S32K3 ADC accuracy listed in PPAP

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S32K3 ADC accuracy listed in PPAP

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kuniakihirabaya
NXP Employee
NXP Employee

In P2210052M_0_0 General Market S32K344 Global Foudnries Fab-7 P55A 172MAXQFP PPAP.pdf which can be found in Safe Assure NDA, you can find list of TUE (ADC Total Unadjusted Error)@5V and 3V in p4836.

In this document two different TUEs are listed for each voltage.

Would you please confirm what is difference between top and bottom?

image.png

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3 Replies

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Yashwant_Singh
NXP Employee
NXP Employee

Hi Kuniaki, 

It was checked with NPI team, that should be TUEP and TUEN. Normally the TUEN value is less than TUEP

Yashwant_Singh_6-1662108286486.png

Hope this helps.

Thanks!

-Yashwant

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kuniakihirabaya
NXP Employee
NXP Employee

Thank you for providing answer.

Would you please describe detail of what are TUEP and TUEN?

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Yashwant_Singh
NXP Employee
NXP Employee

Hi Kuniyaki,

It was confirmed with the IP onwer that TUEP is the maximum positive error and TUEN is the “maximum” negative error (greatest deviation to the negative side from ideal). TUE is basically the umbrella of it. The TUEN/TUEP is a testing thing so to say.

We have a constructed offset effect due to the fact that the VREFL signal does not come privately out of the chip and is shared with analog ground. The current flowing on analog ground is offsetting

the reference as the ADC sees it which makes the TUE curve skewed a bit (which is also the case why the very small package where a further ground is shared has a less good TUE spec). This is why it was TUEP is worse than TUEN.

Hope this helps !

Thanks

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