MC33774 cannot give the correct value for AIN4~AIN7 measurement result

[tianxing]

I am debuging the MC33774 program and use Application mode to measure temperature and voltage. There is a MCAL package for us and I call the function in this package. I found the function Bcc_774a_MSR_SetMode  has been called twice in the example code which was given by NXP. Why this register should be written twice?  And now there is a really weird problem that MC33774 always gave the invalid values for AIN4~AIN7 measurement results. But the VC and AIN0~AIN3 measurement results are OK which are belong to primary digital module. I tried to read  period mode measurement results registers and application mode measurement results registers ,all the datas are invalidate(0x8000).  I am wondering if there is someone who can help me resolve this problem. 

And I upload the SPI data that I recorded when MC33774 is working in the attach file.

Please help me solve this problem. 

Thank you

[JozefKozon]

Dear Xing,

I have contacted an application team for an advice on this issue. As soon as they answer me, I will definitely reply to you.

Thank you for your patience.

With Best Regards,

Jozef

[JozefKozon · Accepted solution]

Dear Xing,

there is still no answer from the application team. I have just sent them a reminder. As soon as they will answer me, I will definitely reply to you.

Thank you for your patience.

With Best Regards,

Jozef

[tianxing]

Hi thank you for your help.

This problem has been fixed. It turns out to be we forgot to enable the measurement for Sendary channels in SECM_AIN_CFG register.

Best wishes

.