Issue does not appear to be same.
We mounted suspect chip on bare board along with bypass capacitors and crystal to have minimal configuration. Applied power to 3.3V regulator (linear) and NXP still latched up. Quick power cycle and IC powers correctly.
I had previously reported that leakage seemed higher. Resistance of failing I/O to power or ground pin was a little over 5meg ohm while good ICs is closer to 7 meg ohm. Changing meter to measure diode drop I note threshold voltages are lower indicating again difference in IC process location.
Problem ICs
I/O pin to power pin (+ to - respectively) = 0.81 volts
I/O pin to GND pin (+ to - respectively) = 1.6 volts
I/O pin to power pin (- to + respectively) = 1.6 volts
I/O pin to GND pin (- to + respectively) = 0.55 volts
Good IC
I/O pin to power pin (+ to - respectively) = 1.1 volts
I/O pin to GND pin (+ to - respectively) >2.2 voltmeter limit in diode check
I/O pin to power pin (- to + respectively) = 1.5 volts
I/O pin to GND pin (- to + respectively) = 0.55 volts
I did not measure all I/O pins. I chose a several pins on different sides of chip. Pin did not seem to matter as I did not see any real difference (very consistent) within a chip which is why I only reported one number even though I measured multiple pins. I did choose the same pins when comparing chips.
We have assembled close to 8,000 boards at this point and latch up with this batch of ICs is about 1%.
Replacing the IC repairs the board 100% of time.
Regards,
Phil