Hi,
Board: S32G-VNP-EVB
S/W: Diagnostic Software(SW32G2-DIAG-EAR-0.8.6.zip)
We are testing LPDDR4 performance tests.
As part of the test got below output:
DDRTest#6:DDR Performance Monitor Test - ddr_perf_mon_test - Started
Performance Numbers:
DRAM access duration for read throughput 5368709 us
Performance Monitor - Counter_2 Write Data Count 22823433
Performance Monitor - Counter_1 Read Data Count 15935937
DRAM read throughput by counter with burst size '7': 14 MBps
DRAM access duration for write throughput 5368709 us
DRAM write throughput by counter with burst size '7': 28 MBps
DRAM last read location: 0x63cca704
DRAM Total read locations in total duration: 15935937 Bytes
DRAM last write location: 0x67ea3bfc
DRAM Total write locations in total duration: 33197823 Bytes
DDRTest#6: ddr_perf_mon_test - Passed !!!
Queries:
1. For running the test we are enabling the counter to 1, but how it is related to total time conducted on test, For calculation below formula is used (0xFFFFFFFF/80) in App ?
2. Performance Monitor - Counter_2 Write Data Count and DRAM Total write locations in total duration are not same in write scenario, but same in read case.
3. LPDDR4 theoretical bandwidth is 25.6GB/s, in the current test is displaying 14 MBps for write and 28 MBps