Hello,
I am trying to connect an external JTAG debugger to the FRDM-i.MX95 board.
According to the board schematic, the JTAG/DAP signals appear to be routed to test points on the PCB, and some related components are marked as DNP.
Based on this, I modified the board as follows:
Connected the JTAG signals from the test points
Mounted the DNP resistors related to the JTAG/DAP signal path
Added a connector for an external debugger
Connected VTref, GND, TCK, TMS, TDI, TDO, and RESET to the external debugger
However, I cannot observe the expected JTAG signal output from the debugger/board side.
For example, TCK/TMS/TDI do not appear as expected during the debugger connection sequence.
Could you please confirm the following points?
Is the above modification method correct for connecting an external JTAG debugger to the FRDM-i.MX95 board?
Are there any additional resistors, jumpers, solder bridges, or board modifications required to enable the external JTAG/DAP interface?
Is there any requirement for VTref voltage level or power sequencing before the external debugger starts driving JTAG signals?
Does the i.MX95 on FRDM-i.MX95 require any boot mode, fuse setting, security setting, or software initialization before the JTAG/DAP interface becomes accessible?
Can the external JTAG debugger access the Cortex-A55, Cortex-M33, and Cortex-M7 cores directly on this board, or is additional initialization by the bootloader/firmware required?
Is there any recommended connector pin assignment or reference modification guide for using an external debugger with FRDM-i.MX95?
I would appreciate it if you could provide any guidance, schematic references, or required modification details for enabling external JTAG debugging on the FRDM-i.MX95 board.
Best regards,
In principle, yes.
If the FRDM schematic exposes:
through test points and DNP stuffing options, then routing those signals to a connector is generally the correct approach.
However, I cannot confirm that all required DNP resistors have been populated because the schematic itself was not returned by the search results. The user manual does not contain the JTAG circuitry.
Normally, when a JTAG probe is connected:
If you see absolutely no toggling on TCK/TMS:
Many probes (Lauterbach, J-Link, PE Micro, ULINK, etc.) will not drive JTAG pins until VTref is present and within a valid range.
Check:
For FRDM-i.MX95, the DAP I/O supply appears related to the 3.3 V domain (NVCC_CCM_DAP). The board documentation shows this domain powered from VDD_3V3.
Most debuggers use VTref for sensing only.
They do not power the target.
Verify:
The board requires external PD power.
If the JTAG path contains:
then missing even a single resistor can leave TCK/TMS disconnected.
Since the schematic is not available in the search results, I cannot verify the exact resistor population list.
Verify with an ohmmeter:
Probe pin → connector pin → resistor → test point → i.MX95 ball.
Do not assume the test point labels match standard ARM 20-pin ordering.
For a non-secure device:
No boot mode should be required just to observe JTAG clock activity.
TCK/TMS should toggle as soon as the debugger detects VTref and starts a scan sequence.
The boot switches affect:
and are unrelated to whether the debugger generates TCK.
Potentially.
The i.MX95 implements authenticated debug and debug access control. [i.MX95RM_Rev4 | PDF], [i.MX95RM_Rev2 | PDF], [i.MX95 Sec...2026-final | PowerPoint]
However:
Since you report no TCK activity at all, I would first investigate:
before suspecting security.
The i.MX95 debug architecture supports:
through the CoreSight/DAP infrastructure. [i.MX95RM_Rev2 | PDF], [i.MX95RM_Rev5 | PDF]
So from a silicon capability perspective, yes.
Whether all domains are immediately visible depends on:
But no additional bootloader initialization is generally required for the debugger to detect the DAP itself.
Before further board rework, I would check:
Probe directly at:
during connect attempt.
If TCK is present at the debugger connector but absent at the SoC test point, the issue is almost certainly in the board rework.
Thank you for your support.
We reviewed our external JTAG debugger connection and found that the
issue was caused by the wiring length between the FRDM-i.MX95 board and
the external JTAG debugger.
After shortening and rearranging the JTAG signal wires, the debugger was
able to detect the target correctly and the JTAG signals were observed as
expected.
Therefore, this issue has been resolved by improving the JTAG wiring
length and connection quality.
Thank you again for your assistance.