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Welcome to the S32K Microcontrollers forum. Get expert advice from the NXP developer community. Our support team also monitors these forums to provide answers and take your feedback.   Anyone can read the discussions, but only registered NXP Community members can post questions and comments. Before you ask a question, please search the community to find if someone has already offered a solution. If you don’t see a solution, then ask the community your question. S32K Web page S32K Reference manual S32K Data sheet S32K Application notes and other documents S32K Evaluation Board S32 Design Studio IDE https://community.nxp.com/docs/DOC-334170 
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******************************************************************************** * Detailed Description: * * This example shows how to use the back-to-back mode of the PDB to trigger * sequence of ADC channels conversion. 4 PDB channel 0 pre-triggers/triggers are * generated upon single PDB SW trigger. The first trigger is started by the PDB, * no delay is used. Next 3 triggers start after corresponding acknowledgment is * received from ADC0. * * Converted data is used to change color of the EVB led based on Trimmer position. * * ------------------------------------------------------------------------------ * Test HW:         FRDM-S32K144 * MCU:             PS32K144HFVLL 0N77P * Fsys:            default * Debugger:        S32DS * Target:          internal_FLASH * ********************************************************************************
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Hi,        ARM Cortex-M have a DWT (Data Watchpoint and Trace) unit implemented, and it has a nice feature in that unit which counts the execution cycles. The DWT is usually implemented on most Cortex-M3, M4 and M7 devices, including e.g. the NXP S32K14x.      Attachment is the sample project on S32K142 to measure the running time of a function.     Password of extraction is nxp.     Enjoy the measuring!   Cheers! Oliver BTW, Measure the running time of one function on PowerPC could also be gotten through the link.
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************************************************************************************************ Detailed Description: WDOG tested in SystemInit() function (system_S32K116.c) after POR. For debugging purposes: - WDOG counter reference clock is pre-scaled to slow the test (CS_PRES = 1). - During CNT_LOW test, BLUE LED (PTE8) ON. - During CNT_HIGH test, RED LED (PTD16) ON. - Once both tests have passed, GREEN LED (PTD15) ON. If either of the test fails, WDOG will stay in its default configuration and rest the MCU. ---------------------------------------------------------------------------------------------------------------- Test HW: S32K116EVB-Q048 REV.B MCU: S32K116 0N96V Debugger: S32DSR1, OpenSDA Target: internal_FLASH ************************************************************************************************
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******************************************************************************** Detailed Description: The S32K144 MCU is secure if SEC bits are set to non 0b10 value in Flash Secure Register (FSEC). And can be unsecure using either Mass Erase or Verify Backdoor Access Key command provided they are enabled, again indicated by bits KEYEN and MEEM in the FSEC register. The FSEC register is a read-only register and is loaded with the content of the flash security byte in the Flash Configuration Field located in program flash memory during the reset sequence. The configuration field holds the Backdoor comparison key as well and is configurable in startup_S32K144.S file. The attached example code shows use of Verify Backdoor Access Key flash command. The MCU is secured in the Flash configuration field and therefore once the application has been loaded the debugger does not have access to the MCU which must be run stand-alone. The state of the SEC bits is indicated by LEDs. The RED LED indicates the MCU is secure (SEC != 0b10) after reset. After a delay loop, the Verify Backdoor key command is executed which will unsecure the device and the LED will turn BLUE (SEC = 0b10). NOTE: The Verify Backdoor key command is executed from RAM to avoid simultaneous access to the PFlash block. -------------------------------------------------------------------------------------------- Test HW:      S32144EVB-Q100 MCU:           S32K144 0N47T Debugger:    S32DS1.3, OpenSDA Target:          internal_FLASH ******************************************************************************** 2.0     Sep-30-2017     Daniel ********************************************************************************
