Hi,
a) Software destructive reset.
[Peter] - Use mode transition with 0xF as target mode.
b) FCCU failure to react reset.
[Peter] - 1.Disable the FCCU_NCFS_CFGx registers which contains the configuration of each non-critical fault in terms of fault reaction.
2.Enable the fault sources in NCF Enable Register (FCCU_NCF_Ex) to allow a transition from the NORMAL into the FAULT or ALARM state.
c) Functional reset escalation.
[Peter] - 1. Set MC_RGM_FRET = 1.
2. Use mode transition with 0x0 as target mode. (0000 RESET (triggers a ‘functional’ reset event)
d) Voltage/temperature sensor out of range destructive reset.
[Peter] - I think only external event (programmable power source / climate chamber)
e) Voltage/temperature sensor functional reset.
[Peter] - I think only external event (programmable power source / climate chamber)
f) External reset event.
[Peter] - External reset event (Debugger/ power source / SBC ...)
g) Self-test completed event.
[Peter] - This reset is generated after completion of BIST.
1. Offline - generated when BIST is enabled after successful completion of BIST during reset phase 3.
2. Online - generated when BIST is configured to triggers reset after completion.
h) Software destructive event.
[Peter] - Same as a)
i) FCCU hard /soft reaction request event.
[Peter] - genarate on FCCU reset reaction on FCCU latched fault. To generate it configure FCCU and inject a fault.
j) JTAG initiated reset event.
The EXTEST, HIGHZ, and CLAMP instructions cause a JTAG 'functional' reset event to occur, which cause JTAG 'functional' reset.
Peter