I have a problem with a customized iMX8QM LPDDR4 ( 2 x 4GiB ) memory.
The table below shows memory device configuration. 16Gb per channel,1 Rank per channel .


I configed MX8QM_B0_LPDDR4_RPA_1.6GHz_v20.xlsx file like this: Chip Selects used is 1 and Number of Row Addresses is 17.

But it doesn't pass when i use mx8_ddr_stress_test_ER14 DDR Tester tool. Config log seems like ok, but Stress Test Blocking at [ t0.1: data is addr test ]. The log below is all Stress Test log.
============================================
DDR configuration
DDR type is LPDDR4
Data width: 32, bank num: 8
Row size: 17, col size: 10
One chip select is used
Number of DDR controllers used on the SoC: 2
Density per chip select: 4096MB
Density per controller is: 4096MB
Total density detected on the board is: 8192MB
Note: As this SoC has more than one DDR Controller, the calculated
density assumes all controllers are being used. Adjust the tested
density per your board configuration if not all controllers are used
Command Bus Training was executed
No DDR data training errors detected for DDRC0
No DDR data training errors detected for DDRC1
============================================
MX8QM: Cortex-A72 is found
*************************************************************************
DDR Stress Test Iteration 1
--------------------------------
--Running DDR test on region 1--
--------------------------------
t0.1: data is addr test
....
t0.2: row hop read test
...
t1: memcpy SSN armv8_x32 test
....
t2: byte-wise SSN armv8_x32 test
..
t3: memcpy pseudo random pattern test
....................................................................
t4: IRAM_to_DDRv1 test
...
t5: IRAM_to_DDRv2 test
--------------------------------
--Running DDR test on region2--
--------------------------------
t0.1: data is addr test
...
How can i do to fix this problem? or does iMX8QM platform support this LPDDR4 memory device?
Thanks.