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/******************************************************************************** Detailed Description: Example shows possible implementation of multiple ADC conversions using SDK. Here 25 channels are sampled periodically. 2 ADC modules and 2 PDBs are used. ADC0 is configured to sample 16 channels, ADC1 9 channels. PDBs are set to back-to-back mode to perform chain conversion. Within ADC component you need to select ADC input to be measured for each item in configuration list. For ADC0 channels ADC ch12 is selected, as it is connected to trimmer on the EVB. DMA is used to read result into single buffer, and DMA callbacks are issued to indicate end of transfer for each ADC module. Within those callbacks PTE14 and PTE15 is toggled. PDB0 output pulse is generated on the PTE16 to indicate start of ADC measurement. This is done periodically at LPIT ch0 rate, which is set to 30us. The ADC0 ch0 result is used to dim LEDs. * ------------------------------------------------------------------------------ * Test HW:       S32K144EVB-Q100 * MCU:           FS32K144UAVLL 0N57U * Target:        Debug_FLASH * EVB connection: * Compiler:      S32DS.ARM.2018.R1 * SDK release:   S32SDK_S32K1xx_RTM_3.0.0 * Debugger:     Lauterbach Trace32 ******************************************************************************** Revision History: Ver Date          Author          Description of Changes 0.1 May-04-2019   Petr Stancik    Initial version *******************************************************************************/
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S32K1xx   S32K144 Example S32K144 CMP Round-robin S32DS2.0  Example S32K144 Verify Backdoor Access Key S32DS1.3  Example S32K144 FlexCAN0 RXFIFO DMA nonSDK S32DS13  Example S32K144 PDB ADC trigger DMA ISR S32DS  Example S32K144 Flash RW simple S32DS  Example S32K144 DMA memory copy test S32DS  Example S32K144 EEEPROM usage Example S32K144 EEEPROM usage - No SDK  Example S32K144 RTC VLPS  Example S32K144 WDOG RCM interrupt  Example S32K144 SRAM ECC Injection  Example S32K144 RAM Retention S32DS.R1 Example S32K144 I2C Master MPL3115A2 S32DSR1_v3  Example S32K144 FlexCAN RXFIFO DMA S32DS.ARM.2018.R1  Example S32K144_printf_implementation - S32DS_1.0  Example S32k144 UART printf/scanf under FreeRTOS - S32DS Example S32K144 SDK Function call on configurable period using LPIT timer.  Example S32K144 .noinit section usage Example S32K144 PDB ADC DMA S32DS.ARM.2018.R1   Example S32K144 RAM selftest simple S32DS 2018.R1  Example S32K144 Position Independent Code  Example S32K144 FlexCAN Pretended Networking STOP mode test S32DS.ARM.2.2  Example S32K144 LPIT DMA LPSPI  Example S32K144 FlexCAN TX/RX/Error ISR test S32DS2.2  Example S32K144 FlexIO Idle Detection S32DS2.2   S32K146 Example S32K146 Set_whole_FlexRAM-as_RAM S32DS.ARM.2.2   S32K148 Example S32K148 PDB0-PDB1 ring S32DS3.4 RTM4.0.3  Example S32K148 PDB0-PDB1 ring DMA S32DS3.4 RTM4.0.3  Example S32K148 GPIO Interrupt     S32K116 Example S32K116 WDOG Fast Test  Example S32K116 LPUART LIN Slave TXRX ISR S32DS.ARM.2.2  Example S32K116 FlexCAN PN STOP S32DS.ARM.2.2 Example S32K116 FlexCAN VLPR test S32DS.ARM.2.2   S32K118 Example S32K118-SRAM-keep_data_over_SW_reset v0_1 S32DS.ARM.2.2   S32K3xx   S32K344 Example S32K344 PIT BTCU ADC DMA DS3.4 RTD100   Example S32K344 FlexCAN_Ip TX/RX/EnhanceRXFIFO test S32DS3.4 RTD200     Example Siul2_Port_Ip_Example_S32K344_ITCM_DTCM S32DS3.4 RTD300    
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Where can I get s32k14x data sheet or reference manual???
