About this problem,I found it in this community improved by PCN 15581.I want to know,・Whether it is an improved device from the product year/week marking on the IC.
・Result of analysis by NXP. Cause, improvement, details of this problem,
Dear Takeshi-san,
This issue is being discussed internally with Norihiro-san through the Case #00114001.
Best regards,
Tomas
