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I am debuging the MC33774 program and use Application mode to measure temperature and voltage. There is a MCAL package for us and I call the function in this package. I found the function Bcc_774a_MSR_SetMode has been called twice in the example code which was given by NXP. Why this register should be written twice? And now there is a really weird problem that MC33774 always gave the invalid values for AIN4~AIN7 measurement results. But the VC and AIN0~AIN3 measurement results are OK which are belong to primary digital module. I tried to read period mode measurement results registers and application mode measurement results registers ,all the datas are invalidate(0x8000). I am wondering if there is someone who can help me resolve this problem.
And I upload the SPI data that I recorded when MC33774 is working in the attach file.
Please help me solve this problem.
Thank you
Solved! Go to Solution.
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Dear Xing,
there is still no answer from the application team. I have just sent them a reminder. As soon as they will answer me, I will definitely reply to you.
Thank you for your patience.
With Best Regards,
Jozef
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Hello @tianxing ,
I am currently using MBDT for the K358BMU and MC33774 (example name : k358bmu_read_s32ct). I am facing an issue where I cannot read temperatures from AIN4 to AIN7. Could you explain the solution in detail? Additionally, where exactly do I enable the measurement for secondary channels in the SECM_AIN_CFG register?
Regards,
Reza
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Dear Xing,
I have contacted an application team for an advice on this issue. As soon as they answer me, I will definitely reply to you.
Thank you for your patience.
With Best Regards,
Jozef
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Dear Xing,
there is still no answer from the application team. I have just sent them a reminder. As soon as they will answer me, I will definitely reply to you.
Thank you for your patience.
With Best Regards,
Jozef
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Hi thank you for your help.
This problem has been fixed. It turns out to be we forgot to enable the measurement for Sendary channels in SECM_AIN_CFG register.
Best wishes
.