1. Power Rails Overview (LX2160A)
The LX2160A uses multiple independent rails for core logic, SRAM/PLL, SerDes, DDR, and I/O. The exact rail list and nominal voltages are defined in the LX2160A datasheet and reference design and should be treated as authoritative.
Typical key rails (names vary by schematics):
| Rail Function |
Typical Nominal Voltage |
Notes |
| Core (VDD) |
~0.75–0.85 V |
Highest di/dt, most critical for PI |
| Platform / Cache (VDD_PLAT) |
~0.9 V |
Large on-die SRAM, sensitive to droop |
| SerDes Analog |
~1.0 V |
Noise-sensitive, lower di/dt |
| SerDes Digital |
~0.9 V |
Moderate switching activity |
| DDR VDD |
1.2 V |
JEDEC-driven, external memory dominates |
| DDR VPP |
2.5 V |
Low-current |
| I/O (VDD_IO) |
1.8 V / 3.3 V |
Lowest PI criticality |
2. Recommended Target Impedance (Z_TARGET)
Since LX2160A does not publish explicit Z targets, the standard voltage ripple-based method is used:
Ztarget=ΔVallowableΔImaxZ_{target} = \frac{\Delta V_{allowable}}{\Delta I_{max}}Ztarget=ΔImaxΔVallowable
NXP generally recommends ≤ 3–5% ripple on core-type rails for Layerscape devices (derived from design checklists and reference boards). [static.chipdip.ru], [community.nxp.com]
Practical Target Impedance Values
| Rail |
Allowable Ripple |
Estimated ΔI |
Recommended Z_TARGET |
| Core (VDD) |
±3% (≈25 mV) |
8–12 A |
2–3 mΩ |
| Platform / SRAM |
±3% (≈30 mV) |
4–6 A |
5–8 mΩ |
| SerDes Digital |
±5% |
1–2 A |
25–40 mΩ |
| SerDes Analog |
±5% |
<1 A |
>50 mΩ |
| DDR VDD |
JEDEC |
3–5 A |
20–30 mΩ |
| I/O Rails |
±5–10% |
<2 A |
>50 mΩ |
Key point:
Only the core and SRAM rails require very aggressive PDN design down into the low milliohm range.
3. Transient Current / di/dt Assumptions
Core Rail (Critical)
For PI simulation, worst-case transient assumptions are typically:
- ΔI step: 5–8 A
- Edge rate: 1–5 ns
- di/dt: 1–5 A/ns
These represent:
- Simultaneous switching of multiple Cortex-A72 cores
- Cache + datapath accelerator activity (DPAA2, DCE, SEC)
This aligns with how NXP reference boards and design checklists size bulk + high-frequency decoupling. [static.chipdip.ru], [community.nxp.com]
Other Rails
| Rail |
ΔI Assumption |
di/dt |
| Platform / SRAM |
2–4 A |
0.5–1 A/ns |
| SerDes Digital |
0.5–1 A |
0.1–0.3 A/ns |
| DDR VDD |
Governed by JEDEC burst |
Slower, regulator-dominated |
| I/O |
<0.5 A |
Very low |
4. Frequency Range to Analyze
For LX2160A, PI analysis should cover:
- DC → 100 MHz (minimum)
- Up to 300–500 MHz recommended for core rails due to on-die L/C effects
Below ~1 MHz:
Dominated by VRM and bulk capacitors
1–100 MHz:
Board-level MLCCs + planes
100 MHz:
On-package + on-die capacitance (model using package S-parameters if available)
5. Decoupling Strategy (Reference-Based)
NXP reference designs show a three-tier approach:
- Bulk
- 47–330 µF polymer or tantalum per core rail
- Mid-frequency MLCCs
- 1–10 µF, X7R, distributed across package perimeter
- High-frequency MLCCs
- 0.01–0.1 µF directly under BGA
This approach is consistent with Layerscape RDB layouts. [static.chipdip.ru]
6. Recommended PI Tools
Widely used tools that work well for LX2160A-class SoCs:
Simulation
- Cadence Sigrity PowerSI
- Ansys SIwave
- Keysight PIPro
- Altium PDN Analyzer (early-stage checks)
Measurement (Post-silicon)
- VNA-based PDN impedance measurement (2-port shunt-through)
- High-bandwidth probing at BGA breakout test points
7. Methodology Summary (Best Practice)
- Start with Z_TARGET-based PDN design
- Build sweep impedance plot (log-log)
- Eliminate anti-resonance peaks below Z_TARGET
- Validate with:
- Worst-case current step
- Load-transient simulation
- Correlate against RDB behavior where possible
8. NXP-Specific Recommendation
NXP explicitly recommends reviewing AN5407 – LX2160A/LX2162A Design Checklist, which includes power use cases and rail current guidance used internally for PDN sizing. [community.nxp.com]
If you have access to NXP Premium Support, you can also request:
- Rail-by-rail worst-case current tables
- Package PDN models (where available)