MKW36 failure detection in factory

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MKW36 failure detection in factory

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kojiro_kaizuka
Contributor II

We are going to release the product based on MKW36 and we use BLE functionalities.

I think you already applied some test before shipping your LSI, but we also need to test some factory test to confirm we don't damage your LSI in our factory.

1. Would you please let us know what kind of failure modes should we expect?

2. To validate BLE functions, what kind of test will you recommend to do in our factory?

I think direct test mode can be used for this purpose, but I don't know how to setup BLE host stack to use direct test mode. Could you provide the test sample program for the factory test?

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estephania_mart
NXP TechSupport
NXP TechSupport

Hello,

Could you please check this document ? I believe you will find all the information you need there, if there is some extra detail you need, let me know.

Regards,

Estephania

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