Example_MPC5777C-External_SRAM-test-S32DS.Power.2017.R1

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********************************************************************************
* Detailed Description:
* Application performs basic initialization then it initializes EBI for external
* SRAM connected to MPC5777C-516DS and test it by write and read of block of
* data.
*
* ------------------------------------------------------------------------------
* Test HW:         MPC5777C-512DS Rev.A + MPC57xx MOTHER BOARD Rev.C
* MCU:             PPC5777CMM03 3N45H
* Fsys:            PLL1 = core_clk = 264MHz, PLL0 = 192MHz
* Debugger:        Lauterbach Trace32
* Target:          internal_FLASH
* Terminal:        19200-8-no parity-1 stop bit-no flow control on eSCI_A 
* EVB connection:  jumper J4 on position 1-2 (choosing CS0)
*                  EMIOS1 (PortI P16-0) --> USER_LED_1 (P7-1) to see LED blink
********************************************************************************
Revision History:
Ver  Date         Author            Description of Changes
0.1  Jun-26-2017  David Tosenovjan  Initial version
0.2  Oct-13-2017  David Tosenovjan  Lower CLKOUT frequency
0.3  Feb-02-2020  David Tosenovjan  Corrected External_SRAM_MMU_init
                                    Ported to S32 design studio
*******************************************************************************/