NT3H2111W0FHK是否有IC类器件可靠性测试报告

[Guestsun]

NT3H2111W0FHK是否有IC类器件可靠性测试报告，例如：高压锅蒸煮实验（PCT）、稳态温湿度偏压寿命实验（THB）等实验报告。

[danielchen]

Hi Sun:

There is a product qualification file secured by NDA (Non-Disclosure-Agreement).  I can see some reliability test result. But no mention PCT and THB

 You can apply the right to access this doc from the NTAG I2C PLUS product page.  

Regards

Daniel