LPDDR Testing

[Embedded-world]

Dear Experts,

I am working with the Maaxboard OSM93 (Avnet) and testing the LPDDR scenarios. While testing the LPDDR, the operational test results for the following scenarios have failed:

1. BIST - 1 write - 1 read turnaround
2. BIST - 2 write - 2 read turnaround
3. BIST - 4 write - 4 read turnaround

How can I debug these scenarios? What configurations do I need to change? Please suggest the steps to pass all the test scenarios.

Configuration:
Operational TestingDevice Configuration

Thanks & Regards,

Ravikumar

[Embedded-world]

Hi @JorgeCas ,

     I used the same LPDDR4 Configuration w.r.t specific maaxboard osm93 board but still in the DDR Tool (v24.12). As I mentioned before, all three test scenarios are failed to pass. So, whether all turnaround cases are mandatory to pass ? Or What does the configuration do I need to follow for that to pass? Or By default, those test scenarios are are failed ? or Only Read-write compare. Walking Zeros, Walking Ones works/get pass because in the User guide of the DDR Tool mentioned these three, so Please clarify the doubts.


Thanks & Regards
Ravikumar

[JorgeCas]

Hello,

Yes, it is mandatory to pass all the tests in DDR stress. It seems that it is not passing Write-Read-Compare test.

Please check that you are entering the corresponding DDR features, PMIC and UART settings.

Could you please share the board characteristics, .mex file and log?

Best regards.

[Embedded-world]

Hi @JorgeCas,

As per the Avnet board, 100% the test is passing with Read - Write compare scenario.

But it's not passing the all other turnaround test case.

Thanks & Regards
Ravikumar

[JorgeCas]

Hello,

Please try again selecting the exact i.MX part number and DDR technology, according to the board web page, it has a LPDDR4, and you are running the test for a LPDDR4X.

Best regards.