Hi there,
We are using 16Gb LPDDR4 (speed 3200, x16, 2 Channel, 2 CS) on our custom i.MX8M board. If we were to set "Clock Cycle Freq" in the "MX8M_LPDDR4_register_programming_aid_EVK_preliminiary_v17 " excel sheet to 800MHz, stress test will pass. However, Stress test failed if "Clock Cycle Freq" were set to 1600MHz. Does anyone has similar problem?
1600MHz stress test result:
============ Step 3: DDR parameters processing... ============
[Result] Done
Success: DDR Calibration completed!!!
DDR Stress Test Iteration 1
Actual DDR Clock rate being tested:
- DRC controller0: 800MHz, -DDR0 PHY: 1600MHz
--------------------------------
--Running DDR test on region 1--
--------------------------------
t0.1: data is addr test
....
t0.2: row hop read test
...
t1: memcpy SSN armv8_x32 test
.Address of test1 failure: 0x0000000080740000
Data was: 0xFFFFC0000000FFFE
But pattern was: 0xFFFFFFFF00000001
Source is wrong, it is: 0xFFFF225500000001
Address of source failure:0x0000000040740000
*****************************************************************************************************
800Mhz stress test result:
============ Step 3: DDR parameters processing... ============
[Result] Done
Success: DDR Calibration completed!!!
DDR Stress Test Iteration 1
Actual DDR Clock rate being tested:
- DRC controller0: 400MHz, -DDR0 PHY: 800MHz
--------------------------------
--Running DDR test on region 1--
--------------------------------
t0.1: data is addr test
....
t0.2: row hop read test
...
t1: memcpy SSN armv8_x32 test
....
t2: byte-wise SSN armv8_x32 test
..
t3: memcpy pseudo random pattern test
....................................................................
t4: IRAM_to_DDRv1 test
...
t5: IRAM_to_DDRv2 test
Success: DDR Stress test completed!!!
