Hi Oded
main power input current is not correct way, please use sect.3.6. Measuring points on the EVK platform
AN12118 and AN5381 Measuring Current in i.MX Applications
https://www.nxp.com/docs/en/application-note/AN5381.pdf
Differencies in measurements can be explained by temperature and manufacturing process variations as
described in AN5215 B.2. Die process variation:
Variations in die-to-die processing results in devices with a range of power consumptions. These variations cause two individual parts that are manufactured identically behave differently... as shown on the bottom histogram in Figure 5.
https://www.nxp.com/docs/en/application-note/AN5215.pdf
Best regards
igor
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