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1926963_zh-CN
1926963_zh-CN
我正在调试MC33774程序并使用应用模式来测量温度和电压。我们有一个 MCAL 包，我调用这个包中的函数。我发现在恩智浦提供的示例代码中，Bcc_774a_MSR_SetMode 函数被调用了两次。为什么这个寄存器要被写入两次？现在出现了一个很奇怪的问题，MC33774 的 AIN4~AIN7 测量结果总是给出无效值。但是 VC 和 AIN0~AIN3 的测量结果正常，它们属于主数字模块。我尝试读取周期模式测量结果寄存器和应用模式测量结果寄存器，但所有数据都无效（0x8000）。我想知道是否有人可以帮助我解决这个问题。
并且我将MC33774工作时记录的SPI数据上传到附件中。
请帮我解决这个问题。
谢谢
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