LIN communication failure during E-Flash write

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LIN communication failure during E-Flash write

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SivaB
Contributor III
A LIN communication failure is detected during the write operation of 100 bytes of data to the internal EEPROM. Please suggest an appropriate LIN communication recovery method.
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lukaszadrapa
NXP TechSupport
NXP TechSupport

Hi @SivaB 

 

Could you please let us know which exact S32K device you are using?

 

One possible explanation is that the Emulated EEPROM operation takes a relatively long time, and the resulting delay may prevent the software from servicing LIN interrupts within the required timing constraints. Another possibility is a Read-While-Write conflict. During flash erase/program operations, code or data located in the flash block currently being programmed or erased cannot be fetched/read. If such code or data is required by the application, this could cause the application to crash, which would subsequently result in the observed LIN communication failures.

 

Could you also clarify what happens when the issue occurs? Does the application crash completely, or does it continue running and only the LIN communication stop working?

 

Regards,

Lukas

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