We are considering equipment with a product life of at least 15 years.
The CPU to be used is considered with LPC84x.
It is the data retention period of flash ROM,
The Kinetis series has a minimum of 20 years typ 100 years.
LPC84x is Min 10 years Typ 20 years.
So the question is
1. Test method complies with JEDEC NVM qualification.
What are the conditions?
2. If temperature conditions are relaxed, will there be a minimum of 20 years?
Solved! Go to Solution.
1.- For the JEDEC NVM qualification of the LPC-84x, they were subjected while testing to temperatures ranging from -40°C to 150°C.
2.- As you say, typically, you can expect a data retention time of 20 years in regular temperature conditions.
Please look at the image below, and if you want more details, you can refer to the LPC-84x Product Data Sheet: https://www.nxp.com/docs/en/data-sheet/LPC84x.pdf
Thank you for your reply. I was relieved for the time being.
For further discussion, I would like to receive data for the following reasons. Where can I get it? If you need a procedure, please let us know.
We would like to derive standard usage conditions from the results of environmental stress acceleration tests and predict the effective product life.
I would like to receive data or reports that allow us to understand the environmental conditions that would normally be expected to be 20 years.
(I live in Japan. English is not good)
thank you for your answer.
I saw the site, but it is related
"SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD JESD 218 B. 01 Jun 2016"
I think that, but this was paid.
What should I tell you, if the ambient temperature is 55 ° C, how long will the data retention time be?
The information I already mentioned is the only one we have available.
Sorry for any inconveniences this may cause you.