I am using S32K312 chip to integrate SCST, the compiler used is GHS 20220104, the compilation, link attributes, and MPU are all configured according to the manual, and the macro configuration in m7_scst_configuration.h is as follows:
S32K312 After integrating SCST, the SCST m7_scst_exception_usage_fault_test test fails the first run and passes all subsequent times
The debugging situation is as follows:
The first run m7_scst_execute_core_tests(0, 0); The result is wrong
2nd run m7_scst_execute_core_tests (0, 0); The result is correct
The first run m7_scst_execute_core_tests(0, 49); The result is wrong
2nd run m7_scst_execute_core_tests (0, 49); The result is correct
What are the possible reasons for this happening and how to fix it?
Thank you!
Thank you for reaching out to us. We’re sorry to hear that you’re experiencing issues with the integration of our software.
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Thank You!
Best Regards
Mirek
We have a got SCST document - M7_S32K3XX_SCST_User_Manual.pdf from NXP.
We have written a code, attached below.
After calling function - m7_scst_execute_core_tests inside our code, this test is getting failed. Need support for the same.
That's really the reason, thank you very much!