Is there any way to make a differential measurement using the A/D converter on any of the S08 devices? I am migrating an application from a '51 device where the A/D provides access to the Ain+ and Ain-. I am not sure if using 2 A/Ds and getting the difference in software will be reliable enough as it will probably double the error and I don't want to add a separate device.
Using two channels is not a differential measurement - it is a post-conversion calculation. Each channel will be subject to the usual errors and therefore the potential error will be doubled. Also both inputs will be positive. With approximately 5000000 (sic) variants of the S08 I was really wondering if one of them had a differential input. If they could do it for the comparator, why not the A/D?
