LPC5514 USB High Speed device receive corrupt data

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LPC5514 USB High Speed device receive corrupt data

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yamakatb
Contributor III

Hello,

I am testing the reception of files from the Windows Form Application by referring to "usb_device_cdc_vcom".
(1) In order to confirm the transmission contents of the host, the transmission data of the host was acquired with a USB analyzer and compared with the original file.
→ The host was sending normal data.
(2) In order to check the received contents of the device, the USB reception buffer of the device was acquired by the IDE and compared with the original file.
→ I found that some of the data was not received correctly.
So I decided that the LPC5514 wasn't receiving the data. What could be the problem with this?Diff.png

Details Details
Device : LPC5514SDK Version: 2.9.0 (released 2021-01-15)
Host     : Windows10 PC
Toolchain : IAR Embedded Workbench for ARM
Connecter : USB Type-C
Speed : High Speed
clk_in : 16 [MHz]
main_clk : 96[MHz] 
USB1-HS PHY : 16 [MHz]

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yamakatb
Contributor III

@xiangjun_rong 
Thank you for helping.
The problem was in the hardware.
As a result of verification on another board, the phenomenon did not occur.

View solution in original post

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4 Replies
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yamakatb
Contributor III
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xiangjun_rong
NXP TechSupport
NXP TechSupport

Hi,

It is complicated to track down the cause of data corrupted, anyway, I have asked AE team, they have experience, hope they can shed light for the issue.

BR

Xiangjun Rong

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yamakatb
Contributor III

@xiangjun_rong 

Thank you for your support.

Please let us know if you have the necessary information.

Best regards,

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1,338 Views
yamakatb
Contributor III

@xiangjun_rong 
Thank you for helping.
The problem was in the hardware.
As a result of verification on another board, the phenomenon did not occur.

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