Hi everyone,
So I have been running two methods to calibrate DDR on our product (imx6Solo based board - 2x512 MB = 1GB of DDR3), the one with GUI based tool and the one with u-boot.
I don't know why, but the results are quite different, especially for the Read DQS Gating calibration (MPDGCTRL0 PHY0).
With u-boot method, I get : 0x42280228.
With GUI based method, I get : 0x0238023C.
So U-boot method reports a value 29 times larger.
Also the Write level calibration (MMDC_MPWLDECTRL0 ch0) is 2,5 times bigger with GUI-based method than with U-boot.
I have verified each parameter passed to the aid script, and I invalidated cache in U-boot too, so I don't know what I did wrong in either method ?
Which method should I trust better ?
Regards,
Quentin
Hi Quentin
nxp provides only option on link
i.MX6/7 DDR Stress Test Tool V2.60 | NXP Community
may be recommended to use it.
Best regards
igor
-----------------------------------------------------------------------------------------------------------------------
Note: If this post answers your question, please click the Correct Answer button. Thank you!
-----------------------------------------------------------------------------------------------------------------------
HI Igor,
Thanks for your answer, but I don't understand it. Which option is recommended by NXP ?
Regards,
Quentin
Hi Quentin
it is ddr tool, nxp provides it on link
i.MX6/7 DDR Stress Test Tool V2.60 | NXP Community
Best regards
igor
Hi Igor,
Yes I have tried the two methods specified in the link you provided, method 1 - GUI Based and method 3 - U-Boot.
Both methods are giving different results like I mentioned in my previous post. Which one is better in your opinion ?
Quentin