ADC self test

[zeyu_yan]

hello, how could I enable the ADC self test(algorithm S&C)?

should MCAL do this self-test period or once (startup or powerdown)?

Can NXP supply demos or implement guide?

Thanks.

the detail of requirement is below.

f. Functional safety analog inputs may need to be acquired redundantly. Use different instances of SAR ADC. If sufficient diagnostic coverage can be obtained by a plausibility check (for example, a signal range check or a gradient check) on a single acquisition for a specific application, that check can replace a redundant acquisition. After a power-on or destructive reset but before executing any safety function, execute the ADC hardware self-tests that follow:
- Supply self-test (algorithm S)
- Capacitive self-test (algorithm C)

[zeyu_yan]

S32G2，used for sampling accelator pedal signal of vehicle (two ADC channel for Plausibility Check)

[naveenm]

Hi,

Please find the answer to your questions below:

ADC Self Test : 

The ADC driver implements self-test features in the functions Adc_SelfTest (HLD) and Adc_Sar_Ip_SelfTest (IPL). Please check those APIs.

Self-Test period : 

The recommendation is to run ADC supply and capacitive self-tests at start-up, before executing the safety function.

Hope it helps.

Regards,

NaveenM

[zeyu_yan]

hello, I have a problom about ADC with the configuration listed below:

* Project : RTD AUTOSAR 4.4
* Platform : CORTEXM
* Peripheral : ADC_SAR
* Dependencies : none
*
* Autosar Version : 4.4.0
* Autosar Revision : ASR_REL_4_4_REV_0000
* Autosar Conf.Variant :
* SW Version : 3.0.0
* Build Version : S32_RTD_3_0_0_D2112_ASR_REL_4_4_REV_0000_20211221
*

S32G2,MCAL,normal conversion, one shot operation mode , STCR3[ALG]=0x3(

function name：Adc_Sar_lp_SelfTest

According to table 538,in one-shot mode,supply algorithm will be excuted only.

question:

1.Does the function(Adc_Sar_lp_SelfTest) just test Supply Algorithm(S0,S1,S2) while not excuting the test of Capacitive Algotirthm?

2.Do NXP supply the function whice support both(Supply+Capacitive Algorithm) for one-shot mode?

[naveenm · Accepted solution]

Hi, 

Please find the answers to you question below:

Q1.Does the function(Adc_Sar_lp_SelfTest) just test Supply Algorithm(S0,S1,S2) while not executing the test of Capacitive Algorithm?

Ans: No, the Adc_Sar_lp_SelfTest runs the "algorithm Supply+Capacitive".

Q2.Do NXP supply the function whice support both(Supply+Capacitive Algorithm) for one-shot mode?

Ans: As mentioned above the Adc_Sar_lp_SelfTest supports both (Supply+Capacitive) algorithm.

Hope it helps.

Regards,

NaveenM

[zeyu_yan]

according to the table below: when ADC works in one shot mode,only the supply algorithm will be applied.

however we can meet the requirement of ASIL C without the safety measure of C algorithm.

thanks for your apply.

[naveenm]

Hi,

Could you please mention which product are you working on. The ADC could be different for different SoCs.

Regards,

NaveenM