HSE lifecycle state

[ale_di_vi]

Hello,

In our company we are working on a project having the HSE_B module (micro MWCT2016S) and I wanted to ask some questions regarding the life cycle (LC) state:

- How the system attribute to manage this state can be triggered? Can it be done via UDS?

-  I see that advancing to PRE_FA and FA can only be done by NXP, how? What type of test features are "unlocked" in those states?

- Is it possible to have internal test analysis of pieces coming from field mantaining the LC state to IN_FIELD? 

Thank you in advance for your feedback.

[ale_di_vi]

Hi @lukaszadrapa,

Thank you for your feedback. As far as I understood from your responses, testing analysis can only be done in NXP facility and not by OEM/TIER1 supplier. I am right?

Also, is the management of the LC state actually needed to lock the JTAG port? Can it be protected without taking care of the LC state?

[lukaszadrapa]

Yes, that's correct.
The debug port is unrestricted in CUST_DEL LC. To enable debug authorization, the LC must be advanced to OEM_PROD or IN_FIELD (and set the password or key etc.).
Notice that the debug port can't be disabled completely. It is only possible to enable the debug authorization.

[lukaszadrapa · Accepted solution]

Hi @ale_di_vi 

- How the system attribute to manage this state can be triggered? Can it be done via UDS?
[Lukas] If HSE firmware is installed, the life cycle can be advanced by HSE system attribute management services (HSE_SRV_ID_SET_ATTR and HSE_SECURE_LIFECYCLE_ATTR_ID). It’s up to user to trigger this service by software. It doesn’t matter what kind of protocol or communication interface is used to trigger this service.

- I see that advancing to PRE_FA and FA can only be done by NXP, how? What is the process to advance the status and what type of test features are "unlocked" in those states?
[Lukas] As mentioned, it can be done only by NXP for testing in NXP facility, so we do not share more details.

- Is it possible to have internal test analysis of pieces coming from field mantaining the LC state to IN_FIELD?
[Lukas] No, it’s necessary to advance the LC at least to PRE_FA because internal test features are not available in IN_FIELD LC.

Regards,

Lukas