Example_S32K344_ITCM_DTCM S32DS3.4 RTD300

******************************************************************************* The purpose of this demo application is to present a usage of the MEM_InFls MCAL Driver for the S32K3xx MCU. The example uses MEM_InFls driver to write 128 bytes to FLASH memory address 0x50_0000 . ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Results :-- Ram location where FLASH writing erase code is placed :-- I placed the code at 256 byte below the MAX address of the flash size 0x20417DAA = 541162922 Size of RAM need to save the flashing routine, as per the MAP & linker file :-- 0x00407e64 - 0x00407e38 = 44 bytes S32K3 FLASH Memory Terminology :--

******************************************************************************************************* * Detailed Description: * DCF Record decouples CM7_0 and CM_1 on S32K344 * Find first available location in UTEST. * By default, first available address is 0x1B000768U * * NOTE: There is a bug in the RTD version. * Change FLS_MAX_VIRTUAL_SECTOR to 528 in C40_Ip_Cfg.h * ------------------------------------------------------------------------------ * Test HW: : S32K344EVB-Q257 * MCU: : S32K344 * Project : RTD AUTOSAR 4.7 * Platform : CORTEXM * Peripheral : S32K3XX * Dependencies : none * Autosar Version : 4.7.0 * Autosar Revision : ASR_REL_4_7_REV_0000 * Autosar Conf.Variant : * SW Version : 4.0.0 * Build Version : S32K3_RTD_4_0_0_P20_D2403_ASR_REL_4_7_REV_0000_20240315 *******************************************************************************************************

******************************************************************************* The purpose of this demo application is to present a usage of the UART IP Driver for the S32K3xx MCU. The example uses LPUART0 for transmit 20 packets with each packet of 21 bytes using the Interrupt in cyclic order. Also when receiving UART packet generate Idle interrupt when variable length of data is received. I used coolterm tool to send the string of data. If Data send by cool term is less than 20 bytes which is set by API call Lpuart_Uart_Ip_AsyncReceive(), then Ideal interrupt is received RTD driver modified in RTD --> Lpuart_Uart_Ip.c. Baudrate : 921600 ------------------------------------------------------------------------------ * Test HW: S32K31XEVB-Q100 * MCU: S32K311 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Idle Interrupt received :--

************************************************************************************************* * Detailed Description: * DCF record disables or enables POR_WDG depending on the POR_WDG_EN macro in main.c. * Find first available location in UTEST, by default, first available address is 0x1B000780 * * NOTE: There is a bug in this RTD version. * Change FLS_MAX_VIRTUAL_SECTOR to 272 in C40_Ip_Cfg.h * ------------------------------------------------------------------------------ * Test HW: : S32K312EVB-Q172 * MCU: : S32K312 * Project : RTD AUTOSAR 4.7 * Platform : CORTEXM * Peripheral : S32K3XX * Dependencies : none * * Autosar Version : 4.7.0 * Autosar Revision : ASR_REL_4_7_REV_0000 * Autosar Conf.Variant : * SW Version : 3.0.0 * Build Version : S32K3_RTD_3_0_0_D2303_ASR_REL_4_7_REV_0000_20230331 *************************************************************************************************

------------------------------------------------------------------------------ * Test HW: S32K31XEVB-Q100 * MCU: S32K311 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE Micro * Target: internal_FLASH ******************************************************************************** S32K31XEVB-Q100 :-- S32K31XEVB-Q100 Evaluation Board for Automotive General Purpose | NXP Semiconductors S32K312 UART Transmit & Receive Using DMA :-- S32K311 UART Transmit & Receive Using DMA - NXP Community S32K311 UART Idle state Interrupt :-- S32K311 UART Idle state Interrupt - NXP Community

******************************************************************************* The purpose of this demo application is to present a usage of the Bootloader Jump to Application. ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-Q172 * MCU: S32K324 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Jump is decided based on the boot_header, size we use to jump to the RESET handler:-- Cortex M-7 Interrupt vector table, RESET handler is 4 byte offset from starting of vector table :-- How to burn elf file of both application & bootloader code :-- Bootloader Linker file used :-- Application Linker file used :-- This linker file has provision to distribute RAM to both the cores Application & bootloader both commented this, as CORE-1 should be started in CORE-0 main() function if required :-- System.c file this changed (as in RTD-3.0.0 bug in startup file because of which HARDfault occurs in startup process for S32K324) :--

******************************************************************************* The purpose of this demo application is to present a usage of the FlexCAN IP Driver for the S32K3xx MCU. The example uses FLEXCAN-0 for transmit & receive using following Message buffer :-- #define RX_MB_IDX_0 10U #define RX_MB_IDX 11U #define TX_MB_IDX 12U BAUDRATE : 500 KBPS ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************

