Hello Amir,
Thank you, this is a very important piece of information.
As you know, in dual-edge FTM IC mode, the interrupt is called on the detection of the second edge.
Then, the data are processed and another measurement can be taken.
The SDK drivers are quite big, the overhead is significant, and that is probably the issue here.
And the same applies to the single edge IC mode.
I think you could get better performance with your own SW implementation or use DMA to transfer the data (2 captures) into SRAM and use one interrupt on DMA complete .
BR, Daniel