TEF8102 datapattern test error

[longfeiwang]

We have produced a total of 20 boards(S32R274+TEF8102), but two of them will generate a datapattern test error as the temperature rises after working at room temperature, and they can still work normally when the board returns to room temperature.What would cause this error to occur?This seems to be an error in CSI2 transmitting data, but temperature changes especially room temperature shouldn't affect it.

[petervlna]

Hello,

but two of them will generate a datapattern test error as the temperature rises after working at room temperature

Could you be more specific here? Is microcontroller failing or the sensor, or data are corrupt from sensor or .... ?

Best regards,

Peter

[longfeiwang]

There is no fault on the MCU. The temperature of the dolphin reaches over 60 degrees after the device runs for a few minutes. After the device is powered on again, the data pattern test in the dolphin ism fails. After the device is powered off and left for a period of time, after the temperature of the dolphin is lowered, and then powered on again, the data pattern test in the dolphin ism can pass. After the temperature rises, there is a problem when data is transmitted from dolphin to MCU through mipi.

[petervlna]

Hello,

Could you please share register readout of ISM?

Best regards,

Peter