I am using ADC in K20/K22 MCU. I see that if I give voltage input to ADC from calibrator then ADC raw counts vary above and below certain point. This variation is +- 100 counts of ADC on full scale. Though this is accurate, I want some "stable" reading. So how can I proceed ???
In k20/k22 adc initialization averaging is on (32 / 64 samples).
I want to make stable count without using averaging in software.
How Can i achieve this ??
For my application this is must.
I have observed that for K20/K22 MCU, raw counts of ADC gets drifted for 200-300 counts if we change MCU temperature from 0 degrees to 60 degrees..
What is temperature drift of ADC???
Where it is specified in Datasheet ???
Thanks for reading.
Have a nice day!!