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*******************************************************************************  The purpose of this demo application is to present a usage of the  POWER & WKUP IP Driver for the S32K3xx MCU. In current example :-- SW-5 = PTB-26  -----> PRESS to enter the STANDBY mode. SW-6 = PTB-19 = WKUP[38] --> PRESS to exit the STANDBY mode. CAN-0-RX = PTA-6 = WKUP[15] --> send CAN message to exit the STANDBY mode The example uses PIT-0 timer, to generate the periodic interrupt. The example uses FLEXCAN-0 for transmit & receive using following Message buffer :-- #define RX_MB_IDX_0 10U #define RX_MB_IDX 11U #define TX_MB_IDX 12U BAUDRATE : 500 KBPS  ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K324 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** CAN BUS :--   Push Buttons :---         Wake-up source, SW-6 GPIO:--   Wake-up source, CAN-0-RX :-- According to the IOMUX table in RM, for example, PTA6 can be used as WKPU15 and CAN0_RX. It means that the WKPU15 input doesn't require specific MSCR configuration. So if its input buffer is enabled and the corresponding WKPU input channel is enabled/configured in the WKPU, it should be able to act as wake-up input.   Standby entry :--   STandby clock :--   Enter Standby mode :--   ********* If you use external BJT on your board to generate 1.5 volts *******************     I tested on Our T172 EVB, with NPN external Ballast transistor is selected to supply the V15_MCU domain. I am able to wake up from standby mode. If we select 2-3 in J31 then NPN external Ballast transistor is selected to supply the V15_MCU domain & wakeup is ok on T172 EVB You have to make following settings in code :--      
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******************************************************************************** * Detailed Description: * The example updates th UART TX buffer for continuous transfer. * ---------------------------------------------------------------------- * Test HW: S32K344EVB-Q172 * MCU: S32K344, RTD 4.0.0 P24 * Debugger: S32DS_ARM_3.5 * Target: internal_FLASH ********************************************************************************
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*******************************************************************************  The purpose of this demo application is to present a usage of the  POWER & WKUP IP Driver for the S32K3xx MCU. In current example :-- SW-5 = PTB-26  -----> PRESS to enter the STANDBY mode. SW-6 = PTB-19 = WKUP[38] --> PRESS to exit the STANDBY mode. The example uses PIT-0 timer, to generate the periodic interrupt.  ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K324 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Push Buttons :---     Wake-up source, SW-6 GPIO:--     ********* If you use external BJT on your board to generate 1.5 volts *******************   I tested on Our T172 EVB, with NPN external Ballast transistor is selected to supply the V15_MCU domain. I am able to wake up from standby mode. If we select 2-3 in J31 then NPN external Ballast transistor is selected to supply the V15_MCU domain & wakeup is ok on T172 EVB You have to make following settings in code :--      
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*******************************************************************************  The purpose of this demo application is to present a usage of the  POWER & WKUP IP Driver for the S32K3xx MCU. In current example :-- SW-6 = PTB-19 -----> PRESS to enter the STANDBY mode. SW-5 = PTB-26 = WKUP[41] --> PRESS to exit the STANDBY mode. CAN-0-RX = PTA-6 = WKUP[15] --> send CAN message to exit the STANDBY mode. The example uses PIT-0 timer, to generate the periodic interrupt. The example uses FLEXCAN-0 for transmit & receive using following Message buffer :-- #define RX_MB_IDX_0 10U #define RX_MB_IDX 11U #define TX_MB_IDX 12U BAUDRATE : 500 KBPS  ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************     Push button :--   Wake-up source, CAN-0-RX :-- According to the IOMUX table in RM, for example, PTA6 can be used as WKPU15 and CAN0_RX. It means that the WKPU15 input doesn't require specific MSCR configuration. So if its input buffer is enabled and the corresponding WKPU input channel is enabled/configured in the WKPU, it should be able to act as wake-up input. Wake-up source, SW-5 GPIO:-- Standby entry :--   STandby clock :-- Enter Standby mode :--  
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 ------------------------------------------------------------------------------ * MCU: S32K310 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Example MCAL S32K310 MEM_InFls DS3.5 RTD300 :-- Example MCAL S32K310 MEM_InFls DS3.5 RTD300 - NXP Community
