Thank you for the clarification. Since the EVK behavior is expected during a 'hard' power loss, i have a few follow-up questions:
1. Is then the power-down sequence requirement strictly for Data/RTC/Secuity State Integrity, or is there a risk of Long-Term Reliability issues or physical damage to the SoC if the rails coolapse simultaneously? (i.e, if i keep powering off my EVK, it will be damaged soon? because using the power switch is pretty common). Or if the SOC remains high while BBSM collapsed, is there a risk of internal diode biasing or latch-up conditions?
2. if niether, what is then really the purpose of doing this requirement via software also?
3. If the requirement is criticial for reliability, does NXP recommend specific total capactiance on the input rail to allow the PMIC enough 'hold-up' time to execute a sequenced shutdown?
and that will lead to another question: right now i'm trying to figure out how to set the i.MX to be the lowest power it can to reduce the current consumption for the active discharge process, but i can't seem to get the same results NXP measured for suspend mode for example (I get 12mA for SOC rail when i enter suspend mode via echo mem command and also 85mA for the VSYS_5V [PMIC INPUT] which seem alot)