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2146779_en-US
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We are now in EOL stage and there is no way to read memory except through S/W.
We are currently working on the S32K3 series MCU and investigating the UTEST memory region to understand how HSE Lifecycle (LC) information is stored.
We have reviewed the following documents:
RM758223-HSE-B Firmware Reference Manual v2.3
S32K312_HSE_Service_API_Reference_Manual.pdf
AN13388_S32K3 Memories Guide
S32K3xx_DCF_clients.xlsx
However, the public documentation does not describe:
1. Which exact DCF field in UTEST represents the HSE Lifecycle (LC) state.
2. How the raw UTEST values (e.g., 0x1b0000040) are mapped to the standard HSE lifecycle codes (e.g., 0x04 CUST_DEL, 0x08 OEM_PROD, 0x10 IN_FIELD).
3. If there is an official method to directly read LC from UTEST without using the HSE Get Attribute service.
Could you please clarify how to officially interpret the LC information stored in UTEST/DCF?
Thank you for your support.
Pay attention here:
https://community.nxp.com/t5/S32K/S32K312-read-lifecycle-from-UTEST/m-p/1982203
Also to your question I would add:
1, 2) It is apparently not openly documented, but if you see DCM registers, DCMLCC allows you to check current LC and DCMLCS reflect values from LC slots described in section 37.2.6 LC.
Registers: 37.3.3 LC and LC Control (DCMLCC), 37.3.4 LC Scan Status (DCMLCS)
3) I have answered in the thread above.