Hi Leo,
Many thanks for your kindly comments. I confirmed with software engineer that he did the set for VDDE following The 78.4.3 VDDE from reference manual, and confirmed that the overcurrent event happened after start-up. Unfortunately, I could not send the whole project schematic due to confidential, but the circuit for VDDE(48-pin) relevant is quite simple as shown before, one 4.7uF MLCC at 48-pin, and 2*100nF MLCC for power supply of angle sensor(TLE5501).
Our software engineer gives me a test-FW to test the inrush current (with 100ms delay to Enable the overcurrent function).
I confirmed that the inrush current at HW level, the VDDE inrush current is 1.03A lasts for 30us.
The local NXP technical supporter told me that VDDE is derive from VDD, if VDD is already filtered, no need to put more MLCC for VDDE.
I checked the datasheet of angle sensor – TLE5501, the 100nF*2 coupling MLCC is recommended, need to be kept.
So I removed the 4.7uF to test again, the result shows that,
1, the over-current flag still set with 100nF*2 status.
2, the inrush current is around, 21.7mA lasts for 20ns.
Below are my questions,
1, What's the coupling capacitor value from your recommendation? Is it possible to remove 4.7uF capacitor nearby 48-pin, and only keep the 2*100nF capacitor for angle sensor?
2, What’s the inrush current threshold of the VDDE output? Does the 21.7mA when at 2*100nF status will lead to a overcurrent event for VDDE? From HW perspectives, the value is not exceed 30mA maximum output value, should be no harm to MCU.
If anything unclear, keep me informed anytime. Thanks and nice day.
Best Regards, Ted