Content originally posted in LPCWare by Izzy Weird on Fri Aug 26 14:38:14 MST 2011
Quote: micrio
I would like to know the results of wearout testing on 10K parts.
Yes, my code does use round-robin leveling. I did not know the characteristics of what a wearout would look like. Would the error be "hard" or would it come and go?
Pete.
Well, Pete, this is (after all) destructive testing. I sacrificed a prototype board to perform this test in the past. To test more samples I guess one might use a test socket for the MCU. My previous test was with an Atmel SAM7 ARM part. In this case the wear out did not appear permanent at first. As I mentioned, I was able to do an average of 10k writes to the (now wornout) flash blocks before more bit errors in the 256 byte blocks. The Atmel spec was 100k writes, but with the sample I tested I got an average of about 1 million writes before the first bit error.
If you are in business, and this is important for you to know, LPCXpresso boards are very inexpensive. I suppose you could wear a few of them out to find out. :D
I would be curious to hear the results of such a test.