S32G BIST test questions

[jiaruo]

Dear Support Team:

We want to know the usages and advantages of BIST test methods as follows:

1. Offline Test: We just did a BIST offline test by the NXP default Safety DCD bin, after the self-test done, there would be a Functional reset. And we got the BIST test results in App (bistStatus = Bist_GetExecStatus(BIST_SAFETYDCD_CFG);) . The bistStatus was BIST_OK. In this situation, it would be increase 20ms startup time. Then, we used the Safety DCD bin which configured by ourselves.  But we found the bistStatus was BIST_INTEGRITY_FAIL when we got the BIST results in App. The configuration file is attached. Could you help to check it and supply a DCD bin according to our configurations, please?  Thanks a lot.

2. Runtime Test: There are many prerequisities of this test. We want to know the less test prerequisities and items of this situation. Because we want to reduce the self-test time.

3. Shutdown Test: There isn't any detail example of this test in the BIST UM. We want to know if we use this test, it will affect the shutdown schedule or not. Shall we need to prepare some prerequisities for this situation? Thanks a lot for your reply.

[martinkaspar-r3]

Hello,

here are the NXP responses:

1. We support only the validated configurations as documented in the Bist user manual. These configuration are fully tested by NXP HW validation team to guarantee proper functionality across all conditions

2. Yes, all the prerequisites are documented in the Bist user manual, section “3.4 BIST Self-Test programing sequence” and they should be followed

3. The shutdown test is also considered as “online (runtime)” test so the same prerequisites apply as documented in the section “3.4 BIST Self-Test programing sequence”