******************************************************************************* The purpose of this demo application is to present a usage of the UART IP Driver for the S32K3xx MCU. The example uses LPUART6 for transmit & receive five bytes using the Interrupt. ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************

------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE Micro * Target: internal_FLASH ******************************************************************************** S32K324 SPI Transmit & Receive, using Interrupt :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K324-I2C-Transmit-amp-Receive-Using-DMA-DS3-5-RTD300/ta-p/1818631 Example S32K324 Bootloader to Application Jump DS3.5 RTD300 :-- https://community.nxp.com/t5/S32K-Knowledge-Base/Example-S32K324-Bootloader-to-Application-Jump-DS3-5-RTD300/ta-p/1832649

******************************************************************************* The purpose of this demo application is to present a usage of the LPI2C-0 as MASTER and LPI2C-1 Slave, using DMA for TX & RX for the S32K324 MCU. ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-Q257 * MCU: S32K324 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************

特色文章

The S32K3 family of 32-bit AEC-Q100 qualified MCUs combines a scalable family of Arm® Cortex-M7-based microcontrollers built on long-lasting features with a comprehensive suite of production-grade tools. S32K3 MCUs are included in NXP’s Product Longevity Program, guaranteeing a minimum of 15 years of assured supply. The S32K3 offers dedicated peripherals set for rapid motor control loop implementation: enhanced Modular IO Subsystem(eMIOS), Logic Control Unit (LCU), TRGMUX, BodyCross-triggering Unit (BCTU), Analog to Digital Converter(ADC), and Analog Comparator (CMP). The comprehensive motor control ecosystem based on Automotive Math and Motor Control Library(AMMCLib) set, FreeMASTER with Motor Control ApplicationTuning (MCAT) tool and Model-Based Design Toolbox (MBDT) helps to enable S32K3 MCU in wide range of motor control use cases. The table below points to the articles with more detailed description each of S32K3 motor control use cases, hardware description, links to appropriate application notes and their addendums, and software repositories. Device HW Article S32K344 MCSPTE1AK344 12 V development kit engineered for 3-phase PMSM and BLDC motor control applications FOC with dual shunt current measurement Article focuses on solution based Field Oriented Control (FOC) technique (typically used for 3-phase PMSM motors) with dual shunt current measurement and without any position sensor (sensorless). The Encoder sensor is supported by SW option, but missing on HW kit. The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with high-level Autosar complient API or low-level non-Autosar API. FOC with single shunt current measurement Article focuses on solution based Field Oriented Control (FOC) technique (typically used for 3-phase PMSM motors) with single shunt current measurement and without any position sensor (sensorless). The Encoder sensor is supported by SW option, but missing on HW kit. The single shunt current measurement is advanced technique that allows decrese the cost of Bill of Material (BOM). The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with high-level Autosar complient API or low-level non-Autosar API. FOC integrated with FreeRTOS Article focuses on integration of motor control software (based on FOC with dual shunt current measurement) and Real Time Operating System (FreeRTOS). The available example code is based ANSI-C code and uses RTD drivers with low-level non-Autosar API. Six-step commutation control. Article focuses on solution based Six-step commutation (6-step) technique (typically used for 3-phase BLDC motors) with Hall position sensor and without any position sensor (sensorless). The available example codes covers both ANSI-C and Matlab Simulink approaches and uses RTD drivers with low-level non-Autosar API. Note: the list of use cases cannot cover all combinations of MCU, current measurement scenario, control technique and sensor inputs, but should work as a base reference for most common configurations. This list is not final, please follow this acticle to be notified about updates with new use cases.

S32K知识库

S32K Knowledge Base

讨论

S32K Launched!

Example S32K144 PDB ADC back-to-back test S32DS12

Measure the running time of one function on S32K

Example S32K116 WDOG Fast Test

Example S32K144 Verify Backdoor Access Key S32DS1.3

Example S32K144 PDB ADC DMA S32DS.ARM.2018.R1

S32K Examples

Where can I get s32k14x data sheet or reference manual?

Example MCAL S32K312 MEM_InFls DS3.5 RTD300

All Example MCAL S32K312 DS3.5 RTD-3.0.0

Example_S32K344_decouple_RTD400_Ip_C40_DS35_v1

S32K311 UART Idle state Interrupt

Example_S32K312_DCF_POR_WDG_EN_DS35_RTD300

All Example S32K311 DS3.5 RTD-3.0.0

S32K311 UART Transmit & Receive Using DMA

Example S32K324 Bootloader to Application Jump DS3.5 RTD300

Example S32K312 CAN Transmit & Receive Using MB Interrupt DS3.5 RTD300

Example S32K312 UART Transmit & Receive Using Interrupt DS3.5 RTD300

All Example S32K324 DS3.5 RTD-3.0.0

Example S32K324 I2C Transmit & Receive Using DMA DS3.5 RTD300

S32K3 Motor control SW examples