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*******************************************************************************  The purpose of this demo application is to present a usage of the MEM_InFls MCAL Driver for the S32K3x1 MCU.  The example uses MEM_InFls driver to write 128 bytes to FLASH memory address  0x47_A000   starting of FLS_CODE_ARRAY_0_BLOCK_0_S61.  ------------------------------------------------------------------------------ * MCU: S32K310 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ******************************************************************************** Flash end address = 0x480000 Size of each block = 8192 = 0x2000 Start Address of 63 block = 0x480000 - 0x2000 = 0x47E000 = 4710400 Start Address of 62 block = 0x480000 - 0x4000 = 0x47C000 = 4702208 Start Address of 61 block = 0x480000 - 0x6000 = 0x47A000 = 4694016   Ram location where FLASH writing erase code is placed :-- I placed the code at 0x256 byte below the MAX address of the RAM size 16*1024 = 16384 = 0x4000 End of RAM = 0x20400000 + 0x4000 = 0x20404000  0x20404000 - 0x256 = 0x20403DAA 0x20403DAA = 541081002   Size of RAM need to save the flashing routine, as per the MAP & linker file :-- 0x00407b80 - 0x00407b54 = 0x2C = 44 byte  S32K3 FLASH Memory Terminology :--        
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------------------------------------------------------------------------------ * Test HW: S32K31XEVB-Q100 * MCU: S32K311 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE Micro * Target: internal_FLASH ******************************************************************************** S32K31XEVB-Q100 :-- S32K31XEVB-Q100 Evaluation Board for Automotive General Purpose | NXP Semiconductors Example MCAL S32K311 MEM_InFls DS3.5 RTD300 :-- Example MCAL S32K311 MEM_InFls DS3.5 RTD300 - NXP Community
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*******************************************************************************  The purpose of this demo application is to present a usage of the MEM_InFls MCAL Driver for the S32K3x1 MCU.  The example uses MEM_InFls driver to write 128 bytes to FLASH memory address  0x48_0000 .  ------------------------------------------------------------------------------ * Test HW: S32K31XEVB-Q100 * MCU: S32K311 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************     Results :--     Ram location where FLASH writing erase code is placed :-- I placed the code at 256 byte below the MAX address of the RAM size 0x20407DAA = 541097386             Size of RAM need to save the flashing routine, as per the MAP & linker file :-- 0x00406ff0 - 0x00406f78 = 120 bytes                S32K3 FLASH Memory Terminology :--        
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------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K344 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE Micro * Target: internal_FLASH ******************************************************************************** Example S32K344 UART Transmit & Receive Using DMA DS3.5 RTD300 :-- Example S32K344 UART Transmit & Receive Using DMA DS3.5 RTD300 - NXP Community Example S32K344 UART Transmit & Receive Using Interrupt DS3.5 RTD300 :-- Example S32K344 UART Transmit & Receive Using Interrupt DS3.5 RTD300 - NXP Community
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*******************************************************************************  The purpose of this demo application is to present a usage of the  UART IP Driver for the S32K3xx MCU.  The example uses LPUART6 for transmit & receive five bytes using the Interrupt.  ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K344 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************         Putty output :--  
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*******************************************************************************  The purpose of this demo application is to present a usage of the  UART IP Driver for the S32K3xx MCU.  The example uses LPUART6 for transmit & receive five bytes using the DMA.  ------------------------------------------------------------------------------ * Test HW: S32K3X4EVB-T172 * MCU: S32K344 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************     Putty output :--  
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*******************************************************************************  The purpose of this demo application is to present a usage of the FEE MCAL Driver for the S32K3xx MCU. This example read & write 4 byte FEE BLock. I have renamed the FEE block using a MACRO as FOUR_BYTE_EEPROM_FEE_VARIABLE. The example uses MEM_InFls driver to write 128 bytes to FLASH memory address  0x52_0000 .  ------------------------------------------------------------------------------ * Test HW: S32K3X2EVB-Q172 * MCU: S32K312 * Compiler: S32DS3.5 * SDK release: RTD 3.0.0 * Debugger: PE micro * Target: internal_FLASH ********************************************************************************    
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