deleted

cancel
Showing results for 
Show  only  | Search instead for 
Did you mean: 

deleted

635 Views
jayakumar2
Contributor V

deleted

Labels (2)
0 Kudos
1 Reply

482 Views
igorpadykov
NXP Employee
NXP Employee

Hi Jaya

except changing drive strength from i.MX side, it also can be changed

from EDB8132B4PM ddr: using MR3 (DS). May be useful to check temperature

dependency: if cooling down the part causes more failures, then it is likely the drive strength is
too high causing more overshoots and undershoots. Memtester differs from ddr test that

it also stresses power subsystem. One can pay attention to ripples: requirement for ripple noise

should be less than 5% Vp-p of supply voltage average value. Related power rails affected: all

VDD_xxx_IN and VDD_xxx_CAP and test with slightly increasing VDD_SOC_CAP.

Best regards
igor
-----------------------------------------------------------------------------------------------------------------------
Note: If this post answers your question, please click the Correct Answer button. Thank you!
-----------------------------------------------------------------------------------------------------------------------

0 Kudos