I am using three ADC channel is configured for current sensing using BCTU interrupt(CTU mode is configured to trigger mode) and remaining ADC channels are configured in Normal chain method for voltage and temperature sensing.
During this configuration voltage and temperature sensing is working as expected but current sensor is sensing raw values with noise so we are getting abnormal spike in current control. Also we have changed the Ctu mode from trigger to control mode ,in current sensor channel raw value noise is reduced. But other channel configured in normal channel were not working.
Our expectation is to work with single ADC peripheral(ADC0) in current sensing using BCTU trigger as well as voltage and temperature sensing in normal chain method without any spike.
Note: Our hardware is designed with configuration (i.e Current sensor channels is configuration is as follows, P7-ADC0,P2 and P3 -ADC1 for reading in BCTU method. Followed by remaining ADC channels configured to normal chain method(ADC0 - X0,X1,S19 and ADC1-P0,P2,P3,P1,S10)
Hi @Senlent ,
I have also same issue which you mentioned above.
Our external oscillator clock is 25 MHz. According to the S32K322 datasheet, the ADC supports up to 80 MHz, so I have configured a prescaler of 2. I also configured the sampling time to 1.2 microseconds and set the BCTU mode to trigger mode. However, we are still getting noisy data when executing the BCTU method and the normal chain method simultaneously on the same ADC0 peripheral. Is there a workaround or an alternative method to safely run both on the same ADC0 peripheral?
Hi@praveen_ext
I believe this is the exact same issue you're facing.
From the screenshot you provided, it seems you haven't made any changes to my previous reply.
I've already informed you that there's a problem with your ADC clock divider configuration,
Also, are you sure your external clock is 25MHz?
If you've checked these two points and the problem persists after testing, you can try modifying the ADC channel's sampling time.
This option allows you to modify the sampling time; you can try increasing the sampling time and testing again.
Hi @Senlent ,
I have also same issue which you mentioned above.
Our external oscillator clock is 25 MHz. According to the S32K322 datasheet, the ADC supports up to 80 MHz, so I have configured a prescaler of 2. I also configured the sampling time to 1.2 microseconds and set the BCTU mode to trigger mode. However, we are still getting noisy data when executing the BCTU method and the normal chain method simultaneously on the same ADC0 peripheral. Is there a workaround or an alternative method to safely run both on the same ADC0 peripheral?
In the meantime, I reduced the Instance 1 clock frequency to 40 MHz and configured the sampling time to 1.2 microseconds. Following these changes, the measured values from the BCTU are no longer showing noise.
Hi@praveen_ext
Aren't you the same company? You're asking the exact same questions.
It seems you haven't been reading my answer carefully.
This is the third time I've told you that your clock divider settings are incorrect.
For 160MHz, you need to set them to 2 and 4.
Hi @Senlent ,
We tested the previous suggestions, but the issue is still not resolved. After further configuration and verification, I have attached the updated test data and configuration images below.
kindly assist us where we missed.
ADC0
ADC1
