Test software version: ddr stress tester v3.00
I failed to perform DDR calibration, but I can directly overclock the test, why?
The error information is as follows
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DDR Stress Test (3.0.0)
Build: Dec 14 2018, 14:13:14
NXP Semiconductors.
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Chip ID
CHIP ID = i.MX6 UltraLite(0x64)
Internal Revision = TO1.2
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Boot Configuration
SRC_SBMR1(0x020d8004) = 0x00002092
SRC_SBMR2(0x020d801c) = 0x01000041
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ARM Clock set to 528MHz
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DDR configuration
DDR type is DDR3
Data width: 16, bank num: 8
Row size: 14, col size: 10
Chip select CSD0 is used
Density per chip select: 256MB
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Current Temperature: 42
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DDR Freq: 396 MHz
ddr_mr1=0x00000000
Start write leveling calibration...
running Write level HW calibration
MPWLHWERR register read out for factory diagnostics:
MPWLHWERR PHY0 = 0x0000000f
HW WL cal status: no suitable delay value found for byte 1
Write leveling calibration completed but failed, the following results were found:
MMDC_MPWLDECTRL0 ch0 (0x021b080c) = 0x001F0000
Write DQS delay result:
Write DQS0 delay: 0/256 CK
Write DQS1 delay: 31/256 CK
Error: failed during write leveling calibration
This board can work normally, and the function is very normal, but the verification failure, can you point out, thank you