Hi NXP team,
Now we are developing a bluetooth board with KW45B41Z83 for smart keyless entry application.
And we flashed kw45b41zevk_hci_bb_bm.bin to our board.
TX cmd works OK and we got corret response cmd.
[10:33:04.322]发→◇01 1E 20 03 00 25 00
[10:33:04.326]收←◆04 0E 04 01 1E 20 00
But RX cmd did not work properly, it seems the dut response timeout or uncorretly.
the test log as Below:
9.RX_LE 2402 1LE ____________________________________________________________
ENABLE_RSSI : 1
FREQ_MHZ : 2402 MHz
CABLE_LOSS_DB : 0.00 dB
RX_PACKET_NUMBER : 50
RX_POWER_LEVEL : -70 dBm
OPTION_STRING :
PACKET_TYPE : 1LE
WAVEFORM_NAME : 1LE.iqvsg
>>>
Sending: 01 1d 20 01 00
<<<
>>>
Received: 04 0e 04 01 1d 20 00
<<<
>>>
Sending: 01 1f 20 00
<<<
>>>
Sending: 01 1f 20 00
<<<
>>>
Received: 04 0e 06 01 1f 20 00 00 00
<<<
Test Time = 8.213 s
ERROR_MESSAGE : com connection error
--- [Failed] : test function error
10.RX_LE 2442 1LE ___________________________________________________________
ENABLE_RSSI : 1
FREQ_MHZ : 2442 MHz
CABLE_LOSS_DB : 0.00 dB
RX_PACKET_NUMBER : 50
RX_POWER_LEVEL : -70 dBm
OPTION_STRING :
PACKET_TYPE : 1LE
WAVEFORM_NAME : 1LE.iqvsg
>>>
Sending: 01 1d 20 01 14
<<<
Test Time = 8.049 s
ERROR_MESSAGE : com connection error
--- [Failed] : test function error
Therefore we wonder to ask you which pin is import to RF Hci RX test? Or the current/voltage of any pin is import to RF Hci RX test and what the value should be? Please help us to review and confirm. Thanks
Best,
Annie