S32K344-About the recovery mode sequence

[Simon-Liu]

Hello:

I have some questions about the [32.12 Recovery mode sequence] section of RM:
1. When LC is MCU_PROD and CUST_DEL, IVT can be programmed; in other life cycles, IVT can be debugged and reprogrammed. Does that mean that debugging is not possible in MCU_PROD and CUST_DEL?
2. In Figure 143, no matter which life cycle it is in, debugging can be performed as long as the conditions are met, right?
3. Whether reprogramming is possible is not reflected in the Sequence diagram. Does it have nothing to do with Recovery mode but only with the life cycle?

BestRegards,

Simon

[danielmartynek]

Hi @Simon-Liu,

I have requested a review of this statement, it does not make much sense to me either.

I will let you know as soon as possible.

Please use the up-to-date version of the RM, the Figure 143 reference indicates you use an older version.

Regards,

Daniel

[danielmartynek · Accepted solution]

Hi @Simon-Liu,

This should be more clear:

For MCU_PROD|CUST_DEL LC.

If the MCU enters the recovery mode, it will execute the infinite loop with the WFI code at 0x2040_0100, then the APP/IVT can be reprogram by the debugger.

For OEM_PROD|IN_FIELD LC.

If the MCU enters the recovery mode, it will provide 30 seconds for the secure debug authentication process to unlock the JTAG debugging capability, if the secure debug authentication is successful, then the APP/IVT can be reprogram by debugger also.

Regards,

Daniel