IEC 60730 RAM test backup area

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IEC 60730 RAM test backup area

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Contributor I

Hi, 

I've got a question regarding RAM test functions from IEC60730 4.0 library for Cortex-M0+.

While using FS_CM0_RAM_AfterReset() and FS_CM0_RAM_Runtime() functions, can the tested memory area include the RAM test backup area or does the backup have to be excluded from tested addresses?

Let's suppose the tesed area is from 0x1FFFF000 to 0x20002FFF, which is the whole RAM area. Can the backup area overlap with tested area (e.g. can the backup area be placed at 0x1FFFF800 address, as long as it is reserved)?

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4 Replies

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NXP TechSupport
NXP TechSupport

Hi @MLapaj 

If the backup memory is inside the tested memory (ovelap),  the tests functions   probably  destroy the contents stored in the backup area for a certain block on a certain  in a iteration.  I will recommend to avoid overlapping.

Br,

Diego.

 

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Contributor I

I don't mind the backup area contents being destroyed since it's reserved area anyway. What I am worried about is receiving false negative result of a test. Is there any chance of that happening? 

Or are there any other consequences to test area and backup area overlapping?

 

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NXP TechSupport
NXP TechSupport

Hi @MLapaj ,

 I will consult  internally  to validate my reply to your inquiry. Could you let me know  the MCU that you are plannig to use with the library?

Thank you,

Diego.

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Contributor I

Hi @diego_charles

It's being used only on Kinetis KE06 at the time. 

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