Hi Jaya
except changing drive strength from i.MX side, it also can be changed
from EDB8132B4PM ddr: using MR3 (DS). May be useful to check temperature
dependency: if cooling down the part causes more failures, then it is likely the drive strength is
too high causing more overshoots and undershoots. Memtester differs from ddr test that
it also stresses power subsystem. One can pay attention to ripples: requirement for ripple noise
should be less than 5% Vp-p of supply voltage average value. Related power rails affected: all
VDD_xxx_IN and VDD_xxx_CAP and test with slightly increasing VDD_SOC_CAP.
Best regards
igor
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