I've got a question regarding RAM test functions from IEC60730 4.0 library for Cortex-M0+.
While using FS_CM0_RAM_AfterReset() and FS_CM0_RAM_Runtime() functions, can the tested memory area include the RAM test backup area or does the backup have to be excluded from tested addresses?
Let's suppose the tesed area is from 0x1FFFF000 to 0x20002FFF, which is the whole RAM area. Can the backup area overlap with tested area (e.g. can the backup area be placed at 0x1FFFF800 address, as long as it is reserved)?
If the backup memory is inside the tested memory (ovelap), the tests functions probably destroy the contents stored in the backup area for a certain block on a certain in a iteration. I will recommend to avoid overlapping.
I don't mind the backup area contents being destroyed since it's reserved area anyway. What I am worried about is receiving false negative result of a test. Is there any chance of that happening?
Or are there any other consequences to test area and backup area overlapping?