Hi Igor,
Thank you. I was able to run DDR stress test successfully. I don't think its some issue with the DDR. Here is the log.
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DDR Stress Test (2.2.0)
Build: Sep 29 2015, 22:20:56
Freescale Semiconductor, Inc.
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Chip ID
DIGPROG(0x020c8260) = 0x00630002
CHIP ID = i.MX6 Dual/Quad (0x63)
Internal Revision = TO1.2
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Boot Configuration
SRC_SBMR1(0x020d8004) = 0x08003040
SRC_SBMR2(0x020d801c) = 0x11000001
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DDR configuration
BOOT_CFG3[5-4]: 0x00, Single DDR channel.
DDR type is DDR3
Data width: 64, bank num: 8
Row size: 14, col size: 10
Chip select CSD0 is used
Density per chip select: 1024MB
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DDR Stress Test Iteration 1
Current Tempareture: 31
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DDR Freq: 396 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test
DDR Freq: 413 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test
DDR Freq: 432 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test
DDR Freq: 452 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test
DDR Freq: 475 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test
DDR Freq: 500 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test
DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test
DDR Freq: 532 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test
Success: DDR Stress test completed!!!
-sujith