HOWTO: Use DDR Stress Test Tool (S32DS for Vision)

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HOWTO: Use DDR Stress Test Tool (S32DS for Vision)

HOWTO: Use DDR Stress Test Tool (S32DS for Vision)

There are 2 methods to run; GUI, and terminal window.

GUI Method
1) Make sure EVB is powered and connected to PC via USB (micro to USB)
2) Launch DDR Stress Test Tool, C:\NXP\S32DS_Vision_v2.0\utils\ddr_stresstool\DDR_Tester.exe
3) Load Image (C:\NXP\S32DS_Vision_v2.0\utils\ddr_stresstool\bin\s32v234_ddr_test.bin)
4) Load Init Script (C:\NXP\S32DS_Vision_v2.0\utils\ddr_stresstool\scripts\S32V234_LDDR2_MMDC0_2Gb.inc)
5) Select COM port

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6) Press Download, then wait for it to complete. (may temporarily show 'not responding')

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7) In 32bit Memory Read/Write section, enter address 80000000 in ADDR field.
8) Change SIZE to 32 WORD
9) Click Read
10) See results

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11) In DDR Stress Test section, enter 533 in both Start Freq and End Freq fields
12) Click Stress Test
13) See results

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14) Results can be saved (C:\NXP\S32DS_Vision_v2.0\utils\ddr_stresstool\log)
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Terminal window Method (JTAG)
This checks what settings are already uploaded in MMDC module
1) Make sure EVB is powered and connected to PC via PEMicro (Universal Multilink) or Lauterbach AND via USB cable.
2) In S32DS, create a simple project

a. File->New->S32DS Application Project

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b. Enter name 'test'
c. Select S32V234 Cortex-A53
d. Next

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e. Uncheck boxes for cores 2-4
f. Finish

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3) Setup debug configuration

a. Run->Debug Configurations…

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b. Select test_A53_1_PNE

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c. Change C/C++ Application to C:\NXP\S32DS_Vision_v2.0\utils\ddr_stresstool\ddr-test-uboot-jtag-s32v234.elf

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d. Select Debugger tab
e. Click Advanced Options

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f. Check box for Enable initialization script
g. Browse to find C:\NXP\S32DS_Vision_v2.0\eclipse\plugins\com.pemicro.debug.gdbjtag.pne_3.1.3.201709051622\win32\gdi\P&E\supportFiles_ARM\NXP\S32Vxxx\S32V234M100_DDR.mac
h. OK

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4) Click Debug. You will see error message indicating the source file could not be found. This is expected.

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5) Open terminal (such as PuTTY.exe) and connect a serial line using the USB port you have connected to the EVB, speed set to 115200, 8 data bits, 1 stop bit, and no parity or flow control.

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6) Click Resume in S32DS Debugger.

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7) In terminal window, you will see the test script has started.

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8) Select the MMDC channel (for example, enter 1 for MMDC1)
9) Select the DDR density (for example, enter 6 for 32MB)
10) Enter 'n' to decline the DDR Calibration
11) Enter 'y' to accept the DDR Stress Test
12) Enter Start and End frequencies (for example, enter 533, as was done in GUI method)
13) Enter 0 to run only once

14) See the results

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Last update:
‎12-16-2017 10:35 AM
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